ISSTA 2024
33rd ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2024)
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33rd ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2024), September 16–20, 2024, Vienna, Austria

ISSTA 2024 – Preliminary Table of Contents

Contents - Abstracts - Authors

Frontmatter

Title Page
Message from the Chairs
Committees
Sponsors

Papers Round 1

Detecting Build Dependency Errors in Incremental Builds
Jun Lyu ORCID logo, Shanshan Li ORCID logo, He Zhang ORCID logo, Yang Zhang ORCID logo, Guoping Rong ORCID logo, and Manuel Rigger ORCID logo
(Nanjing University, China; National University of Singapore, Singapore)
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Face It Yourselves: An LLM-Based Two-Stage Strategy to Localize Configuration Errors via Logs
Shiwen Shan ORCID logo, Yintong Huo ORCID logo, Yuxin Su ORCID logo, Yichen Li ORCID logo, Dan Li ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China; Chinese University of Hong Kong, China)
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FastLog: An End-to-End Method to Efficiently Generate and Insert Logging Statements
Xiaoyuan Xie ORCID logo, Zhipeng Cai ORCID logo, Songqiang Chen ORCID logo, and Jifeng XuanORCID logo
(Wuhan University, China; Hong Kong University of Science and Technology, China)
Preprint
FortifyPatch: Towards Tamper-Resistant Live Patching in Linux-Based Hypervisor
Zhenyu Ye ORCID logo, Lei Zhou ORCID logo, Fengwei Zhang ORCID logo, Wenqiang Jin ORCID logo, Zhenyu Ning ORCID logo, Yupeng Hu ORCID logo, and Zheng Qin ORCID logo
(Hunan University, China; National University of Defense Technology, China; Southern University of Science and Technology, China; Xinchuang Haihe Laboratory, China)
Article Search
Unimocg: Modular Call-Graph Algorithms for Consistent Handling of Language Features
Dominik Helm ORCID logo, Tobias Roth ORCID logo, Sven Keidel ORCID logo, Michael Reif ORCID logo, and Mira MeziniORCID logo
(TU Darmstadt, Germany; National Research Center for Applied Cybersecurity ATHENE, Germany; CQSE, Germany; hessian.AI, Germany)
Article Search
Precise Compositional Buffer Overflow Detection via Heap Disjointness
Yiyuan Guo ORCID logo, Peisen Yao ORCID logo, and Charles ZhangORCID logo
(Hong Kong University of Science and Technology, China; Zhejiang University, China)
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Enhancing ROS System Fuzzing through Callback Tracing
Yuheng Shen ORCID logo, Jianzhong Liu ORCID logo, Yiru Xu ORCID logo, Hao Sun ORCID logo, Mingzhe Wang ORCID logo, Heyuan Shi ORCID logo, Nan Guan ORCID logo, and Yu JiangORCID logo
(Tsinghua University, China; ETH Zurich, Switzerland; Central South University, China; City University of Hong Kong, China)
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API Misuse Detection via Probabilistic Graphical Model
Yunlong Ma ORCID logo, Wentong Tian ORCID logo, Xiang Gao ORCID logo, Hailong Sun ORCID logo, and Li Li ORCID logo
(Beihang University, China)
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Ma11y: A Mutation Framework for Web Accessibility Testing
Mahan Tafreshipour ORCID logo, Anmol Deshpande ORCID logo, Forough MehralianORCID logo, Iftekhar Ahmed ORCID logo, and Sam MalekORCID logo
(University of California at Irvine, Irvine, USA)
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Total Recall? How Good Are Static Call Graphs Really?
Dominik Helm ORCID logo, Sven Keidel ORCID logo, Anemone Kampkötter ORCID logo, Johannes Düsing ORCID logo, Tobias Roth ORCID logo, Ben Hermann ORCID logo, and Mira MeziniORCID logo
(TU Darmstadt, Germany; National Research Center for Applied Cybersecurity ATHENE, Germany; TU Dortmund, Germany; hessian.AI, Germany)
