ISSTA 2023
32nd ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2023)
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32nd ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2023), July 17–21, 2023, Seattle, WA, USA

ISSTA 2023 – Proceedings

Contents - Abstracts - Authors

Frontmatter

Title Page
Welcome from the Chairs
ISSTA 2023 Organization

Papers

CydiOS: A Model-Based Testing Framework for iOS Apps
Shuohan Wu ORCID logo, Jianfeng Li ORCID logo, Hao Zhou ORCID logo, Yongsheng Fang ORCID logo, Kaifa Zhao ORCID logo, Haoyu Wang ORCID logo, Chenxiong Qian ORCID logo, and Xiapu LuoORCID logo
(Hong Kong Polytechnic University, China; Xi’an Jiaotong University, China; Beijing University of Posts and Telecommunications, China; Huazhong University of Science and Technology, China; University of Hong Kong, China)
Publisher's Version Published Artifact Artifacts Available
Improving Bit-Blasting for Nonlinear Integer Constraints
Fuqi Jia ORCID logo, Rui Han ORCID logo, Pei Huang ORCID logo, Minghao Liu ORCID logo, Feifei Ma ORCID logo, and Jian ZhangORCID logo
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Stanford University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
CONCORD: Clone-Aware Contrastive Learning for Source Code
Yangruibo DingORCID logo, Saikat Chakraborty ORCID logo, Luca Buratti ORCID logo, Saurabh Pujar ORCID logo, Alessandro Morari ORCID logo, Gail Kaiser ORCID logo, and Baishakhi RayORCID logo
(Columbia University, USA; Microsoft Research, USA; IBM Research, USA)
Publisher's Version
Towards Efficient Fine-Tuning of Pre-trained Code Models: An Experimental Study and Beyond
Ensheng Shi ORCID logo, Yanlin Wang ORCID logo, Hongyu Zhang ORCID logo, Lun Du ORCID logo, Shi Han ORCID logo, Dongmei Zhang ORCID logo, and Hongbin Sun ORCID logo
(Xi’an Jiaotong University, China; Sun Yat-sen University, China; Chongqing University, China; Microsoft, China)
Publisher's Version
Understanding and Tackling Label Errors in Deep Learning-Based Vulnerability Detection (Experience Paper)
Xu Nie ORCID logo, Ningke Li ORCID logo, Kailong Wang ORCID logo, Shangguang Wang ORCID logo, Xiapu LuoORCID logo, and Haoyu Wang ORCID logo
(Huazhong University of Science and Technology, China; Beijing University of Posts and Telecommunications, China; Hong Kong Polytechnic University, China)
Publisher's Version
Pattern-Based Peephole Optimizations with Java JIT Tests
Zhiqiang Zang ORCID logo, Aditya Thimmaiah ORCID logo, and Milos GligoricORCID logo
(University of Texas at Austin, USA)
Publisher's Version
Icicle: A Re-designed Emulator for Grey-Box Firmware Fuzzing
Michael Chesser ORCID logo, Surya Nepal ORCID logo, and Damith C. Ranasinghe ORCID logo
(University of Adelaide, Australia; CSIRO’s Data61, Australia)
Publisher's Version
Fine-Grained Code Clone Detection with Block-Based Splitting of Abstract Syntax Tree
Tiancheng Hu ORCID logo, Zijing Xu ORCID logo, Yilin Fang ORCID logo, Yueming Wu ORCID logo, Bin Yuan ORCID logo, Deqing Zou ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Nanyang Technological University, Singapore)
Publisher's Version
Reducing the Memory Footprint of IFDS-Based Data-Flow Analyses using Fine-Grained Garbage Collection
Dongjie He ORCID logo, Yujiang Gui ORCID logo, Yaoqing Gao ORCID logo, and Jingling Xue ORCID logo
(UNSW, Australia; Huawei Toronto Research Center, Canada)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Hybrid Inlining: A Framework for Compositional and Context-Sensitive Static Analysis
Jiangchao Liu ORCID logo, Jierui Liu ORCID logo, Peng Di ORCID logo, Diyu Wu ORCID logo, Hengjie Zheng ORCID logo, Alex X. Liu ORCID logo, and Jingling Xue ORCID logo
(Ant Group, China; ByteDance, China; UNSW, Australia)
Publisher's Version
Green Fuzzing: A Saturation-Based Stopping Criterion using Vulnerability Prediction
Stephan Lipp ORCID logo, Daniel Elsner ORCID logo, Severin Kacianka ORCID logo, Alexander Pretschner ORCID logo, Marcel Böhme ORCID logo, and Sebastian Banescu ORCID logo
(TU Munich, Germany; MPI-SP, Germany; Monash University, Australia)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Testing Graph Database Engines via Query Partitioning
Matteo Kamm ORCID logo, Manuel Rigger ORCID logo, Chengyu Zhang ORCID logo, and Zhendong Su ORCID logo
(ETH Zurich, Switzerland; National University of Singapore, Singapore)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Functional
Semantic-Based Neural Network Repair
Richard Schumi ORCID logo and Jun SunORCID logo
(Singapore Management University, Singapore)
Publisher's Version
GDsmith: Detecting Bugs in Cypher Graph Database Engines
Ziyue Hua ORCID logo, Wei Lin ORCID logo, Luyao Ren ORCID logo, Zongyang Li ORCID logo, Lu Zhang ORCID logo, Wenpin Jiao ORCID logo, and Tao Xie ORCID logo
(Peking University, China)
Publisher's Version
Loop Invariant Inference through SMT Solving Enhanced Reinforcement Learning
Shiwen Yu ORCID logo, Ting Wang ORCID logo, and Ji Wang ORCID logo
(National University of Defense Technology, China)
Publisher's Version Published Artifact Info Artifacts Available
CODEP: Grammatical Seq2Seq Model for General-Purpose Code Generation
