ISSTA 2022
31st ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2022)
Powered by
Conference Publishing Consulting

31st ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2022), July 18–22, 2022, Virtual, South Korea

ISSTA 2022 – Proceedings

Contents - Abstracts - Authors

Frontmatter

Title Page
Message from the Chairs
ISSTA 2022 Organization
ISSTA 2022 Sponsors and Supporters

Technical Papers

Oracles, Models, and Measurement

jTrans: Jump-Aware Transformer for Binary Code Similarity Detection
Hao WangORCID logo, Wenjie Qu, Gilad Katz, Wenyu Zhu, Zeyu Gao, Han Qiu ORCID logo, Jianwei Zhuge, and Chao Zhang ORCID logo
(Tsinghua University, China; Beijing National Research Center for Information Science and Technology, China; Huazhong University of Science and Technology, China; Ben-Gurion University of the Negev, Israel; University of Science and Technology of China, China)
Publisher's Version Article Search
FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases
Gabin AnORCID logo and Shin YooORCID logo
(KAIST, South Korea)
Publisher's Version Article Search Artifacts Available Artifacts Functional
TeLL: Log Level Suggestions via Modeling Multi-level Code Block Information
Jiahao Liu, Jun Zeng, Xiang Wang, Kaihang Ji, and Zhenkai Liang
(National University of Singapore, Singapore; University of Science and Technology of China, China)
Publisher's Version Article Search
An Extensive Study on Pre-trained Models for Program Understanding and Generation
Zhengran Zeng, Hanzhuo Tan ORCID logo, Haotian Zhang, Jing Li, Yuqun Zhang, and Lingming Zhang ORCID logo
(Southern University of Science and Technology, China; Hong Kong Polytechnic University, China; Kwai, China; University of Illinois at Urbana-Champaign, USA)
Publisher's Version Article Search
Metamorphic Relations via Relaxations: An Approach to Obtain Oracles for Action-Policy Testing
Hasan Ferit Eniser ORCID logo, Timo P. Gros, Valentin WüstholzORCID logo, Jörg Hoffmann, and Maria ChristakisORCID logo
(MPI-SWS, Germany; Saarland University, Germany; ConsenSys, Germany; DFKI, Germany)
Publisher's Version Article Search
Hunting Bugs with Accelerated Optimal Graph Vertex Matching
Xiaohui Zhang ORCID logo, Yuanjun Gong ORCID logo, Bin Liang, Jianjun Huang ORCID logo, Wei You ORCID logo, Wenchang Shi ORCID logo, and Jian Zhang
(Renmin University of China, China; University of Chinese Academy of Sciences, China)
Publisher's Version Article Search
Using Pre-trained Language Models to Resolve Textual and Semantic Merge Conflicts (Experience Paper)
Jialu Zhang, Todd Mytkowicz, Mike Kaufman, Ruzica Piskac ORCID logo, and Shuvendu K. Lahiri
(Yale University, USA; Microsoft Research, USA; Microsoft, USA)
Publisher's Version Article Search
Combining Solution Reuse and Bound Tightening for Efficient Analysis of Evolving Systems
Clay StevensORCID logo and Hamid Bagheri ORCID logo
(University of Nebraska-Lincoln, USA)
Publisher's Version Article Search
On the Use of Evaluation Measures for Defect Prediction Studies
Rebecca Moussa ORCID logo and Federica SarroORCID logo
(University College London, UK)
Publisher's Version Article Search Info
Evolution-Aware Detection of Order-Dependent Flaky Tests
Chengpeng LiORCID logo and August ShiORCID logo
(University of Texas at Austin, USA)
Publisher's Version Article Search