Article Search Artifacts Available
CoderUJB: An Executable and Unified Java Benchmark for Practical Programming Scenarios
Zhengran Zeng ORCID logo, Yidong Wang ORCID logo, Rui Xie ORCID logo, Wei Ye ORCID logo, and Shikun Zhang ORCID logo
(Peking University, China)
Article Search
DAppFL: Just-in-Time Fault Localization for Decentralized Applications in Web3
Zhiying Wu ORCID logo, Jiajing Wu ORCID logo, Hui Zhang ORCID logo, Ziwei Li ORCID logo, Jiachi Chen ORCID logo, Zibin Zheng ORCID logo, Qing Xia ORCID logo, Gang Fan ORCID logo, and Yi Zhen ORCID logo
(Sun Yat-sen University, China; Institute of Software at Chinese Academy of Sciences, China; n.n., China)
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CEBin: A Cost-Effective Framework for Large-Scale Binary Code Similarity Detection
Hao WangORCID logo, Zeyu Gao ORCID logo, Chao Zhang ORCID logo, Mingyang Sun ORCID logo, Yuchen Zhou ORCID logo, Han Qiu ORCID logo, and Xi Xiao ORCID logo
(Tsinghua University, China; University of Electronic Science and Technology of China, China; Beijing University of Technology, China)
Preprint
Interprocedural Path Complexity Analysis
Mira Kaniyur ORCID logo, Ana Cavalcante-Studart ORCID logo, Yihan Yang ORCID logo, Sangeon Park ORCID logo, David Chen ORCID logo, Duy Lam ORCID logo, and Lucas Bang ORCID logo
(Harvey Mudd College, USA)
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Model-less Is the Best Model: Generating Pure Code Implementations to Replace On-Device DL Models
Mingyi Zhou ORCID logo, Xiang Gao ORCID logo, Pei Liu ORCID logo, John Grundy ORCID logo, Chunyang Chen ORCID logo, Xiao Chen ORCID logo, and Li Li ORCID logo
(Monash University, Australia; Beihang University, China; CSIRO’s Data61, Australia; TU Munich, Germany; University of Newcastle, Australia)
Article Search Artifacts Available
UPBEAT: Test Input Checks of Q# Quantum Libraries
Tianmin Hu ORCID logo, Guixin Ye ORCID logo, Zhanyong Tang ORCID logo, Shin Hwei Tan ORCID logo, Huanting Wang ORCID logo, Meng Li ORCID logo, and Zheng WangORCID logo
(Northwest University, China; Concordia University, Canada; University of Leeds, United Kingdom; Hefei University of Technology, China)
Article Search
Enhancing Robustness of Code Authorship Attribution through Expert Feature Knowledge
Xiaowei Guo ORCID logo, Cai Fu ORCID logo, Juan Chen ORCID logo, Hongle Liu ORCID logo, Lansheng Han ORCID logo, and Wenjin Li ORCID logo
(Huazhong University of Science and Technology, China; NSFOCUS Technologies Group, n.n.)
Article Search
A Large-Scale Empirical Study on Improving the Fairness of Image Classification Models
Junjie Yang ORCID logo, Jiajun Jiang ORCID logo, Zeyu Sun ORCID logo, and Junjie Chen ORCID logo
(Tianjin University, China; Institute of Software at Chinese Academy of Sciences, China)
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A Large-Scale Evaluation for Log Parsing Techniques: How Far Are We?
Zhihan Jiang ORCID logo, Jinyang Liu ORCID logo, Junjie Huang ORCID logo, Yichen Li ORCID logo, Yintong Huo ORCID logo, Jiazhen Gu ORCID logo, Zhuangbin Chen ORCID logo, Jieming Zhu ORCID logo, and Michael R. Lyu ORCID logo
(Chinese University of Hong Kong, China; Sun Yat-sen University, China; Huawei Noah’s Ark Lab, China)
Article Search
SCALE: Constructing Structured Natural Language Comment Trees for Software Vulnerability Detection
Xin-Cheng Wen ORCID logo, Cuiyun Gao ORCID logo, Shuzheng Gao ORCID logo, Yang Xiao ORCID logo, and Michael R. Lyu ORCID logo
(Harbin Institute of Technology, China; Chinese University of Hong Kong, China; Chinese Academy of Sciences, China)
Preprint