Yihong Dong ORCID logo, Ge Li ORCID logo, and Zhi Jin ORCID logo
(Peking University, China)
Publisher's Version
Concept-Based Automated Grading of CS-1 Programming Assignments
Zhiyu Fan ORCID logo, Shin Hwei Tan ORCID logo, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; Concordia University, Canada)
Publisher's Version
Beware of the Unexpected: Bimodal Taint Analysis
Yiu Wai Chow ORCID logo, Max Schäfer ORCID logo, and Michael Pradel ORCID logo
(University of Stuttgart, Germany; GitHub, UK)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
DeUEDroid: Detecting Underground Economy Apps Based on UTG Similarity
Zhuo Chen ORCID logo, Jie Liu ORCID logo, Yubo Hu ORCID logo, Lei Wu ORCID logo, Yajin Zhou ORCID logo, Yiling He ORCID logo, Xianhao Liao ORCID logo, Ke Wang ORCID logo, Jinku Li ORCID logo, and Zhan Qin ORCID logo
(Zhejiang University, China; Ant Group, China; Xidian University, China)
Publisher's Version Published Artifact Archive submitted (850 kB) Artifacts Available
Dependency-Aware Metamorphic Testing of Datalog Engines
Muhammad Numair MansurORCID logo, Valentin WüstholzORCID logo, and Maria ChristakisORCID logo
(MPI-SWS, Germany; ConsenSys, Austria; TU Wien, Austria)
Publisher's Version Info
Fuzzing Deep Learning Compilers with HirGen
Haoyang Ma ORCID logo, Qingchao Shen ORCID logo, Yongqiang Tian ORCID logo, Junjie Chen ORCID logo, and Shing-Chi CheungORCID logo
(Hong Kong University of Science and Technology, China; Tianjin University, China; University of Waterloo, Canada)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
API2Vec: Learning Representations of API Sequences for Malware Detection
Lei Cui ORCID logo, Jiancong Cui ORCID logo, Yuede Ji ORCID logo, Zhiyu Hao ORCID logo, Lun Li ORCID logo, and Zhenquan Ding ORCID logo
(Zhongguancun Laboratory, China; University of Chinese Academy of Sciences, China; Institute of Information Engineering at Chinese Academy of Sciences, China; University of North Texas, USA)
Publisher's Version
June: A Type Testability Transformation for Improved ATG Performance
Dan Bruce ORCID logo, David Kelly ORCID logo, Hector Menendez ORCID logo, Earl T. Barr ORCID logo, and David Clark ORCID logo
(Microsoft, UK; University College London, UK; King’s College London, UK)
Publisher's Version
A Comprehensive Study on Quality Assurance Tools for Java
Han Liu ORCID logo, Sen Chen ORCID logo, Ruitao Feng ORCID logo, Chengwei Liu ORCID logo, Kaixuan Li ORCID logo, Zhengzi Xu ORCID logo, Liming Nie ORCID logo, Yang Liu ORCID logo, and Yixiang Chen ORCID logo
(East China Normal University, China; Tianjin University, China; UNSW, Australia; Nanyang Technological University, Singapore)
Publisher's Version
Detecting State Inconsistency Bugs in DApps via On-Chain Transaction Replay and Fuzzing
Mingxi Ye ORCID logo, Yuhong Nan ORCID logo, Zibin Zheng ORCID logo, Dongpeng Wu ORCID logo, and Huizhong Li ORCID logo
(Sun Yat-sen University, China; WeBank, China)
Publisher's Version Published Artifact Artifacts Available
FairRec: Fairness Testing for Deep Recommender Systems
Huizhong Guo ORCID logo, Jinfeng Li ORCID logo, Jingyi Wang ORCID logo, Xiangyu Liu ORCID logo, Dongxia Wang ORCID logo, Zehong Hu ORCID logo, Rong Zhang ORCID logo, and Hui Xue ORCID logo
(Zhejiang University, China; Alibaba Group, China)
Publisher's Version Archive submitted (71 kB)
ItyFuzz: Snapshot-Based Fuzzer for Smart Contract
Chaofan Shou ORCID logo, Shangyin Tan ORCID logo, and Koushik Sen ORCID logo
(University of California at Berkeley, USA)
Publisher's Version
Who Judges the Judge: An Empirical Study on Online Judge Tests
Kaibo Liu ORCID logo, Yudong Han ORCID logo, Jie M. Zhang ORCID logo, Zhenpeng ChenORCID logo, Federica SarroORCID logo, Mark HarmanORCID logo, Gang Huang ORCID logo, and Yun Ma ORCID logo
(Peking University, China; King’s College London, UK; University College London, UK; National Key Laboratory of Data Space Technology and System, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Precise and Efficient Patch Presence Test for Android Applications against Code Obfuscation
Zifan Xie ORCID logo, Ming WenORCID logo, Haoxiang Jia ORCID logo, Xiaochen Guo ORCID logo, Xiaotong Huang ORCID logo, Deqing Zou ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Detecting Vulnerabilities in Linux-Based Embedded Firmware with SSE-Based On-Demand Alias Analysis
Kai Cheng ORCID logo, Yaowen Zheng ORCID logo, Tao Liu ORCID logo, Le Guan ORCID logo, Peng Liu ORCID logo, Hong Li ORCID logo, Hongsong Zhu ORCID logo, Kejiang Ye ORCID logo, and Limin Sun ORCID logo
(Shenzhen Institute of Advanced Technology at Chinese Academy of Sciences, China; Sangfor Technologies, China; Nanyang Technological University, Singapore; Pennsylvania State University, USA; University of Georgia, USA; Institute of Information Engineering at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
Definition and Detection of Defects in NFT Smart Contracts
Shuo Yang ORCID logo, Jiachi Chen ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China)
Publisher's Version
