DAPSE 2013 – Proceedings

1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE)

Building Statistical Language Models of Code
Peter Schulam, Roni Rosenfeld, and Premkumar Devanbu
(CMU, USA; UC Davis, USA)

@InProceedings{DAPSE13p1, author = {Peter Schulam and Roni Rosenfeld and Premkumar Devanbu}, title = {Building Statistical Language Models of Code}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2013}, } Article: icsews13dapse-id12-p (type: Acccept (3 page paper)) doi:

Commit Graphs
Maximilian Steff and Barbara Russo
(Free University of Bolzano, Italy)

@InProceedings{DAPSE13p4, author = {Maximilian Steff and Barbara Russo}, title = {Commit Graphs}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {4-3}, doi = {}, year = {2013}, } Article: icsews13dapse-id7-p (type: Acccept (3 page paper)) doi:

Concept to Commit: A Pattern Designed to Trace Code Changes from User Requests to Change Implementation by Analyzing Mailing Lists and Code Repositories
Scott McGrath, Kiran Bastola, and Harvey Siy
(University of Nebraska at Omaha, USA)

@InProceedings{DAPSE13p7, author = {Scott McGrath and Kiran Bastola and Harvey Siy}, title = {Concept to Commit: A Pattern Designed to Trace Code Changes from User Requests to Change Implementation by Analyzing Mailing Lists and Code Repositories}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {7-6}, doi = {}, year = {2013}, } Article: icsews13dapse-id13-p (type: Acccept (3 page paper)) doi:

Data Analysis Anti-patterns in Empirical Software Engineering
Sandro Morasca
(University of Insubria, Italy)

@InProceedings{DAPSE13p10, author = {Sandro Morasca}, title = {Data Analysis Anti-patterns in Empirical Software Engineering}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {10-9}, doi = {}, year = {2013}, } Article: icsews13dapse-id8-p (type: Acccept (3 page paper)) doi:

Effect Size Analysis
Emanuel Giger and Harald C. Gall
(University of Zurich, Switzerland)

@InProceedings{DAPSE13p13, author = {Emanuel Giger and Harald C. Gall}, title = {Effect Size Analysis}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {13-12}, doi = {}, year = {2013}, } Article: icsews13dapse-id1-p (type: Acccept (3 page paper)) doi:

Exploring Software Engineering Data with Formal Concept Analysis
Xiaobing Sun, Ying Chen, Bin Li, and Bixin Li
(Yangzhou University, China; Southeast University, China)

@InProceedings{DAPSE13p16, author = {Xiaobing Sun and Ying Chen and Bin Li and Bixin Li}, title = {Exploring Software Engineering Data with Formal Concept Analysis}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {16-15}, doi = {}, year = {2013}, } Article: icsews13dapse-id3-p (type: Acccept (3 page paper)) doi:

Extracting Artifact Lifecycle Models from Metadata History
Olga Baysal, Oleksii Kononenko, Reid Holmes, and Michael W. Godfrey
(University of Waterloo, Canada)

@InProceedings{DAPSE13p19, author = {Olga Baysal and Oleksii Kononenko and Reid Holmes and Michael W. Godfrey}, title = {Extracting Artifact Lifecycle Models from Metadata History}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {19-18}, doi = {}, year = {2013}, } Article: icsews13dapse-id9-p (type: Acccept (3 page paper)) doi:

Measure What Counts: An Evaluation Pattern for Software Data Analysis
Emmanuel Letier and Camilo Fitzgerald
(University College London, UK)

@InProceedings{DAPSE13p22, author = {Emmanuel Letier and Camilo Fitzgerald}, title = {Measure What Counts: An Evaluation Pattern for Software Data Analysis}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {22-21}, doi = {}, year = {2013}, } Article: icsews13dapse-id15-p (type: Acccept (3 page paper)) doi:

Parametric Classification over Multiple Samples
Barbara Russo
(Free University of Bolzano, Italy)

@InProceedings{DAPSE13p25, author = {Barbara Russo}, title = {Parametric Classification over Multiple Samples}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {25-24}, doi = {}, year = {2013}, } Article: icsews13dapse-id6-p (type: Acccept (3 page paper)) doi:

Patterns for Cleaning Up Bug Data
Rodrigo Souza, Christina Chavez, and Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)

@InProceedings{DAPSE13p28, author = {Rodrigo Souza and Christina Chavez and Roberto Bittencourt}, title = {Patterns for Cleaning Up Bug Data}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {28-27}, doi = {}, year = {2013}, } Article: icsews13dapse-id2-p (type: Acccept (3 page paper)) doi:

Patterns for Extracting High Level Information from Bug Reports
Rodrigo Souza, Christina Chavez, and Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)

@InProceedings{DAPSE13p31, author = {Rodrigo Souza and Christina Chavez and Roberto Bittencourt}, title = {Patterns for Extracting High Level Information from Bug Reports}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {31-30}, doi = {}, year = {2013}, } Article: icsews13dapse-id11-p (type: Acccept (3 page paper)) doi:

Structural and Temporal Patterns-Based Features
Venkatesh-Prasad Ranganath and Jithin Thomas
(Microsoft Research, India)

@InProceedings{DAPSE13p34, author = {Venkatesh-Prasad Ranganath and Jithin Thomas}, title = {Structural and Temporal Patterns-Based Features}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {34-33}, doi = {}, year = {2013}, } Article: icsews13dapse-id16-p (type: Acccept (3 page paper)) doi:

The Chunking Pattern
David M. Weiss and Audris Mockus
(Iowa State University, USA; Avaya Labs Research, USA)

@InProceedings{DAPSE13p37, author = {David M. Weiss and Audris Mockus}, title = {The Chunking Pattern}, booktitle = {Proc.\ DAPSE}, publisher = {IEEE}, pages = {37-36}, doi = {}, year = {2013}, } Article: icsews13dapse-id4-p (type: Acccept (3 page paper)) doi:

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