Distance-Aware Test Input Selection for Deep Neural Networks
Zhong LiORCID logo, Zhengfeng Xu ORCID logo, Ruihua Ji ORCID logo, Minxue PanORCID logo, Tian Zhang ORCID logo, Linzhang Wang ORCID logo, and Xuandong Li ORCID logo
(Nanjing University, China)
Article Search
LPR: Large Language Models-Aided Program Reduction
Mengxiao Zhang ORCID logo, Yongqiang Tian ORCID logo, Zhenyang Xu ORCID logo, Yiwen Dong ORCID logo, Shin Hwei Tan ORCID logo, and Chengnian Sun ORCID logo
(University of Waterloo, Canada; Hong Kong University of Science and Technology, China; Concordia University, Canada)
Article Search
Bridge and Hint: Extending Pre-trained Language Models for Long-Range Code
Yujia Chen ORCID logo, Cuiyun Gao ORCID logo, Zezhou Yang ORCID logo, Hongyu Zhang ORCID logo, and Qing Liao ORCID logo
(Harbin Institute of Technology, China; Chongqing University, China)
Article Search
Define-Use Guided Path Exploration for Better Forced Execution
Dongnan He ORCID logo, Dongchen Xie ORCID logo, Yujie Wang ORCID logo, Wei You ORCID logo, Bin Liang ORCID logo, Jianjun Huang ORCID logo, Wenchang Shi ORCID logo, Zhuo Zhang ORCID logo, and Xiangyu ZhangORCID logo
(Renmin University of China, China; Purdue University, USA)
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C2D2: Extracting Critical Changes for Real-World Bugs with Dependency-Sensitive Delta Debugging
Xuezhi Song ORCID logo, Yijian Wu ORCID logo, Shuning Liu ORCID logo, Bihuan Chen ORCID logo, Yun Lin ORCID logo, and Xin Peng ORCID logo
(Fudan University, China; Shanghai Jiao Tong University, China)
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FT2Ra: A Fine-Tuning-Inspired Approach to Retrieval-Augmented Code Completion
Qi Guo ORCID logo, Xiaohong Li ORCID logo, Xiaofei XieORCID logo, Shangqing Liu ORCID logo, Ze Tang ORCID logo, Ruitao Feng ORCID logo, Junjie Wang ORCID logo, Jidong Ge ORCID logo, and Lei Bu ORCID logo
(Tianjin University, China; Singapore Management University, Singapore; Nanyang Technological University, Singapore; Nanjing University, Nanjing, China; Nanjing University, China)
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MicroRes: Versatile Resilience Profiling in Microservices via Degradation Dissemination Indexing
Tianyi Yang ORCID logo, Cheryl Lee ORCID logo, Jiacheng Shen ORCID logo, Yuxin Su ORCID logo, Cong Feng ORCID logo, Yongqiang Yang ORCID logo, and Michael R. Lyu ORCID logo
(Chinese University of Hong Kong, China; Sun Yat-sen University, China; Huawei Cloud Computing Technology, n.n.)
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Isolation-Based Debugging for Neural Networks
Jialuo Chen ORCID logo, Jingyi Wang ORCID logo, Youcheng Sun ORCID logo, Peng Cheng ORCID logo, and Jiming Chen ORCID logo
(Zhejiang University, China; University of Manchester, United Kingdom)
Article Search
Atlas: Automating Cross-Language Fuzzing on Android Closed-Source Libraries
Hao Xiong ORCID logo, Qinming Dai ORCID logo, Rui Chang ORCID logo, Mingran Qiu ORCID logo, Renxiang Wang ORCID logo, Wenbo Shen ORCID logo, and Yajin Zhou ORCID logo
(Zhejiang University, China)
Article Search
Automating Zero-Shot Patch Porting for Hard Forks
Shengyi Pan ORCID logo, You Wang ORCID logo, Zhongxin LiuORCID logo, Xing Hu ORCID logo, Xin Xia ORCID logo, and Shanping Li ORCID logo
(Zhejiang University, China; Huawei, China)
Article Search
DiaVio: LLM-Empowered Diagnosis of Safety Violations in ADS Simulation Testing
You Lu ORCID logo, Yifan Tian ORCID logo, Yuyang Bi ORCID logo, Bihuan Chen ORCID logo, and Xin Peng ORCID logo
(Fudan University, China)
Article Search
Graph Neural Networks for Vulnerability Detection: A Counterfactual Explanation