Eunomia: Enabling User-Specified Fine-Grained Search in Symbolically Executing WebAssembly Binaries
Ningyu He ORCID logo, Zhehao Zhao ORCID logo, Jikai Wang ORCID logo, Yubin Hu ORCID logo, Shengjian Guo ORCID logo, Haoyu Wang ORCID logo, Guangtai Liang ORCID logo, Ding Li ORCID logo, Xiangqun Chen ORCID logo, and Yao Guo ORCID logo
(Peking University, China; Huazhong University of Science and Technology, China; Beijing University of Posts and Telecommunications, China; Baidu Security, USA; Huawei Cloud Computing Technologies, China)
Publisher's Version
Type Batched Program Reduction
Golnaz Gharachorlu ORCID logo and Nick Sumner ORCID logo
(Simon Fraser University, Canada)
Publisher's Version Published Artifact Artifacts Available
Automatically Reproducing Android Bug Reports using Natural Language Processing and Reinforcement Learning
Zhaoxu Zhang ORCID logo, Robert Winn ORCID logo, Yu Zhao ORCID logo, Tingting Yu ORCID logo, and William G.J. HalfondORCID logo
(University of Southern California, USA; University of Central Missouri, USA; University of Cincinnati, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Large Language Models Are Zero-Shot Fuzzers: Fuzzing Deep-Learning Libraries via Large Language Models
Yinlin Deng ORCID logo, Chunqiu Steven Xia ORCID logo, Haoran Peng ORCID logo, Chenyuan YangORCID logo, and Lingming Zhang ORCID logo
(University of Illinois at Urbana-Champaign, USA; University of Science and Technology of China, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Exploring Missed Optimizations in WebAssembly Optimizers
Zhibo Liu ORCID logo, Dongwei Xiao ORCID logo, Zongjie Li ORCID logo, Shuai Wang ORCID logo, and Wei Meng ORCID logo
(Hong Kong University of Science and Technology, China; Chinese University of Hong Kong, China)
Publisher's Version
PhysCov: Physical Test Coverage for Autonomous Vehicles
Carl Hildebrandt ORCID logo, Meriel von Stein ORCID logo, and Sebastian Elbaum ORCID logo
(University of Virginia, USA)
Publisher's Version Info
Building Critical Testing Scenarios for Autonomous Driving from Real Accidents
Xudong Zhang ORCID logo and Yan CaiORCID logo
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Publisher's Version
CILIATE: Towards Fairer Class-Based Incremental Learning by Dataset and Training Refinement
Xuanqi Gao ORCID logo, Juan Zhai ORCID logo, Shiqing Ma ORCID logo, Chao Shen ORCID logo, Yufei Chen ORCID logo, and Shiwei Wang ORCID logo
(Xi’an Jiaotong University, China; University of Massachusetts, USA; City University of Hong Kong, China)
Publisher's Version
BehAVExplor: Behavior Diversity Guided Testing for Autonomous Driving Systems
Mingfei ChengORCID logo, Yuan ZhouORCID logo, and Xiaofei XieORCID logo
(Singapore Management University, Singapore; Nanyang Technological University, Singapore)
Publisher's Version
In Defense of Simple Techniques for Neural Network Test Case Selection
Shenglin Bao, Chaofeng Sha, Bihuan Chen ORCID logo, Xin Peng ORCID logo, and Wenyun Zhao
(Fudan University, China)
Publisher's Version
ConfFix: Repairing Configuration Compatibility Issues in Android Apps
Huaxun Huang ORCID logo, Chi Xu ORCID logo, Ming WenORCID logo, Yepang Liu ORCID logo, and Shing-Chi CheungORCID logo
(Hong Kong University of Science and Technology, China; Southern University of Science and Technology, China; Huazhong University of Science and Technology, China)
Publisher's Version
Vectorizing Program Ingredients for Better JVM Testing
Tianchang Gao ORCID logo, Junjie Chen ORCID logo, Yingquan Zhao ORCID logo, Yuqun Zhang ORCID logo, and Lingming Zhang ORCID logo
(Tianjin University, China; Southern University of Science and Technology, China; University of Illinois at Urbana-Champaign, USA)
Publisher's Version
What You See Is What You Get? It Is Not the Case! Detecting Misleading Icons for Mobile Applications
Linlin Li ORCID logo, Ruifeng Wang ORCID logo, Xian Zhan ORCID logo, Ying Wang ORCID logo, Cuiyun Gao ORCID logo, Sinan Wang ORCID logo, and Yepang Liu ORCID logo
(Southern University of Science and Technology, China; Northeastern University, China; Harbin Institute of Technology, China)
Publisher's Version
Testing the Compiler for a New-Born Programming Language: An Industrial Case Study (Experience Paper)
Yingquan Zhao ORCID logo, Junjie Chen ORCID logo, Ruifeng Fu ORCID logo, Haojie Ye ORCID logo, and Zan Wang ORCID logo
(Tianjin University, China; Huawei, China)
Publisher's Version
Quantitative Policy Repair for Access Control on the Cloud
William Eiers ORCID logo, Ganesh Sankaran ORCID logo, and Tevfik BultanORCID logo
(University of California at Santa Barbara, USA)
Publisher's Version
Validating Multimedia Content Moderation Software via Semantic Fusion
Wenxuan Wang ORCID logo, Jingyuan Huang ORCID logo, Chang Chen ORCID logo, Jiazhen Gu ORCID logo, Jianping Zhang ORCID logo, Weibin Wu ORCID logo, Pinjia He ORCID logo, and Michael Lyu ORCID logo
(Chinese University of Hong Kong, China; Sun Yat-sen University, China)
Publisher's Version
Towards More Realistic Evaluation for Neural Test Oracle Generation
Zhongxin LiuORCID logo, Kui Liu ORCID logo, Xin Xia ORCID logo, and Xiaohu Yang ORCID logo
