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2020 IEEE 3rd International Workshop on Validation, Analysis, and Evolution of Software Tests (VST), February 18, 2020,
London, ON, Canada
2020 IEEE 3rd International Workshop on Validation, Analysis, and Evolution of Software Tests (VST)
Frontmatter
Papers
Semi-automatic Test Case Expansion for Mutation Testing
Zhong Xi Lu,
Sten Vercammen, and
Serge Demeyer
(University of Antwerp, Belgium)
@InProceedings{VST20p1,
author = {Zhong Xi Lu and Sten Vercammen and Serge Demeyer},
title = {Semi-automatic Test Case Expansion for Mutation Testing},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2020},
}
An Empirical Evaluation for Object Initialization of Member Variables in Unit Testing
Stefan Fischer,
Evelyn Nicole Haslinger,
Markus Zimmermann, and
Hannes Thaller
(Software Competence Center Hagenberg, Austria; Symflower, Austria; JKU Linz, Austria)
@InProceedings{VST20p9,
author = {Stefan Fischer and Evelyn Nicole Haslinger and Markus Zimmermann and Hannes Thaller},
title = {An Empirical Evaluation for Object Initialization of Member Variables in Unit Testing},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2020},
}
An Early Investigation of Unit Testing Practices of Component-Based Software Systems
Georg Buchgeher,
Stefan Fischer,
Michael Moser, and
Josef Pichler
(Software Competence Center Hagenberg, Austria; University of Applied Sciences Upper Austria, Austria)
@InProceedings{VST20p13,
author = {Georg Buchgeher and Stefan Fischer and Michael Moser and Josef Pichler},
title = {An Early Investigation of Unit Testing Practices of Component-Based Software Systems},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {13-12},
doi = {},
year = {2020},
}
Do Bug-Fix Types Affect Spectrum-Based Fault Localization Algorithms’ Efficiency?
Attila Szatmári,
Béla Vancsics, and
Árpád Beszédes
(University of Szeged, Hungary)
@InProceedings{VST20p17,
author = {Attila Szatmári and Béla Vancsics and Árpád Beszédes},
title = {Do Bug-Fix Types Affect Spectrum-Based Fault Localization Algorithms’ Efficiency?},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {17-16},
doi = {},
year = {2020},
}
Towards Fault Localization via Probabilistic Software Modeling
Hannes Thaller,
Lukas Linsbauer,
Alexander Egyed, and
Stefan Fischer
(JKU Linz, Austria; Software Competence Center Hagenberg, Austria)
@InProceedings{VST20p25,
author = {Hannes Thaller and Lukas Linsbauer and Alexander Egyed and Stefan Fischer},
title = {Towards Fault Localization via Probabilistic Software Modeling},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {25-24},
doi = {},
year = {2020},
}
Simulating the Effect of Test Flakiness on Fault Localization Effectiveness
Béla Vancsics,
Tamás Gergely, and
Árpád Beszédes
(University of Szeged, Hungary)
@InProceedings{VST20p29,
author = {Béla Vancsics and Tamás Gergely and Árpád Beszédes},
title = {Simulating the Effect of Test Flakiness on Fault Localization Effectiveness},
booktitle = {Proc.\ VST},
publisher = {IEEE},
pages = {29-28},
doi = {},
year = {2020},
}
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