ISSTA 2020
29th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2020)
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29th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2020), July 18–22, 2020, Virtual Event, USA

ISSTA 2020 – Proceedings

 Contents - Abstracts - Authors

Frontmatter

Title Page


Message from the Chairs


ISSTA 2020 Organization


Research Papers

Fuzzing

WEIZZ: Automatic Grey-Box Fuzzing for Structured Binary Formats
Andrea Fioraldi, Daniele Cono D'Elia, and Emilio Coppa
(Sapienza University of Rome, Italy)


 Publisher's Version
Active Fuzzing for Testing and Securing Cyber-Physical Systems
Yuqi Chen, Bohan Xuan, Christopher M. Poskitt, Jun Sun, and Fan Zhang
(Singapore Management University, Singapore; Zhejiang University, China; Zhejiang Lab, China; Alibaba-Zhejiang University Joint Institute of Frontier Technologies, China)


 Publisher's Version
Learning Input Tokens for Effective Fuzzing
Björn Mathis, Rahul Gopinath, and Andreas Zeller
(CISPA, Germany)


 Publisher's Version Published Artifact Artifacts Available Artifacts Functional

Symbolic Execution and Constraint Solving

Fast Bit-Vector Satisfiability
Peisen Yao, Qingkai Shi, Heqing Huang, and Charles Zhang
(Hong Kong University of Science and Technology, China)


 Publisher's Version
Relocatable Addressing Model for Symbolic Execution
David Trabish and Noam Rinetzky
(Tel Aviv University, Israel)


 Publisher's Version
Running Symbolic Execution Forever
Frank Busse, Martin Nowack, and Cristian Cadar
(Imperial College London, UK)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional

Repair and Debug

Can Automated Program Repair Refine Fault Localization? A Unified Debugging Approach
Yiling Lou, Ali Ghanbari, Xia Li, Lingming Zhang, Haotian Zhang, Dan Hao, and Lu Zhang
(Peking University, China; University of Texas at Dallas, USA; Ant Financial Services, China)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional
Automated Repair of Feature Interaction Failures in Automated Driving Systems
Raja Ben Abdessalem, Annibale Panichella, Shiva Nejati, Lionel C. Briand, and Thomas Stifter
(University of Luxembourg, Luxembourg; Delft University of Technology, Netherlands; University of Ottawa, Canada; IEE, Luxembourg)


 Publisher's Version
CoCoNuT: Combining Context-Aware Neural Translation Models using Ensemble for Program Repair
Thibaud Lutellier, Hung Viet Pham, Lawrence Pang, Yitong Li, Moshi Wei, and Lin Tan
(University of Waterloo, Canada; Purdue University, USA)


 Publisher's Version

Mobile Apps

Detecting and Diagnosing Energy Issues for Mobile Applications
Xueliang Li, Yuming Yang, Yepang Liu, John P. Gallagher, and Kaishun Wu
(Shenzhen University, China; Southern University of Science and Technology, China; Roskilde University, Denmark; IMDEA Software Institute, Spain)


 Publisher's Version
Automated Classification of Actions in Bug Reports of Mobile Apps
Hui Liu, Mingzhu Shen, Jiahao Jin, and Yanjie Jiang
(Beijing Institute of Technology, China)


 Publisher's Version
Data Loss Detector: Automatically Revealing Data Loss Bugs in Android Apps
Oliviero Riganelli, Simone Paolo Mottadelli, Claudio Rota, Daniela Micucci, and Leonardo Mariani
(University of Milano-Bicocca, Italy)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional

Machine Learning I

Reinforcement Learning Based Curiosity-Driven Testing of Android Applications
Minxue Pan, An Huang, Guoxin Wang, Tian Zhang, and Xuandong Li
(Nanjing University, China)


 Publisher's Version ACM SIGSOFT Distinguished Paper Award
Effective White-Box Testing of Deep Neural Networks with Adaptive Neuron-Selection Strategy
Seokhyun Lee, Sooyoung Cha, Dain Lee, and Hakjoo Oh
(Korea University, South Korea)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional ACM SIGSOFT Distinguished Paper Award
DeepGini: Prioritizing Massive Tests to Enhance the Robustness of Deep Neural Networks
Yang Feng, Qingkai Shi, Xinyu Gao, Jun Wan, Chunrong Fang, and Zhenyu Chen
(Nanjing University, China; Hong Kong University of Science and Technology, China; Ant Financial Services, China)


 Publisher's Version

Machine Learning II

Detecting and Understanding Real-World Differential Performance Bugs in Machine Learning Libraries
Saeid Tizpaz-Niari, Pavol Černý, and Ashutosh Trivedi
(University of Colorado Boulder, USA; TU Vienna, Austria)


 Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Higher Income, Larger Loan? Monotonicity Testing of Machine Learning Models
Arnab Sharma and Heike Wehrheim
(University of Paderborn, Germany)


 Publisher's Version
Detecting Flaky Tests in Probabilistic and Machine Learning Applications
Saikat Dutta, August Shi, Rutvik Choudhary, Zhekun Zhang, Aryaman Jain, and Sasa Misailovic
(University of Illinois at Urbana-Champaign, USA)