(Zhejiang University, China; Huawei, China)
Publisher's Version
Back Deduction Based Testing for Word Sense Disambiguation Ability of Machine Translation Systems
Jun Wang ORCID logo, Yanhui LiORCID logo, Xiang Huang ORCID logo, Lin Chen ORCID logo, Xiaofang Zhang ORCID logo, and Yuming ZhouORCID logo
(Nanjing University, China; Soochow University, China)
Publisher's Version
DyCL: Dynamic Neural Network Compilation Via Program Rewriting and Graph Optimization
Simin Chen ORCID logo, Shiyi Wei ORCID logo, Cong Liu ORCID logo, and Wei YangORCID logo
(University of Texas at Dallas, USA; University of California at Riverside, USA)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Functional
Systematically Producing Test Orders to Detect Order-Dependent Flaky Tests
Chengpeng LiORCID logo, M. Mahdi Khosravi ORCID logo, Wing Lam ORCID logo, and August ShiORCID logo
(University of Texas at Austin, USA; Middle East Technical University, Turkey; George Mason University, USA)
Publisher's Version
Security Checking of Trigger-Action-Programming Smart Home Integrations
Lei Bu ORCID logo, Qiuping Zhang ORCID logo, Suwan Li ORCID logo, Jinglin Dai ORCID logo, Guangdong Bai ORCID logo, Kai Chen ORCID logo, and Xuandong Li ORCID logo
(Nanjing University, China; University of Queensland, Australia; Institute of Information Engineering at Chinese Academy of Sciences, China)
Publisher's Version
LiResolver: License Incompatibility Resolution for Open Source Software
Sihan Xu ORCID logo, Ya Gao ORCID logo, Lingling Fan ORCID logo, Linyu Li ORCID logo, Xiangrui Cai ORCID logo, and Zheli Liu ORCID logo
(Nankai University, China)
Publisher's Version
More Precise Regression Test Selection via Reasoning about Semantics-Modifying Changes
Yu Liu ORCID logo, Jiyang Zhang ORCID logo, Pengyu Nie ORCID logo, Milos GligoricORCID logo, and Owolabi Legunsen ORCID logo
(University of Texas at Austin, USA; Cornell University, USA)
Publisher's Version
Silent Compiler Bug De-duplication via Three-Dimensional Analysis
Chen Yang ORCID logo, Junjie Chen ORCID logo, Xingyu Fan ORCID logo, Jiajun Jiang ORCID logo, and Jun SunORCID logo
(Tianjin University, China; Singapore Management University, Singapore)
Publisher's Version
ACETest: Automated Constraint Extraction for Testing Deep Learning Operators
Jingyi Shi ORCID logo, Yang Xiao ORCID logo, Yuekang Li ORCID logo, Yeting Li ORCID logo, Dongsong Yu ORCID logo, Chendong Yu ORCID logo, Hui Su ORCID logo, Yufeng Chen ORCID logo, and Wei Huo ORCID logo
(Institute of Information Engineering at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; UNSW, Australia; Zhongguancun Laboratory, China)
Publisher's Version
DDLDroid: Efficiently Detecting Data Loss Issues in Android Apps
Yuhao Zhou ORCID logo and Wei Song ORCID logo
(Nanjing University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available
To Kill a Mutant: An Empirical Study of Mutation Testing Kills
Hang Du ORCID logo, Vijay Krishna Palepu ORCID logo, and James A. Jones ORCID logo
(University of California at Irvine, USA; Microsoft, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
iSyn: Semi-automated Smart Contract Synthesis from Legal Financial Agreements
Pengcheng Fang ORCID logo, Zhenhua Zou ORCID logo, Xusheng Xiao ORCID logo, and Zhuotao Liu ORCID logo
(Case Western Reserve University, USA; Tsinghua University, China; Arizona State University, USA)
Publisher's Version Info
RefBERT: A Two-Stage Pre-trained Framework for Automatic Rename Refactoring
Hao Liu ORCID logo, Yanlin Wang ORCID logo, Zhao Wei ORCID logo, Yong Xu ORCID logo, Juhong Wang ORCID logo, Hui Li ORCID logo, and Rongrong Ji ORCID logo
(Xiamen University, China; Sun Yat-sen University, China; Tencent, China)
Publisher's Version
CoopHance: Cooperative Enhancement for Robustness of Deep Learning Systems
Quan Zhang ORCID logo, Yongqiang Tian ORCID logo, Yifeng DingORCID logo, Shanshan Li ORCID logo, Chengnian Sun ORCID logo, Yu JiangORCID logo, and Jiaguang Sun ORCID logo
(Tsinghua University, China; University of Waterloo, Canada; University of Illinois at Urbana-Champaign, USA; National University of Defense Technology, China)
Publisher's Version
ROME: Testing Image Captioning Systems via Recursive Object Melting
Boxi Yu ORCID logo, Zhiqing Zhong ORCID logo, Jiaqi Li ORCID logo, Yixing Yang ORCID logo, Shilin HeORCID logo, and Pinjia He ORCID logo
(Chinese University of Hong Kong, China; Microsoft Research, China)
Publisher's Version Published Artifact Artifacts Available
GPUHarbor: Testing GPU Memory Consistency at Large (Experience Paper)
Reese Levine ORCID logo, Mingun Cho ORCID logo, Devon McKee ORCID logo, Andrew QuinnORCID logo, and Tyler Sorensen ORCID logo
(University of California at Santa Cruz, USA; University of California at Davis, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
COME: Commit Message Generation with Modification Embedding
Yichen He ORCID logo, Liran Wang ORCID logo, Kaiyi Wang ORCID logo, Yupeng Zhang ORCID logo, Hang Zhang ORCID logo, and Zhoujun Li ORCID logo
(Beihang University, China)
Publisher's Version
OCFI: Make Function Entry Identification Hard Again