Neural Networks, Learning, NLP

𝜀-Weakened Robustness of Deep Neural Networks
Pei Huang ORCID logo, Yuting YangORCID logo, Minghao Liu ORCID logo, Fuqi Jia ORCID logo, Feifei Ma, and Jian Zhang
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Publisher's Version Article Search Artifacts Available Artifacts Functional
Simple Techniques Work Surprisingly Well for Neural Network Test Prioritization and Active Learning (Replicability Study)
Michael WeissORCID logo and Paolo Tonella ORCID logo
(USI Lugano, Switzerland)
Publisher's Version Article Search Artifacts Available Artifacts Reusable
Improving Cross-Platform Binary Analysis using Representation Learning via Graph Alignment
Geunwoo Kim ORCID logo, Sanghyun Hong ORCID logo, Michael Franz, and Dokyung SongORCID logo
(University of California at Irvine, USA; Oregon State University, USA; Yonsei University, South Korea)
Publisher's Version Article Search Artifacts Available Artifacts Reusable
BET: Black-Box Efficient Testing for Convolutional Neural Networks
Jialai Wang ORCID logo, Han Qiu ORCID logo, Yi Rong ORCID logo, Hengkai Ye ORCID logo, Qi Li ORCID logo, Zongpeng Li ORCID logo, and Chao Zhang ORCID logo
(Tsinghua University, China; Beijing National Research Center for Information Science and Technology, China; Purdue University, USA)
Publisher's Version Article Search
DocTer: Documentation-Guided Fuzzing for Testing Deep Learning API Functions
Danning XieORCID logo, Yitong Li ORCID logo, Mijung KimORCID logo, Hung Viet PhamORCID logo, Lin TanORCID logo, Xiangyu Zhang, and Michael W. GodfreyORCID logo
(Purdue University, USA; University of Waterloo, Canada; Ulsan National Institute of Science and Technology, South Korea)
Publisher's Version Article Search
ASRTest: Automated Testing for Deep-Neural-Network-Driven Speech Recognition Systems
Pin Ji, Yang Feng ORCID logo, Jia Liu, Zhihong Zhao, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version Article Search
AEON: A Method for Automatic Evaluation of NLP Test Cases
Jen-tse HuangORCID logo, Jianping Zhang ORCID logo, Wenxuan Wang ORCID logo, Pinjia He ORCID logo, Yuxin Su ORCID logo, and Michael R. Lyu ORCID logo
(Chinese University of Hong Kong, China; Chinese University of Hong Kong at Shenzhen, China; Sun Yat-sen University, China)
Publisher's Version Article Search
Human-in-the-Loop Oracle Learning for Semantic Bugs in String Processing Programs
Charaka Geethal Kapugama ORCID logo, Van-Thuan PhamORCID logo, Aldeida Aleti ORCID logo, and Marcel BöhmeORCID logo
(Monash University, Australia; University of Melbourne, Australia; MPI-SP, Germany)
Publisher's Version Article Search Artifacts Available Artifacts Functional
HybridRepair: Towards Annotation-Efficient Repair for Deep Learning Models
Yu Li ORCID logo, Muxi Chen ORCID logo, and Qiang Xu ORCID logo
(Chinese University of Hong Kong, China)
Publisher's Version Article Search Artifacts Available
Cross-Lingual Transfer Learning for Statistical Type Inference
Zhiming Li, Xiaofei Xie, Haoliang Li, Zhengzi Xu, Yi LiORCID logo, and Yang Liu
(Nanyang Technological University, Singapore; Singapore Management University, Singapore; City University of Hong Kong, China)
Publisher's Version Article Search Artifacts Available

Test Generation and Mutation

Unicorn: Detect Runtime Errors in Time-Series Databases with Hybrid Input Synthesis
Zhiyong Wu ORCID logo, Jie Liang ORCID logo, Mingzhe Wang ORCID logo, Chijin Zhou ORCID logo, and Yu JiangORCID logo
(Tsinghua University, China; ShuimuYulin, China)
Publisher's Version Article Search
On the Use of Mutation Analysis for Evaluating Student Test Suite Quality
James Perretta, Andrew DeOrio, Arjun Guha ORCID logo, and Jonathan Bell ORCID logo
(Northeastern University, USA; University of Michigan, USA)
Publisher's Version Article Search Artifacts Available
Test Mimicry to Assess the Exploitability of Library Vulnerabilities
Hong Jin Kang ORCID logo, Truong Giang Nguyen ORCID logo, Bach Le ORCID logo, Corina S. Păsăreanu, and David LoORCID logo
(Singapore Management University, Singapore; University of Melbourne, Australia; Carnegie Mellon University, USA; NASA Ames Research Center, USA)
Publisher's Version Article Search
Automated Test Generation for REST APIs: No Time to Rest Yet
Myeongsoo KimORCID logo, Qi Xin ORCID logo, Saurabh Sinha ORCID logo, and Alessandro OrsoORCID logo
(Georgia Institute of Technology, USA; Wuhan University, China; IBM Research, USA)
Publisher's Version Article Search Info Artifacts Available Artifacts Functional
Finding Bugs in Gremlin-Based Graph Database Systems via Randomized Differential Testing
Yingying Zheng, Wensheng Dou, Yicheng Wang, Zheng Qin, Lei Tang, Yu Gao, Dong Wang, Wei Wang, and Jun Wei
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Publisher's Version Article Search Artifacts Available Artifacts Reusable
RegMiner: Towards Constructing a Large Regression Dataset from Code Evolution History
Xuezhi Song, Yun Lin, Siang Hwee Ng, Yijian Wu, Xin Peng, Jin Song Dong, and Hong Mei
(Fudan University, China; Shanghai Jiao Tong University, China; National University of Singapore, Singapore; Peking University, China)
Publisher's Version Article Search Info Artifacts Available Artifacts Functional
One Step Further: Evaluating Interpreters using Metamorphic Testing
Ming Fan ORCID logo, Jiali Wei, Wuxia Jin, Zhou Xu, Wenying Wei, and Ting Liu
(Xi'an Jiaotong University, China; Chongqing University, China)
Publisher's Version Article Search