 Publisher's Version

Bug Localization and Test Isolation

Scaffle: Bug Localization on Millions of Files
Michael Pradel, Vijayaraghavan Murali, Rebecca Qian, Mateusz Machalica, Erik Meijer, and Satish Chandra
(University of Stuttgart, Germany; Facebook, USA)


 Publisher's Version
Abstracting Failure-Inducing Inputs
Rahul Gopinath, Alexander Kampmann, Nikolas Havrikov, Ezekiel O. Soremekun, and Andreas Zeller
(CISPA, Germany)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional ACM SIGSOFT Distinguished Paper Award
Debugging the Performance of Maven’s Test Isolation: Experience Report
Pengyu Nie, Ahmet Celik, Matthew Coley, Aleksandar Milicevic, Jonathan Bell, and Milos Gligoric
(University of Texas at Austin, USA; Facebook, USA; George Mason University, USA; Microsoft, USA)


 Publisher's Version

Security

Feedback-Driven Side-Channel Analysis for Networked Applications
İsmet Burak Kadron, Nicolás Rosner, and Tevfik Bultan
(University of California at Santa Barbara, USA)


 Publisher's Version
Scalable Analysis of Interaction Threats in IoT Systems
Mohannad Alhanahnah, Clay Stevens, and Hamid Bagheri
(University of Nebraska-Lincoln, USA)


 Publisher's Version ACM SIGSOFT Distinguished Paper Award
DeepSQLi: Deep Semantic Learning for Testing SQL Injection
Muyang Liu, Ke Li, and Tao Chen
(University of Electronic Science and Technology of China, China; University of Exeter, UK; Loughborough University, UK)


 Publisher's Version

Regression Testing

Dependent-Test-Aware Regression Testing Techniques
Wing Lam, August Shi, Reed Oei, Sai Zhang, Michael D. Ernst, and Tao Xie
(University of Illinois at Urbana-Champaign, USA; Google, USA; University of Washington, USA; Peking University, China)


 Publisher's Version
Differential Regression Testing for REST APIs
Patrice Godefroid, Daniel Lehmann, and Marina Polishchuk
(Microsoft Research, USA; University of Stuttgart, Germany)


 Publisher's Version
Empirically Revisiting and Enhancing IR-Based Test-Case Prioritization
Qianyang Peng, August Shi, and Lingming Zhang
(University of Illinois at Urbana-Champaign, USA; University of Texas at Dallas, USA)


 Publisher's Version

Challenging Domains

Intermittently Failing Tests in the Embedded Systems Domain
Per Erik Strandberg, Thomas J. Ostrand, Elaine J. Weyuker, Wasif Afzal, and Daniel Sundmark
(Westermo Network Technologies, Sweden; Mälardalen University, Sweden; University of Central Florida, USA)


 Publisher's Version
Feasible and Stressful Trajectory Generation for Mobile Robots
Carl Hildebrandt, Sebastian Elbaum, Nicola Bezzo, and Matthew B. Dwyer
(University of Virginia, USA)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional
Detecting Cache-Related Bugs in Spark Applications
Hui Li, Dong Wang, Tianze Huang, Yu Gao, Wensheng Dou, Lijie Xu, Wei Wang, Jun Wei, and Hua Zhong
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Beijing University of Posts and Telecommunications, China)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional

Binary Analysis

Patch Based Vulnerability Matching for Binary Programs
Yifei Xu, Zhengzi Xu, Bihuan Chen, Fu Song, Yang Liu, and Ting Liu
(Xi'an Jiaotong University, China; Nanyang Technological University, Singapore; Fudan University, China; ShanghaiTech University, China; Zhejiang University, China)


 Publisher's Version
Identifying Java Calls in Native Code via Binary Scanning
George Fourtounis, Leonidas Triantafyllou, and Yannis Smaragdakis
(University of Athens, Greece)


 Publisher's Version Published Artifact Artifacts Available Artifacts Functional
An Empirical Study on ARM Disassembly Tools
Muhui Jiang, Yajin Zhou, Xiapu Luo, Ruoyu Wang, Yang Liu, and Kui Ren
(Hong Kong Polytechnic University, China; Zhejiang University, China; Arizona State University, USA; Nanyang Technological University, Singapore)


 Publisher's Version

Static Analysis and Search-Based Testing

How Effective Are Smart Contract Analysis Tools? Evaluating Smart Contract Static Analysis Tools using Bug Injection
Asem Ghaleb and Karthik Pattabiraman
(University of British Columbia, Canada)


 Publisher's Version Published Artifact Artifacts Available Artifacts Functional
A Programming Model for Semi-implicit Parallelization of Static Analyses
Dominik Helm, Florian Kübler, Jan Thomas Kölzer, Philipp Haller, Michael Eichberg, Guido Salvaneschi, and Mira Mezini
(TU Darmstadt, Germany; KTH, Sweden)