Chengbin Pang ORCID logo, Tiantai Zhang ORCID logo, Xuelan Xu ORCID logo, Linzhang Wang ORCID logo, and Bing Mao ORCID logo
(Nanjing University, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Catamaran: Low-Overhead Memory Safety Enforcement via Parallel Acceleration
Yiyu Zhang ORCID logo, Tianyi Liu ORCID logo, Zewen Sun ORCID logo, Zhe Chen ORCID logo, Xuandong Li ORCID logo, and Zhiqiang ZuoORCID logo
(Nanjing University, China; Nanjing University of Aeronautics and Astronautics, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Latent Imitator: Generating Natural Individual Discriminatory Instances for Black-Box Fairness Testing
Yisong Xiao ORCID logo, Aishan Liu ORCID logo, Tianlin Li ORCID logo, and Xianglong Liu ORCID logo
(Beihang University, China; Institute of Dataspace, China; Nanyang Technological University, Singapore; Zhongguancun Laboratory, China)
Publisher's Version Info
Simulation-Based Validation for Autonomous Driving Systems
Changwen Li ORCID logo, Joseph Sifakis ORCID logo, Qiang Wang ORCID logo, Rongjie Yan ORCID logo, and Jian ZhangORCID logo
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; University Grenoble Alpes, France; CNRS, France; Grenoble INP, France; VERIMAG, France; Academy of Military Sciences, China)
Publisher's Version Published Artifact Artifacts Available
Automated Program Repair from Fuzzing Perspective
YoungJae KimORCID logo, Seungheon HanORCID logo, Askar Yeltayuly Khamit ORCID logo, and Jooyong YiORCID logo
(Ulsan National Institute of Science and Technology, South Korea)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
1dFuzz: Reproduce 1-Day Vulnerabilities with Directed Differential Fuzzing
Songtao Yang ORCID logo, Yubo He ORCID logo, Kaixiang Chen ORCID logo, Zheyu Ma ORCID logo, Xiapu LuoORCID logo, Yong Xie ORCID logo, Jianjun Chen ORCID logo, and Chao Zhang ORCID logo
(Tsinghua University, China; Information Engineering University, China; Hong Kong Polytechnic University, China; Qinghai University, China)
Publisher's Version
A Bayesian Framework for Automated Debugging
Sungmin Kang ORCID logo, Wonkeun Choi ORCID logo, and Shin Yoo ORCID logo
(KAIST, South Korea)
Publisher's Version
That’s a Tough Call: Studying the Challenges of Call Graph Construction for WebAssembly
Daniel LehmannORCID logo, Michelle Thalakottur ORCID logo, Frank Tip ORCID logo, and Michael Pradel ORCID logo
(University of Stuttgart, Germany; Northeastern University, USA)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
GenCoG: A DSL-Based Approach to Generating Computation Graphs for TVM Testing
Zihan Wang ORCID logo, Pengbo Nie ORCID logo, Xinyuan Miao ORCID logo, Yuting Chen ORCID logo, Chengcheng Wan ORCID logo, Lei Bu ORCID logo, and Jianjun Zhao ORCID logo
(Shanghai Jiao Tong University, China; East China Normal University, China; Nanjing University, China; Kyushu University, Japan)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Alligator in Vest: A Practical Failure-Diagnosis Framework via Arm Hardware Features
Yiming Zhang ORCID logo, Yuxin Hu ORCID logo, Haonan Li ORCID logo, Wenxuan Shi ORCID logo, Zhenyu Ning ORCID logo, Xiapu LuoORCID logo, and Fengwei Zhang ORCID logo
(Southern University of Science and Technology, China; Hong Kong Polytechnic University, China; Hunan University, China)
Publisher's Version
Guiding Greybox Fuzzing with Mutation Testing
Vasudev Vikram ORCID logo, Isabella Laybourn ORCID logo, Ao Li ORCID logo, Nicole Nair ORCID logo, Kelton OBrien ORCID logo, Rafaello Sanna ORCID logo, and Rohan PadhyeORCID logo
(Carnegie Mellon University, USA; Swarthmore College, USA; University of Minnesota, USA; University of Rochester, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Testing Automated Driving Systems by Breaking Many Laws Efficiently
Xiaodong Zhang ORCID logo, Wei Zhao ORCID logo, Yang Sun ORCID logo, Jun SunORCID logo, Yulong Shen ORCID logo, Xuewen Dong ORCID logo, and Zijiang Yang ORCID logo
(Xidian University, China; Singapore Management University, Singapore; GuardStrike, China)
Publisher's Version
DeepAtash: Focused Test Generation for Deep Learning Systems
Tahereh Zohdinasab ORCID logo, Vincenzo Riccio ORCID logo, and Paolo Tonella ORCID logo
(USI Lugano, Switzerland)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
SBDT: Search-Based Differential Testing of Certificate Parsers in SSL/TLS Implementations
Chu Chen ORCID logo, Pinghong Ren ORCID logo, Zhenhua Duan ORCID logo, Cong Tian ORCID logo, Xu Lu ORCID logo, and Bin Yu ORCID logo
(Qufu Normal University, China; Xidian University, China)
Publisher's Version
SmartState: Detecting State-Reverting Vulnerabilities in Smart Contracts via Fine-Grained State-Dependency Analysis
Zeqin Liao ORCID logo, Sicheng Hao ORCID logo, Yuhong Nan ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China)
Publisher's Version
ωTest: WebView-Oriented Testing for Android Applications
Jiajun Hu ORCID logo, Lili Wei ORCID logo, Yepang Liu ORCID logo, and Shing-Chi CheungORCID logo
(Hong Kong University of Science and Technology, China; McGill University, Canada; Southern University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available