Fuzzing and Friends

SnapFuzz: High-Throughput Fuzzing of Network Applications
Anastasios AndronidisORCID logo and Cristian CadarORCID logo
(Imperial College London, UK)
Publisher's Version Article Search Artifacts Available Artifacts Functional
Almost Correct Invariants: Synthesizing Inductive Invariants by Fuzzing Proofs
Sumit LahiriORCID logo and Subhajit RoyORCID logo
(IIT Kanpur, India)
Publisher's Version Article Search Info Artifacts Available Artifacts Reusable
SLIME: Program-Sensitive Energy Allocation for Fuzzing
Chenyang LyuORCID logo, Hong Liang ORCID logo, Shouling Ji ORCID logo, Xuhong ZhangORCID logo, Binbin Zhao ORCID logo, Meng Han ORCID logo, Yun Li ORCID logo, Zhe WangORCID logo, Wenhai Wang ORCID logo, and Raheem Beyah ORCID logo
(Zhejiang University, China; Georgia Institute of Technology, USA; Huawei Technologies, China; Institute of Computing Technology at Chinese Academy of Sciences, China)
Publisher's Version Article Search
MDPFuzz: Testing Models Solving Markov Decision Processes
Qi Pang ORCID logo, Yuanyuan Yuan ORCID logo, and Shuai Wang ORCID logo
(Hong Kong University of Science and Technology, China)
Publisher's Version Article Search Artifacts Available
TensileFuzz: Facilitating Seed Input Generation in Fuzzing via String Constraint Solving
Xuwei Liu, Wei You ORCID logo, Zhuo Zhang, and Xiangyu Zhang
(Purdue University, USA; Renmin University of China, China)
Publisher's Version Article Search
PrIntFuzz: Fuzzing Linux Drivers via Automated Virtual Device Simulation
Zheyu Ma ORCID logo, Bodong Zhao ORCID logo, Letu Ren ORCID logo, Zheming Li ORCID logo, Siqi Ma ORCID logo, Xiapu LuoORCID logo, and Chao Zhang ORCID logo
(Tsinghua University, China; Beijing National Research Center for Information Science and Technology, China; UNSW, Australia; Hong Kong Polytechnic University, China)
Publisher's Version Article Search
Efficient Greybox Fuzzing of Applications in Linux-Based IoT Devices via Enhanced User-Mode Emulation
Yaowen Zheng, Yuekang Li, Cen Zhang, Hongsong Zhu, Yang Liu, and Limin Sun
(Nanyang Technological University, Singapore; Institute of Information Engineering at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Publisher's Version Article Search Artifacts Available Artifacts Reusable