 Publisher's Version
Recovering Fitness Gradients for Interprocedural Boolean Flags in Search-Based Testing
Yun Lin, Jun Sun, Gordon Fraser, Ziheng Xiu, Ting Liu, and Jin Song Dong
(National University of Singapore, Singapore; Singapore Management University, Singapore; University of Passau, Germany; Xi'an Jiaotong University, China)


 Publisher's Version

Build Testing

Scalable Build Service System with Smart Scheduling Service
Kaiyuan Wang, Greg Tener, Vijay Gullapalli, Xin Huang, Ahmed Gad, and Daniel Rall
(Google, USA)


 Publisher's Version
Escaping Dependency Hell: Finding Build Dependency Errors with the Unified Dependency Graph
Gang Fan, Chengpeng Wang, Rongxin Wu, Xiao Xiao, Qingkai Shi, and Charles Zhang
(Hong Kong University of Science and Technology, China; Xiamen University, China; Sourcebrella, China)


 Publisher's Version
How Far We Have Come: Testing Decompilation Correctness of C Decompilers
Zhibo Liu and Shuai Wang
(Hong Kong University of Science and Technology, China)


 Publisher's Version Artifacts Functional

Numerical Software Analysis and Clone Detection

Discovering Discrepancies in Numerical Libraries
Jackson Vanover, Xuan Deng, and Cindy Rubio-González
(University of California at Davis, USA)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional
Testing High Performance Numerical Simulation Programs: Experience, Lessons Learned, and Open Issues
Xiao He, Xingwei Wang, Jia Shi, and Yi Liu
(University of Science and Technology Beijing, China; CNCERT/CC, China)


 Publisher's Version
Functional Code Clone Detection with Syntax and Semantics Fusion Learning
Chunrong Fang, Zixi Liu, Yangyang Shi, Jeff Huang, and Qingkai Shi
(Nanjing University, China; Texas A&M University, USA; Hong Kong University of Science and Technology, China)


 Publisher's Version Published Artifact Artifacts Available Artifacts Reusable Artifacts Functional
Learning to Detect Table Clones in Spreadsheets
Yakun Zhang, Wensheng Dou, Jiaxin Zhu, Liang Xu, Zhiyong Zhou, Jun Wei, Dan Ye, and Bo Yang
(Institute of Software at Chinese Academy of Sciences, China; Jinling Institute of Technology, China; North China University of Technology, China)


 Publisher's Version

Tool Demonstrations

ObjSim: Lightweight Automatic Patch Prioritization via Object Similarity
Ali Ghanbari
(University of Texas at Dallas, USA)


 Publisher's Version
Crowdsourced Requirements Generation for Automatic Testing via Knowledge Graph
Chao Guo, Tieke He, Wei Yuan, Yue Guo, and Rui Hao
(Nanjing University, China)


 Publisher's Version
TauJud: Test Augmentation of Machine Learning in Judicial Documents
Zichen Guo, Jiawei Liu, Tieke He, Zhuoyang Li, and Peitian Zhangzhu
(Nanjing University, China)


 Publisher's Version
EShield: Protect Smart Contracts against Reverse Engineering
Wentian Yan, Jianbo Gao, Zhenhao Wu, Yue Li, Zhi Guan, Qingshan Li, and Zhong Chen
(Peking University, China; Boya Blockchain, China)


 Publisher's Version
Echidna: Effective, Usable, and Fast Fuzzing for Smart Contracts
Gustavo Grieco, Will Song, Artur Cygan, Josselin Feist, and Alex Groce
(Trail of Bits, USA; Northern Arizona University, USA)


 Publisher's Version
ProFL: A Fault Localization Framework for Prolog
George Thompson and Allison K. Sullivan
(North Carolina A&T State University, USA; University of Texas at Arlington, USA)


 Publisher's Version
FineLock: Automatically Refactoring Coarse-Grained Locks into Fine-Grained Locks
Yang Zhang, Shuai Shao, Juan Zhai, and Shiqing Ma
(Hebei University of Science and Technology, China; Rutgers University, USA)


 Publisher's Version
CPSDebug: A Tool for Explanation of Failures in Cyber-Physical Systems
Ezio Bartocci, Niveditha Manjunath, Leonardo Mariani, Cristinel Mateis, Dejan Ničković, and Fabrizio Pastore
(TU Vienna, Austria; Austrian Institute of Technology, Austria; University of Milano-Bicocca, Italy; University of Luxembourg, Luxembourg)


 Publisher's Version
Test Recommendation System Based on Slicing Coverage Filtering
Ruixiang Qian, Yuan Zhao, Duo Men, Yang Feng, Qingkai Shi, Yong Huang, and Zhenyu Chen
(Nanjing University, China; Hong Kong University of Science and Technology, China; Mooctest, China)


 Publisher's Version

Doctoral Symposium

Automated Mobile Apps Testing from Visual Perspective
Feng Xue
(Northwestern Polytechnical University, China)


 Publisher's Version
Program-Aware Fuzzing for MQTT Applications
Luis Gustavo Araujo Rodriguez and Daniel Macêdo Batista
(University of São Paulo, Brazil)


 Publisher's Version
Automatic Support for the Identification of Infeasible Testing Requirements
João Choma Neto
(University of São Paulo, Brazil)


 Publisher's Version

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