ModelObfuscator: Obfuscating Model Information to Protect Deployed ML-Based Systems
Mingyi Zhou ORCID logo, Xiang Gao ORCID logo, Jing Wu ORCID logo, John Grundy ORCID logo, Xiao Chen ORCID logo, Chunyang Chen ORCID logo, and Li Li ORCID logo
(Monash University, Australia; Beihang University, China)
Publisher's Version Info
AGORA: Automated Generation of Test Oracles for REST APIs
Juan C. Alonso ORCID logo, Sergio Segura ORCID logo, and Antonio Ruiz-Cortés ORCID logo
(University of Seville, Spain)
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Fuzzing Embedded Systems using Debug Interfaces
Max Eisele ORCID logo, Daniel Ebert ORCID logo, Christopher Huth ORCID logo, and Andreas Zeller ORCID logo
(Robert Bosch, Germany; Saarland University, Germany; CISPA Helmholtz Center for Information Security, Germany)
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Splendor: Static Detection of Stored XSS in Modern Web Applications
He Su ORCID logo, Feng Li ORCID logo, Lili Xu ORCID logo, Wenbo Hu ORCID logo, Yujie Sun ORCID logo, Qing Sun ORCID logo, Huina Chao ORCID logo, and Wei Huo ORCID logo
(Institute of Information Engineering at Chinese Academy of Sciences, China)
Publisher's Version Info
Applying and Extending the Delta Debugging Algorithm for Elevator Dispatching Algorithms (Experience Paper)
Pablo Valle ORCID logo, Aitor Arrieta ORCID logo, and Maite Arratibel ORCID logo
(Mondragon University, Spain; Orona, Spain)
Publisher's Version
Finding Short Slow Inputs Faster with Grammar-Based Search
Ziyad Alsaeed ORCID logo and Michal Young ORCID logo
(Qassim University, Saudi Arabia; University of Oregon, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Transforming Test Suites into Croissants
Yang Chen ORCID logo, Alperen Yildiz ORCID logo, Darko MarinovORCID logo, and Reyhaneh Jabbarvand ORCID logo
(University of Illinois at Urbana-Champaign, USA; Sabanci University, Turkey)
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Tai-e: A Developer-Friendly Static Analysis Framework for Java by Harnessing the Good Designs of Classics
Tian Tan ORCID logo and Yue Li ORCID logo
(Nanjing University, China)
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Improving Binary Code Similarity Transformer Models by Semantics-Driven Instruction Deemphasis
Xiangzhe Xu ORCID logo, Shiwei Feng ORCID logo, Yapeng Ye ORCID logo, Guangyu Shen ORCID logo, Zian Su ORCID logo, Siyuan Cheng ORCID logo, Guanhong Tao ORCID logo, Qingkai Shi ORCID logo, Zhuo Zhang ORCID logo, and Xiangyu ZhangORCID logo
(Purdue University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Data Constraint Mining for Automatic Reconciliation Scripts Generation
Tianxiao Wang ORCID logo, Chen Zhi ORCID logo, Xiaoqun Zhou ORCID logo, Jinjie Wu ORCID logo, Jianwei Yin ORCID logo, and Shuiguang Deng ORCID logo
(Zhejiang University, China; Alibaba-Zhejiang University Joint Institute of Frontier Technologies, China; Alibaba Group, China)
Publisher's Version
Guided Retraining to Enhance the Detection of Difficult Android Malware
Nadia Daoudi ORCID logo, Kevin Allix ORCID logo, Tegawendé F. Bissyandé ORCID logo, and Jacques KleinORCID logo
(University of Luxembourg, Luxembourg; CentraleSupélec, France)
Publisher's Version
DeFiTainter: Detecting Price Manipulation Vulnerabilities in DeFi Protocols
Queping Kong ORCID logo, Jiachi Chen ORCID logo, Yanlin Wang ORCID logo, Zigui Jiang ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China)
Publisher's Version
Beyond “Protected” and “Private”: An Empirical Security Analysis of Custom Function Modifiers in Smart Contracts
Yuzhou Fang ORCID logo, Daoyuan Wu ORCID logo, Xiao Yi ORCID logo, Shuai Wang ORCID logo, Yufan Chen ORCID logo, Mengjie Chen ORCID logo, Yang Liu ORCID logo, and Lingxiao Jiang ORCID logo
(Hong Kong University of Science and Technology, China; Chinese University of Hong Kong, China; Xidian University, China; Mask Network, China; Nanyang Technological University, Singapore; Singapore Management University, Singapore)
Publisher's Version
Synthesizing Speech Test Cases with Text-to-Speech? An Empirical Study on the False Alarms in Automated Speech Recognition Testing
Julia Kaiwen Lau ORCID logo, Kelvin Kai Wen Kong ORCID logo, Julian Hao Yong ORCID logo, Per Hoong Tan ORCID logo, Zhou YangORCID logo, Zi Qian Yong ORCID logo, Joshua Chern Wey Low ORCID logo, Chun Yong ChongORCID logo, Mei Kuan LimORCID logo, and David LoORCID logo
(Monash University Malaysia, Malaysia; Singapore Management University, Singapore)
Publisher's Version Info
A Tale of Two Approximations: Tightening Over-Approximation for DNN Robustness Verification via Under-Approximation
Zhiyi Xue ORCID logo, Si Liu ORCID logo, Zhaodi Zhang ORCID logo, Yiting Wu ORCID logo, and Min Zhang ORCID logo
(East China Normal University, China; ETH Zurich, Switzerland; Chengdu Education Research Institute, China)
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SlipCover: Near Zero-Overhead Code Coverage for Python
Juan Altmayer PizzornoORCID logo and Emery D. Berger ORCID logo
(University of Massachusetts Amherst, USA)
