IWSC 2019 – Proceedings

2019 IEEE 13th International Workshop on Software Clones (IWSC)

Frontmatter

Clone Detection and Application

Code-to-Code Search Based on Deep Neural Network and Code Mutation
Yuji Fujiwara, Norihiro Yoshida, Eunjong Choi, and Katsuro Inoue
(Osaka University, Japan; Nagoya University, Japan; NAIST, Japan)


@InProceedings{IWSC19p1, author = {Yuji Fujiwara and Norihiro Yoshida and Eunjong Choi and Katsuro Inoue}, title = {Code-to-Code Search Based on Deep Neural Network and Code Mutation}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id7-p doi:

A Novel Approach for Detecting Type-IV Clones in Test Code
Brent van Bladel and Serge Demeyer
(University of Antwerp, Belgium)


@InProceedings{IWSC19p8, author = {Brent van Bladel and Serge Demeyer}, title = {A Novel Approach for Detecting Type-IV Clones in Test Code}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {8-7}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id4-p doi:

Mining Source Code Improvement Patterns from Similar Code Review Works
Yuki Ueda, Takashi Ishio, Akinori Ihara, and Kenichi Matsumoto
(NAIST, Japan; Wakayama University, Japan)


@InProceedings{IWSC19p15, author = {Yuki Ueda and Takashi Ishio and Akinori Ihara and Kenichi Matsumoto}, title = {Mining Source Code Improvement Patterns from Similar Code Review Works}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {15-14}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id2-p doi:

Clone Analysis

An Empirical Study on Clone Evolution by Analyzing Clone Lifetime
Md. Jubair Ibna Mostafa
(University of Dhaka, Bangladesh)


@InProceedings{IWSC19p22, author = {Md. Jubair Ibna Mostafa}, title = {An Empirical Study on Clone Evolution by Analyzing Clone Lifetime}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {22-21}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id5-p doi:

Tracking Method-Level Clones and a Case Study
Kyohei Uemura, Akira Mori, Eunjong Choi, and Hajimu Iida
(NAIST, Japan; AIST, Japan)


@InProceedings{IWSC19p29, author = {Kyohei Uemura and Akira Mori and Eunjong Choi and Hajimu Iida}, title = {Tracking Method-Level Clones and a Case Study}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {29-28}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id8-p doi:

Towards Classification of Loop Idioms Automatically Extracted from Legacy Systems
Joji Okada, Takashi Ishio, Yuji Sakata, and Katsuro Inoue
(NTT, Japan; NAIST, Japan; Osaka University, Japan)


@InProceedings{IWSC19p36, author = {Joji Okada and Takashi Ishio and Yuji Sakata and Katsuro Inoue}, title = {Towards Classification of Loop Idioms Automatically Extracted from Legacy Systems}, booktitle = {Proc.\ IWSC}, publisher = {IEEE}, pages = {36-35}, doi = {}, year = {2019}, } Article: sanerws19iwscmain-id3-p doi:

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