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2013 1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE), May 21, 2013,
San Francisco, CA, USA
1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE)
Building Statistical Language Models of Code
Peter Schulam,
Roni Rosenfeld, and
Premkumar Devanbu
(CMU, USA; UC Davis, USA)
@InProceedings{DAPSE13p1,
author = {Peter Schulam and Roni Rosenfeld and Premkumar Devanbu},
title = {Building Statistical Language Models of Code},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2013},
}
Commit Graphs
Maximilian Steff and
Barbara Russo
(Free University of Bolzano, Italy)
@InProceedings{DAPSE13p4,
author = {Maximilian Steff and Barbara Russo},
title = {Commit Graphs},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {4-3},
doi = {},
year = {2013},
}
Concept to Commit: A Pattern Designed to Trace Code Changes from User Requests to Change Implementation by Analyzing Mailing Lists and Code Repositories
Scott McGrath,
Kiran Bastola, and
Harvey Siy
(University of Nebraska at Omaha, USA)
@InProceedings{DAPSE13p7,
author = {Scott McGrath and Kiran Bastola and Harvey Siy},
title = {Concept to Commit: A Pattern Designed to Trace Code Changes from User Requests to Change Implementation by Analyzing Mailing Lists and Code Repositories},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {7-6},
doi = {},
year = {2013},
}
Data Analysis Anti-patterns in Empirical Software Engineering
Sandro Morasca
(University of Insubria, Italy)
@InProceedings{DAPSE13p10,
author = {Sandro Morasca},
title = {Data Analysis Anti-patterns in Empirical Software Engineering},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {10-9},
doi = {},
year = {2013},
}
Effect Size Analysis
Emanuel Giger and
Harald C. Gall
(University of Zurich, Switzerland)
@InProceedings{DAPSE13p13,
author = {Emanuel Giger and Harald C. Gall},
title = {Effect Size Analysis},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {13-12},
doi = {},
year = {2013},
}
Exploring Software Engineering Data with Formal Concept Analysis
Xiaobing Sun,
Ying Chen,
Bin Li, and
Bixin Li
(Yangzhou University, China; Southeast University, China)
@InProceedings{DAPSE13p16,
author = {Xiaobing Sun and Ying Chen and Bin Li and Bixin Li},
title = {Exploring Software Engineering Data with Formal Concept Analysis},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {16-15},
doi = {},
year = {2013},
}
Extracting Artifact Lifecycle Models from Metadata History
Olga Baysal,
Oleksii Kononenko,
Reid Holmes, and
Michael W. Godfrey
(University of Waterloo, Canada)
@InProceedings{DAPSE13p19,
author = {Olga Baysal and Oleksii Kononenko and Reid Holmes and Michael W. Godfrey},
title = {Extracting Artifact Lifecycle Models from Metadata History},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {19-18},
doi = {},
year = {2013},
}
Measure What Counts: An Evaluation Pattern for Software Data Analysis
Emmanuel Letier and
Camilo Fitzgerald
(University College London, UK)
@InProceedings{DAPSE13p22,
author = {Emmanuel Letier and Camilo Fitzgerald},
title = {Measure What Counts: An Evaluation Pattern for Software Data Analysis},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {22-21},
doi = {},
year = {2013},
}
Parametric Classification over Multiple Samples
Barbara Russo
(Free University of Bolzano, Italy)
@InProceedings{DAPSE13p25,
author = {Barbara Russo},
title = {Parametric Classification over Multiple Samples},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {25-24},
doi = {},
year = {2013},
}
Patterns for Cleaning Up Bug Data
Rodrigo Souza,
Christina Chavez, and
Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)
@InProceedings{DAPSE13p28,
author = {Rodrigo Souza and Christina Chavez and Roberto Bittencourt},
title = {Patterns for Cleaning Up Bug Data},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {28-27},
doi = {},
year = {2013},
}
Patterns for Extracting High Level Information from Bug Reports
Rodrigo Souza,
Christina Chavez, and
Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)
@InProceedings{DAPSE13p31,
author = {Rodrigo Souza and Christina Chavez and Roberto Bittencourt},
title = {Patterns for Extracting High Level Information from Bug Reports},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {31-30},
doi = {},
year = {2013},
}
Structural and Temporal Patterns-Based Features
Venkatesh-Prasad Ranganath and
Jithin Thomas
(Microsoft Research, India)
@InProceedings{DAPSE13p34,
author = {Venkatesh-Prasad Ranganath and Jithin Thomas},
title = {Structural and Temporal Patterns-Based Features},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {34-33},
doi = {},
year = {2013},
}
The Chunking Pattern
David M. Weiss and
Audris Mockus
(Iowa State University, USA; Avaya Labs Research, USA)
@InProceedings{DAPSE13p37,
author = {David M. Weiss and Audris Mockus},
title = {The Chunking Pattern},
booktitle = {Proc.\ DAPSE},
publisher = {IEEE},
pages = {37-36},
doi = {},
year = {2013},
}
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