Publisher's Version Info
Systematic Testing of the Data-Poisoning Robustness of KNN
Yannan Li ORCID logo, Jingbo Wang ORCID logo, and Chao Wang ORCID logo
(University of Southern California, USA)
Publisher's Version
GrayC: Greybox Fuzzing of Compilers and Analysers for C
Karine Even-MendozaORCID logo, Arindam Sharma ORCID logo, Alastair F. DonaldsonORCID logo, and Cristian CadarORCID logo
(King’s College London, UK; Imperial College London, UK)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Enhancing REST API Testing with NLP Techniques
Myeongsoo KimORCID logo, Davide Corradini ORCID logo, Saurabh Sinha ORCID logo, Alessandro OrsoORCID logo, Michele Pasqua ORCID logo, Rachel Tzoref-BrillORCID logo, and Mariano Ceccato ORCID logo
(Georgia Institute of Technology, USA; University of Verona, Italy; IBM Research, USA; IBM Research, Israel)
Publisher's Version Published Artifact Artifacts Available
Automated Generation of Security-Centric Descriptions for Smart Contract Bytecode
Yu Pan ORCID logo, Zhichao Xu ORCID logo, Levi Taiji Li ORCID logo, Yunhe Yang ORCID logo, and Mu Zhang ORCID logo
(University of Utah, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Toward Automated Detecting Unanticipated Price Feed in Smart Contract
Yifan Mo ORCID logo, Jiachi Chen ORCID logo, Yanlin Wang ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China)
Publisher's Version
Virtual Reality (VR) Automated Testing in the Wild: A Case Study on Unity-Based VR Applications
Dhia Elhaq RzigORCID logo, Nafees Iqbal ORCID logo, Isabella Attisano ORCID logo, Xue Qin ORCID logo, and Foyzul Hassan ORCID logo
(University of Michigan at Dearborn, USA; Villanova University, USA)
Publisher's Version Published Artifact Artifacts Available
How Effective Are Neural Networks for Fixing Security Vulnerabilities
Yi Wu ORCID logo, Nan Jiang ORCID logo, Hung Viet PhamORCID logo, Thibaud Lutellier ORCID logo, Jordan Davis ORCID logo, Lin TanORCID logo, Petr Babkin ORCID logo, and Sameena Shah ORCID logo
(Purdue University, USA; York University, Canada; University of Alberta, Canada; J.P. Morgan AI Research, USA)
Publisher's Version
Rare Path Guided Fuzzing
Seemanta Saha ORCID logo, Laboni Sarker ORCID logo, Md Shafiuzzaman ORCID logo, Chaofan Shou ORCID logo, Albert Li ORCID logo, Ganesh Sankaran ORCID logo, and Tevfik Bultan ORCID logo
(University of California at Santa Barbara, USA)
Publisher's Version
CGuard: Scalable and Precise Object Bounds Protection for C
Piyus Kedia ORCID logo, Rahul Purandare ORCID logo, Udit Agarwal ORCID logo, and Rishabh ORCID logo
(IIIT Delhi, India; University of Nebraska-Lincoln, USA; University of British Columbia, Canada; GGSIPU, India)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
An Empirical Study of Functional Bugs in Android Apps
Yiheng Xiong ORCID logo, Mengqian Xu ORCID logo, Ting Su ORCID logo, Jingling Sun ORCID logo, Jue Wang ORCID logo, He Wen ORCID logo, Geguang Pu ORCID logo, Jifeng He ORCID logo, and Zhendong Su ORCID logo
(East China Normal University, China; Nanjing University, China; ETH Zurich, Switzerland)
Publisher's Version
NodeRT: Detecting Races in Node.js Applications Practically
Jingyao Zhou ORCID logo, Lei Xu ORCID logo, Gongzheng Lu ORCID logo, Weifeng Zhang ORCID logo, and Xiangyu ZhangORCID logo
(Nanjing University, China; Suzhou City University, China; Nanjing University of Posts and Telecommunications, China; Purdue University, USA)
Publisher's Version
An Empirical Study on Concurrency Bugs in Interrupt-Driven Embedded Software
Chao Li ORCID logo, Rui Chen ORCID logo, Boxiang Wang ORCID logo, Zhixuan Wang ORCID logo, Tingting Yu ORCID logo, Yunsong Jiang ORCID logo, Bin Gu ORCID logo, and Mengfei Yang ORCID logo
(Beijing Institute of Control Engineering, China; Beijing Sunwise Information Technology, China; Xidian University, China; China Academy of Space Technology, China)
Publisher's Version
CodeGrid: A Grid Representation of Code
Abdoul Kader Kaboré ORCID logo, Earl T. Barr ORCID logo, Jacques KleinORCID logo, and Tegawendé F. Bissyandé ORCID logo
(University of Luxembourg, Luxembourg; University College London, UK; Google DeepMind, Canada)
Publisher's Version
Detecting Condition-Related Bugs with Control Flow Graph Neural Network
Jian Zhang ORCID logo, Xu Wang ORCID logo, Hongyu Zhang ORCID logo, Hailong Sun ORCID logo, Xudong Liu ORCID logo, Chunming Hu ORCID logo, and Yang Liu ORCID logo
(Beihang University, China; Chongqing University, China; Nanyang Technological University, Singapore)
Publisher's Version
Third-Party Library Dependency for Large-Scale SCA in the C/C++ Ecosystem: How Far Are We?
Ling Jiang ORCID logo, Hengchen Yuan ORCID logo, Qiyi Tang ORCID logo, Sen Nie ORCID logo, Shi Wu ORCID logo, and Yuqun Zhang ORCID logo
(Southern University of Science and Technology, China; Tencent Security Keen Lab, China)
Publisher's Version
Green Fuzzer Benchmarking
Jiradet Ounjai ORCID logo, Valentin WüstholzORCID logo, and Maria ChristakisORCID logo
(MPI-SWS, Germany; ConsenSys, Austria; TU Wien, Austria)
Publisher's Version Info
Interpreters for GNN-Based Vulnerability Detection: Are We There Yet?
