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2013 7th International Workshop on Software Clones (IWSC), May 19, 2013,
San Francisco, CA, USA
7th International Workshop on Software Clones (IWSC)
Light-Weight Ontology Alignment using Best-Match Clone Detection
Paul L. Geesaman,
James R. Cordy, and
Amal Zouaq
(Queen's University, Canada; Royal Military College, Canada)
@InProceedings{IWSC13p1,
author = {Paul L. Geesaman and James R. Cordy and Amal Zouaq},
title = {Light-Weight Ontology Alignment using Best-Match Clone Detection},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2013},
}
A Mutation Analysis Based Benchmarking Framework for Clone Detectors
Jeffrey Svajlenko,
Chanchal K. Roy, and
James R. Cordy
(University of Saskatchewan, Canada; Queen's University, Canada)
@InProceedings{IWSC13p8,
author = {Jeffrey Svajlenko and Chanchal K. Roy and James R. Cordy},
title = {A Mutation Analysis Based Benchmarking Framework for Clone Detectors},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {8-7},
doi = {},
year = {2013},
}
The Limits of Clone Model Standardization
Jan Harder
(University of Bremen, Germany)
@InProceedings{IWSC13p10,
author = {Jan Harder},
title = {The Limits of Clone Model Standardization},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {10-9},
doi = {},
year = {2013},
}
Refactoring Clones: A New Perspective
Nikolaos Tsantalis and
Giri Panamoottil Krishnan
(Concordia University, Canada)
@InProceedings{IWSC13p12,
author = {Nikolaos Tsantalis and Giri Panamoottil Krishnan},
title = {Refactoring Clones: A New Perspective},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {12-11},
doi = {},
year = {2013},
}
Cloning: The Need to Understand Developer Intent
Debarshi Chatterji,
Jeffrey C. Carver, and
Nicholas A. Kraft
(University of Alabama, USA)
@InProceedings{IWSC13p14,
author = {Debarshi Chatterji and Jeffrey C. Carver and Nicholas A. Kraft},
title = {Cloning: The Need to Understand Developer Intent},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {14-13},
doi = {},
year = {2013},
}
Scaling Classical Clone Detection Tools for Ultra-Large Datasets: An Exploratory Study
Jeffrey Svajlenko,
Iman Keivanloo, and
Chanchal K. Roy
(University of Saskatchewan, Canada; Concordia University, Canada)
@InProceedings{IWSC13p16,
author = {Jeffrey Svajlenko and Iman Keivanloo and Chanchal K. Roy},
title = {Scaling Classical Clone Detection Tools for Ultra-Large Datasets: An Exploratory Study},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {16-15},
doi = {},
year = {2013},
}
How to Extract Differences from Similar Programs? A Cohesion Metric Approach
Akira Goto,
Norihiro Yoshida,
Masakazu Ioka,
Eunjong Choi, and
Katsuro Inoue
(Osaka University, Japan; NAIST, Japan)
@InProceedings{IWSC13p23,
author = {Akira Goto and Norihiro Yoshida and Masakazu Ioka and Eunjong Choi and Katsuro Inoue},
title = {How to Extract Differences from Similar Programs? A Cohesion Metric Approach},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {23-22},
doi = {},
year = {2013},
}
Prioritizing Code Clone Detection Results for Clone Management
Radhika D. Venkatasubramanyam,
Shrinath Gupta, and
Himanshu Kumar Singh
(Siemens, India)
@InProceedings{IWSC13p30,
author = {Radhika D. Venkatasubramanyam and Shrinath Gupta and Himanshu Kumar Singh},
title = {Prioritizing Code Clone Detection Results for Clone Management},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {30-29},
doi = {},
year = {2013},
}
No Clones, No Trouble?
Saman Bazrafshan
(University of Bremen, Germany)
@InProceedings{IWSC13p37,
author = {Saman Bazrafshan},
title = {No Clones, No Trouble?},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {37-36},
doi = {},
year = {2013},
}
CPDP: A Robust Technique for Plagiarism Detection in Source Code
Basavaraju Muddu,
Allahbaksh Asadullah, and
Vasudev Bhat
(Infosys, India)
@InProceedings{IWSC13p39,
author = {Basavaraju Muddu and Allahbaksh Asadullah and Vasudev Bhat},
title = {CPDP: A Robust Technique for Plagiarism Detection in Source Code},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {39-38},
doi = {},
year = {2013},
}
A Parallel and Efficient Approach to Large Scale Clone Detection
Hitesh Sajnani and
Cristina Lopes
(UC Irvine, USA)
@InProceedings{IWSC13p46,
author = {Hitesh Sajnani and Cristina Lopes},
title = {A Parallel and Efficient Approach to Large Scale Clone Detection},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {46-45},
doi = {},
year = {2013},
}
Towards a Curated Collection of Code Clones
Ewan Tempero
(University of Auckland, New Zealand)
@InProceedings{IWSC13p53,
author = {Ewan Tempero},
title = {Towards a Curated Collection of Code Clones},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {53-52},
doi = {},
year = {2013},
}
Assessing Cross-Project Clones for Reuse Optimization
Veronika Bauer and
Benedikt Hauptmann
(TU Munich, Germany)
@InProceedings{IWSC13p60,
author = {Veronika Bauer and Benedikt Hauptmann},
title = {Assessing Cross-Project Clones for Reuse Optimization},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {60-59},
doi = {},
year = {2013},
}
On the Robustness of Clone Detection to Code Obfuscation
Sandro Schulze and
Daniel Meyer
(TU Braunschweig, Germany; University of Magdeburg, Germany)
@InProceedings{IWSC13p62,
author = {Sandro Schulze and Daniel Meyer},
title = {On the Robustness of Clone Detection to Code Obfuscation},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {62-61},
doi = {},
year = {2013},
}
Large Scale Multi-language Clone Analysis in a Telecommunication Industrial Setting
Ettore Merlo,
Thierry Lavoie,
Pascal Potvin, and
Pierre Busnel
(Polytechnique Montréal, Canada; Ericsson, Canada)
@InProceedings{IWSC13p69,
author = {Ettore Merlo and Thierry Lavoie and Pascal Potvin and Pierre Busnel},
title = {Large Scale Multi-language Clone Analysis in a Telecommunication Industrial Setting},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {69-68},
doi = {},
year = {2013},
}
Feature-Based Detection of Bugs in Clones
Daniela Steidl and
Nils Göde
(CQSE, Germany)
@InProceedings{IWSC13p76,
author = {Daniela Steidl and Nils Göde},
title = {Feature-Based Detection of Bugs in Clones},
booktitle = {Proc.\ IWSC},
publisher = {IEEE},
pages = {76-75},
doi = {},
year = {2013},
}
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