Concurrency, IoT, Embedded

Understanding Device Integration Bugs in Smart Home System
Tao Wang, Kangkang Zhang, Wei Chen, Wensheng Dou, Jiaxin Zhu, Jun Wei, and Tao Huang
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Nanjing Institute of Software Technology, China)
Publisher's Version Article Search Artifacts Available
A Large-Scale Empirical Analysis of the Vulnerabilities Introduced by Third-Party Components in IoT Firmware
Binbin Zhao ORCID logo, Shouling Ji ORCID logo, Jiacheng Xu ORCID logo, Yuan Tian ORCID logo, Qiuyang Wei ORCID logo, Qinying Wang ORCID logo, Chenyang LyuORCID logo, Xuhong ZhangORCID logo, Changting Lin ORCID logo, Jingzheng Wu ORCID logo, and Raheem Beyah ORCID logo
(Zhejiang University, China; Georgia Institute of Technology, USA; University of Virginia, USA; Institute of Software at Chinese Academy of Sciences, China)
Publisher's Version Article Search
Deadlock Prediction via Generalized Dependency
Jinpeng Zhou, Hanmei Yang, John Lange, and Tongping Liu
(University of Pittsburgh, USA; University of Massachusetts at Amherst, USA; Oak Ridge National Laboratory, USA)
Publisher's Version Article Search
Automated Testing of Image Captioning Systems
Boxi Yu ORCID logo, Zhiqing Zhong ORCID logo, Xinran Qin ORCID logo, Jiayi Yao ORCID logo, Yuancheng Wang ORCID logo, and Pinjia He ORCID logo
(Chinese University of Hong Kong at Shenzhen, China; South China University of Technology, China)
Publisher's Version Article Search Archive submitted (410 kB)
LiRTest: Augmenting LiDAR Point Clouds for Automated Testing of Autonomous Driving Systems
An Guo, Yang Feng ORCID logo, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version Article Search
Detecting Multi-sensor Fusion Errors in Advanced Driver-Assistance Systems
Ziyuan ZhongORCID logo, Zhisheng Hu ORCID logo, Shengjian Guo ORCID logo, Xinyang Zhang ORCID logo, Zhenyu Zhong ORCID logo, and Baishakhi RayORCID logo
(Columbia University, USA; Baidu Security, USA)
Publisher's Version Article Search Artifacts Available
Precise and Efficient Atomicity Violation Detection for Interrupt-Driven Programs via Staged Path Pruning
Chao Li ORCID logo, Rui Chen ORCID logo, Boxiang Wang ORCID logo, Tingting Yu ORCID logo, Dongdong Gao ORCID logo, and Mengfei Yang
(Beijing Institute of Control Engineering, China; Beijing Sunwise Information Technology, China; Xidian University, China; China Academy of Space Technology, China)
Publisher's Version Article Search

Static Analysis and Specifications Testing

Path-Sensitive Code Embedding via Contrastive Learning for Software Vulnerability Detection
Xiao Cheng ORCID logo, Guanqin Zhang, Haoyu Wang, and Yulei SuiORCID logo
(University of Technology Sydney, Australia; Huazhong University of Science and Technology, China)
Publisher's Version Article Search
A Large-Scale Study of Usability Criteria Addressed by Static Analysis Tools
Marcus Nachtigall, Michael SchlichtigORCID logo, and Eric BoddenORCID logo
(Paderborn University, Germany; Fraunhofer IEM, Germany)
Publisher's Version Article Search Archive submitted (36 kB)
An Empirical Study on the Effectiveness of Static C Code Analyzers for Vulnerability Detection
Stephan Lipp, Sebastian Banescu, and Alexander Pretschner ORCID logo
(TU Munich, Germany)
Publisher's Version Article Search Artifacts Available Artifacts Functional
Testing Dafny (Experience Paper)
Ahmed IrfanORCID logo, Sorawee Porncharoenwase ORCID logo, Zvonimir Rakamarić ORCID logo, Neha Rungta ORCID logo, and Emina Torlak ORCID logo
(Amazon Web Services, USA; University of Washington, USA)
Publisher's Version Article Search
Combining Static Analysis Error Traces with Dynamic Symbolic Execution (Experience Paper)
Frank Busse ORCID logo, Pritam Gharat ORCID logo, Cristian CadarORCID logo, and Alastair F. DonaldsonORCID logo
(Imperial College London, UK)
Publisher's Version Article Search Artifacts Available Artifacts Functional
The Raise of Machine Learning Hyperparameter Constraints in Python Code
Ingkarat Rak-amnouykit ORCID logo, Ana Milanova, Guillaume BaudartORCID logo, Martin Hirzel, and Julian Dolby
(Rensselaer Polytechnic Institute, USA; Inria, France; ENS-PSL University, France; IBM Research, USA)
Publisher's Version Article Search Artifacts Available Artifacts Functional

