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2015 IEEE 1st International Workshop on Software Analytics (SWAN), March 2, 2015, Montréal, Canada

SWAN 2015 – Proceedings

Contents - Abstracts - Authors

2015 IEEE 1st International Workshop on Software Analytics (SWAN)

Frontmatter

Title Page
Foreword

Bugs, Defects, and Crashes

Toward a Learned Project-Specific Fault Taxonomy: Application of Software Analytics
Billy Kidwell and Jane Huffman Hayes
(University of Kentucky, USA)
Challenges and Issues of Mining Crash Reports
Le An and Foutse KhomhORCID logo
(Polytechnique Montréal, Canada)
Bug Report Recommendation for Code Inspection
Shin Fujiwara, Hideaki Hata, Akito Monden, and Kenichi Matsumoto ORCID logo
(NAIST, Japan)

Testing

Test Case Analytics: Mining Test Case Traces to Improve Risk-Driven Testing
Tanzeem Bin Noor and Hadi Hemmati
(University of Manitoba, Canada)
Testing Analytics on Software Variability
Hareton K. N. Leung and Kim Man Lui
(Hong Kong Polytechnic University, China)

Source Code, Branches, and Libraries

How We Resolve Conflict: An Empirical Study of Method-Level Conflict Resolution
Ryohei Yuzuki, Hideaki Hata, and Kenichi Matsumoto ORCID logo
(NAIST, Japan)
M3: A General Model for Code Analytics in Rascal
Bas Basten, Mark Hills, Paul Klint, Davy Landman, Ashim Shahi, Michael J. Steindorfer, and Jurgen J. Vinju ORCID logo
(CWI, Netherlands; East Carolina University, USA)
Studying the Impact of Evolution in R Libraries on Software Engineering Research
Catherine Ramirez, Meiyappan Nagappan, and Mehdi Mirakhorli
(Rochester Institute of Technology, USA)

Tools

Analyzing Dynamic Information with Spy and Roassal: An Experience Report
Alison Fernandez, Diego Gabriel Nuñez Duran, Alejandro Infante, and Alexandre Bergel
(University of San Simon, Bolivia; University of Chile, Chile)
MARFCAT: Fast Code Analysis for Defects and Vulnerabilities
Serguei A. Mokhov, Joey Paquet, and Mourad Debbabi
(Concordia University, Canada)
Info

Collaboration

University-Industry Collaboration and Open Source Software (OSS) Dataset in Mining Software Repositories (MSR) Research
Ambika Tripathi, Savita Dabral, and Ashish Sureka
(IIIT Delhi, India; SARL, India)

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