Zhaoyang Chu ORCID logo, Yao Wan ORCID logo, Qian Li ORCID logo, Yang Wu ORCID logo, Hongyu Zhang ORCID logo, Yulei Sui ORCID logo, Guandong Xu ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Curtin University, Perth, Australia; Chongqing University, China; UNSW, Sydney, Australia; University of Technology, Sydney, Australia)
Article Search
DeFort: Automatic Detection and Analysis of Price Manipulation Attacks in DeFi Applications
Maoyi XieORCID logo, Ming Hu ORCID logo, Ziqiao Kong ORCID logo, Cen Zhang ORCID logo, Yebo Feng ORCID logo, Haijun Wang ORCID logo, Yue Xue ORCID logo, Hao Zhang ORCID logo, Ye Liu ORCID logo, and Yang Liu ORCID logo
(Nanyang Technological University, Singapore; Xi'an Jiaotong University, China; MetaTrust Labs, n.n.)
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Traceback: A Fault Localization Technique for Molecular Programs
Michael C. Gerten ORCID logo, James I. Lathrop ORCID logo, and Myra B. Cohen ORCID logo
(Iowa State University, USA)
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Silent Taint-Style Vulnerability Fixes Identification
Zhongzhen Wen ORCID logo, Jiayuan Zhou ORCID logo, Minxue PanORCID logo, Shaohua Wang ORCID logo, Xing Hu ORCID logo, Tongtong Xu ORCID logo, Tian Zhang ORCID logo, and Xuandong Li ORCID logo
(Nanjing University, China; Huawei, Waterloo, Canada; Central University of Finance and Economics, China; Zhejiang University, China; Huawei, China)
Article Search
Benchmarking Automated Program Repair: An Extensive Study on Both Real-World and Artificial Bugs
Yicheng Ouyang ORCID logo, Jun Yang ORCID logo, and Lingming Zhang ORCID logo
(University of Illinois at Urbana-Champaign, USA)
Article Search Info Artifacts Available
Multi-modal Learning for WebAssembly Reverse Engineering
Hanxian Huang ORCID logo and Jishen Zhao ORCID logo
(University of California at San Diego, San Diego, USA)
Article Search
CoEdPilot: Recommending Code Edits with Learned Prior Edit Relevance, Project-wise Awareness, and Interactive Nature
Chenyan Liu ORCID logo, Yufan Cai ORCID logo, Yun Lin ORCID logo, Yuhuan Huang ORCID logo, Yunrui Pei ORCID logo, Bo Jiang ORCID logo, Ping Yang ORCID logo, Jin Song Dong ORCID logo, and Hong Mei ORCID logo
(Shanghai Jiao Tong University, China; National University of Singapore, Singapore; Bytedance Network Technology, Beijing, China)
Article Search
Automated Deep Learning Optimization via DSL-Based Source Code Transformation
Ruixin Wang ORCID logo, Minghai Lu ORCID logo, Cody Hao Yu ORCID logo, Yi-Hsiang Lai ORCID logo, and Tianyi Zhang ORCID logo
(Purdue University, USA; BosonAI, n.n.; Amazon Web Services, n.n.)
Article Search Artifacts Available
Evaluating the Effectiveness of Decompilers
Ying Cao ORCID logo, Runze Zhang ORCID logo, Ruigang Liang ORCID logo, and Kai Chen ORCID logo
(Institute of Information Engineering at Chinese Academy of Sciences, Beijing, China)
Article Search
CLAP: Learning Transferable Binary Code Representations with Natural Language Supervision
Hao WangORCID logo, Zeyu Gao ORCID logo, Chao Zhang ORCID logo, Zihan Sha ORCID logo, Mingyang Sun ORCID logo, Yuchen Zhou ORCID logo, Wenyu Zhu ORCID logo, Wenju Sun ORCID logo, Han Qiu ORCID logo, and Xi Xiao ORCID logo
(Tsinghua University, China; Information Engineering University, China; University of Electronic Science and Technology of China, China; Beijing University of Technology, China)
Preprint
FunRedisp: Reordering Function Dispatch in Smart Contract to Reduce Invocation Gas Fees
Yunqi Liu ORCID logo and Wei Song ORCID logo
(Nanjing University of Science and Technology, China)
Article Search Artifacts Available

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