Android

PermDroid: Automatically Testing Permission-Related Behaviour of Android Applications
Shuaihao Yang, Zigang Zeng, and Wei Song ORCID logo
(Nanjing University of Science and Technology, China)
Publisher's Version Article Search Artifacts Available
Detecting and Fixing Data Loss Issues in Android Apps
Wunan Guo ORCID logo, Zhen Dong, Liwei Shen, Wei Tian, Ting Su ORCID logo, and Xin Peng
(Fudan University, China; East China Normal University, China)
Publisher's Version Article Search Artifacts Available Artifacts Reusable
Automatically Detecting API-Induced Compatibility Issues in Android Apps: A Comparative Analysis (Replicability Study)
Pei Liu, Yanjie Zhao, Haipeng CaiORCID logo, Mattia Fazzini, John Grundy ORCID logo, and Li Li ORCID logo
(Monash University, Australia; Washington State University, USA; University of Minnesota, USA)
Publisher's Version Article Search Artifacts Available Artifacts Functional
NCScope: Hardware-Assisted Analyzer for Native Code in Android Apps
Hao Zhou ORCID logo, Shuohan Wu, Xiapu LuoORCID logo, Ting Wang, Yajin Zhou, Chao Zhang ORCID logo, and Haipeng CaiORCID logo
(Hong Kong Polytechnic University, China; Pennsylvania State University, USA; Zhejiang University, China; Tsinghua University, China; Beijing National Research Center for Information Science and Technology, China; Washington State University, USA)
Publisher's Version Article Search Artifacts Available
Detecting Resource Utilization Bugs Induced by Variant Lifecycles in Android
Yifei Lu ORCID logo, Minxue PanORCID logo, Yu Pei ORCID logo, and Xuandong Li ORCID logo
(Nanjing University, China; Hong Kong Polytechnic University, China)
Publisher's Version Article Search Artifacts Available Artifacts Functional

Program Repair

Patch Correctness Assessment in Automated Program Repair Based on the Impact of Patches on Production and Test Code
Ali GhanbariORCID logo and Andrian MarcusORCID logo
(Iowa State University, USA; University of Texas at Dallas, USA)
Publisher's Version Article Search
ATR: Template-Based Repair for Alloy Specifications
Guolong Zheng, ThanhVu Nguyen, Simón Gutiérrez Brida, Germán Regis, Nazareno Aguirre, Marcelo F. Frias, and Hamid Bagheri ORCID logo
(University of Nebraska-Lincoln, USA; George Mason University, USA; University of Rio Cuarto, Argentina; CONICET, Argentina; Buenos Aires Institute of Technology, Argentina)
Publisher's Version Article Search
CIRCLE: Continual Repair across Programming Languages
Wei Yuan, Quanjun Zhang, Tieke He, Chunrong Fang ORCID logo, Nguyen Quoc Viet Hung, Xiaodong Hao, and Hongzhi Yin
(University of Queensland, Australia; Nanjing University, China; Griffith University, Australia)
Publisher's Version Article Search
Program Vulnerability Repair via Inductive Inference
Yuntong Zhang, Xiang Gao, Gregory J. Duck, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; Beihang University, China)
Publisher's Version Article Search Artifacts Available Artifacts Reusable

Smart Contracts

WASAI: Uncovering Vulnerabilities in Wasm Smart Contracts
Weimin Chen ORCID logo, Zihan Sun, Haoyu Wang, Xiapu LuoORCID logo, Haipeng CaiORCID logo, and Lei Wu
(Hong Kong Polytechnic University, China; Beijing University of Posts and Telecommunications, China; Huazhong University of Science and Technology, China; Washington State University, USA; Zhejiang University, China)
Publisher's Version Article Search Artifacts Available
Finding Permission Bugs in Smart Contracts with Role Mining
Ye Liu, Yi LiORCID logo, Shang-Wei Lin ORCID logo, and Cyrille Artho
(Nanyang Technological University, Singapore; KTH, Sweden)
Publisher's Version Article Search Info Artifacts Available Artifacts Reusable
eTainter: Detecting Gas-Related Vulnerabilities in Smart Contracts
Asem Ghaleb ORCID logo, Julia RubinORCID logo, and Karthik PattabiramanORCID logo
(University of British Columbia, Canada)
Publisher's Version Article Search Artifacts Available Artifacts Reusable
Park: Accelerating Smart Contract Vulnerability Detection via Parallel-Fork Symbolic Execution
Peilin Zheng ORCID logo, Zibin Zheng ORCID logo, and Xiapu LuoORCID logo
(Sun Yat-sen University, China; Hong Kong Polytechnic University, China)
Publisher's Version Article Search
SmartDagger: A Bytecode-Based Static Analysis Approach for Detecting Cross-Contract Vulnerability
Zeqin Liao ORCID logo, Zibin Zheng ORCID logo, Xiao Chen ORCID logo, and Yuhong Nan ORCID logo
(Sun Yat-sen University, China)
Publisher's Version Article Search