Yutao Hu ORCID logo, Suyuan Wang ORCID logo, Wenke Li ORCID logo, Junru Peng ORCID logo, Yueming Wu ORCID logo, Deqing Zou ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Wuhan University, China; Nanyang Technological University, Singapore)
Publisher's Version
An Empirical Study on the Effects of Obfuscation on Static Machine Learning-Based Malicious JavaScript Detectors
Kunlun Ren ORCID logo, Weizhong Qiang ORCID logo, Yueming Wu ORCID logo, Yi Zhou ORCID logo, Deqing Zou ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Nanyang Technological University, Singapore)
Publisher's Version Published Artifact Artifacts Available
Understanding Breaking Changes in the Wild
Dhanushka Jayasuriya ORCID logo, Valerio Terragni ORCID logo, Jens Dietrich ORCID logo, Samuel Ou ORCID logo, and Kelly Blincoe ORCID logo
(University of Auckland, New Zealand; Victoria University of Wellington, New Zealand)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Improving Spectrum-Based Localization of Multiple Faults by Iterative Test Suite Reduction
Dylan Callaghan ORCID logo and Bernd Fischer ORCID logo
(Stellenbosch University, South Africa)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
Extracting Inline Tests from Unit Tests
Yu Liu ORCID logo, Pengyu Nie ORCID logo, Anna Guo ORCID logo, Milos GligoricORCID logo, and Owolabi Legunsen ORCID logo
(University of Texas at Austin, USA; Cornell University, USA)
Publisher's Version

Tool Demonstrations

DDLDroid: A Static Analyzer for Automatically Detecting Data Loss Issues in Android Applications
Yuhao Zhou ORCID logo and Wei Song ORCID logo
(Nanjing University of Science and Technology, China)
Publisher's Version
Behaviorally Typed State Machines in TypeScript for Heterogeneous Swarms
Roland KuhnORCID logo and Alan Darmasaputra ORCID logo
(Actyx, Germany)
Publisher's Version
ECSTATIC: Automatic Configuration-Aware Testing and Debugging of Static Analysis Tools
Austin MordahlORCID logo, Dakota Soles ORCID logo, Miao Miao ORCID logo, Zenong Zhang ORCID logo, and Shiyi Wei ORCID logo
(University of Texas at Dallas, USA)
Publisher's Version
RustSmith: Random Differential Compiler Testing for Rust
Mayank Sharma ORCID logo, Pingshi Yu ORCID logo, and Alastair F. DonaldsonORCID logo
(Imperial College London, UK)
Publisher's Version
KeenTune: Automated Tuning Tool for Cloud Application Performance Testing and Optimization
Qinglong Wang ORCID logo, Runzhe Wang ORCID logo, Yuxi Hu ORCID logo, Xiaohai Shi ORCID logo, Zheng Liu ORCID logo, Tao Ma ORCID logo, Houbing Song ORCID logo, and Heyuan Shi ORCID logo
(Alibaba Group, China; University of Maryland, Baltimore County, USA; Central South University, China)
Publisher's Version Video Info
KDAlloc: The KLEE Deterministic Allocator: Deterministic Memory Allocation during Symbolic Execution and Test Case Replay
Daniel Schemmel ORCID logo, Julian Büning ORCID logo, Frank Busse ORCID logo, Martin Nowack ORCID logo, and Cristian CadarORCID logo
(Imperial College London, UK; RWTH Aachen University, Germany)
Publisher's Version Info
EDHOC-Fuzzer: An EDHOC Protocol State Fuzzer
Konstantinos Sagonas ORCID logo and Thanasis Typaldos ORCID logo
(Uppsala University, Sweden; National Technical University of Athens, Greece)
Publisher's Version
MetaData262: Automatic Test Suite Selection for Partial JavaScript Implementations
Frederico Ramos ORCID logo, Diogo Costa Reis ORCID logo, Miguel Trigo ORCID logo, António Morgado ORCID logo, and José Fragoso Santos ORCID logo
(Instituto Superior Técnico, Portugal; University of Lleida, Spain; INESC-ID, Portugal)
Publisher's Version Published Artifact Artifacts Available
RobotBT: Behavior-Tree-Based Test-Case Specification for the Robot Framework
Sven Peldszus ORCID logo, Noubar Akopian ORCID logo, and Thorsten Berger ORCID logo
(Ruhr University Bochum, Germany; Chalmers, Sweden; University of Gothenburg, Sweden)
Publisher's Version Video
TreeLine and SlackLine: Grammar-Based Performance Fuzzing on Coffee Break
Ziyad Alsaeed ORCID logo and Michal Young ORCID logo
(Qassim University, Saudi Arabia; University of Oregon, USA)
Publisher's Version Video
Oven: Safe and Live Communication Protocols in Scala, using Synthetic Behavioural Type Analysis
Francisco Ferreira ORCID logo and Sung-Shik Jongmans ORCID logo
(Royal Holloway University of London, UK; Open University of the Netherlands, Netherlands; CWI, Netherlands)
Publisher's Version
SymRustC: A Hybrid Fuzzer for Rust
Frédéric Tuong ORCID logo, Mohammad Omidvar Tehrani ORCID logo, Marco Gaboardi ORCID logo, and Steven Y. Ko ORCID logo
(Simon Fraser University, Canada; Boston University, USA)
Publisher's Version
EvoSpex: A Search-Based Tool for Postcondition Inference
Facundo Molina ORCID logo, Pablo Ponzio ORCID logo, Nazareno AguirreORCID logo, and Marcelo F. Frias ORCID logo
(IMDEA Software Institute, Spain; University of Rio Cuarto, Argentina; CONICET, Argentina; University of Texas at El Paso, USA)
Publisher's Version Video Info
PExReport-Maven: Creating Pruned Executable Cross-Project Failure Reports in Maven Build System
Sunzhou Huang ORCID logo and Xiaoyin WangORCID logo
(University of Texas at San Antonio, USA)
Publisher's Version

Doctoral Symposium

Late PhD Students

Quantitative Robustness Analysis of Neural Networks
Mara Downing ORCID logo
(University of California at Santa Barbara, USA)
Publisher's Version
Automatic Testing and Benchmarking for Configurable Static Analysis Tools
Austin MordahlORCID logo
(University of Texas at Dallas, USA)
Publisher's Version
Type Automata
Ori Roth ORCID logo
(Technion, Israel)
Publisher's Version
Harnessing Large Language Models for Simulink Toolchain Testing and Developing Diverse Open-Source Corpora of Simulink Models for Metric and Evolution Analysis
Sohil Lal Shrestha ORCID logo
(University of Texas at Arlington, USA)
Publisher's Version

Early PhD Students

Fairness Testing for Recommender Systems
Huizhong Guo ORCID logo
(Zhejiang University, China)
Publisher's Version
Quantitative Symbolic Similarity Analysis
Laboni Sarker ORCID logo
(University of California at Santa Barbara, USA)
Publisher's Version
Reasoning about MLIR Semantics through Effects and Handlers
Pingshi Yu ORCID logo
(Imperial College London, UK)
Publisher's Version

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