Tool Demos

ATUA: An Update-Driven App Testing Tool
Chanh-Duc Ngo ORCID logo, Fabrizio Pastore ORCID logo, and Lionel C. BriandORCID logo
(University of Luxembourg, Luxembourg; University of Ottawa, Canada)
Publisher's Version Article Search Video Info Artifacts Available
Automatic Generation of Smoke Test Suites for Kubernetes
Cecilio Cannavacciuolo and Leonardo Mariani ORCID logo
(Anoki, Italy; University of Milano-Bicocca, Italy)
Publisher's Version Article Search Video
ESBMC-CHERI: Towards Verification of C Programs for CHERI Platforms with ESBMC
Franz Brauße ORCID logo, Fedor Shmarov ORCID logo, Rafael Menezes ORCID logo, Mikhail R. Gadelha ORCID logo, Konstantin Korovin ORCID logo, Giles Reger ORCID logo, and Lucas C. Cordeiro ORCID logo
(University of Manchester, UK; Igalia, Brazil)
Publisher's Version Article Search Video
ESBMC-Jimple: Verifying Kotlin Programs via Jimple Intermediate Representation
Rafael Menezes ORCID logo, Daniel Moura ORCID logo, Helena Cavalcante ORCID logo, Rosiane de Freitas ORCID logo, and Lucas C. Cordeiro ORCID logo
(University of Manchester, UK; Federal University of Amazonas, Brazil)
Publisher's Version Article Search Video
Faster Mutation Analysis with MeMu
Ali GhanbariORCID logo and Andrian MarcusORCID logo
(Iowa State University, USA; University of Texas at Dallas, USA)
Publisher's Version Article Search
iFixDataloss: A Tool for Detecting and Fixing Data Loss Issues in Android Apps
Wunan Guo ORCID logo, Zhen Dong, Liwei Shen, Wei Tian, Ting Su ORCID logo, and Xin Peng
(Fudan University, China; East China Normal University, China)
Publisher's Version Article Search
Maestro: A Platform for Benchmarking Automatic Program Repair Tools on Software Vulnerabilities
Eduard Pinconschi ORCID logo, Quang-Cuong BuiORCID logo, Rui AbreuORCID logo, Pedro AdãoORCID logo, and Riccardo Scandariato ORCID logo
(INESC-ID, Portugal; University of Porto, Portugal; Hamburg University of Technology, Germany; IST-ULisboa, Portugal; Instituto de Telecomunicações, Portugal)
Publisher's Version Article Search Video
Pytest-Smell: A Smell Detection Tool for Python Unit Tests
Alexandru Bodea ORCID logo
(Babeș-Bolyai University, Romania)
Publisher's Version Article Search Video
QMutPy: A Mutation Testing Tool for Quantum Algorithms and Applications in Qiskit
Daniel Fortunato ORCID logo, José Campos ORCID logo, and Rui AbreuORCID logo
(University of Porto, Portugal; INESC-ID, Portugal; LASIGE, Portugal)
Publisher's Version Article Search Video
SpecChecker-ISA: A Data Sharing Analyzer for Interrupt-Driven Embedded Software
Boxiang Wang ORCID logo, Rui Chen ORCID logo, Chao Li ORCID logo, Tingting Yu ORCID logo, Dongdong Gao ORCID logo, and Mengfei Yang
(Xidian University, China; Beijing Sunwise Information Technology, China; Beijing Institute of Control Engineering, China; China Academy of Space Technology, China)
Publisher's Version Article Search
UniRLTest: Universal Platform-Independent Testing with Reinforcement Learning via Image Understanding
Ziqian Zhang, Yulei Liu, Shengcheng Yu ORCID logo, Xin Li, Yexiao Yun, Chunrong Fang ORCID logo, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version Article Search Info

proc time: 14.3