ISSTA 2022
31st ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2022)
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31st ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2022), July 18–22, 2022, Virtual, South Korea

ISSTA 2022 – Preliminary Table of Contents

Contents - Abstracts - Authors

Frontmatter

Title Page
Message from the Chairs
Committees
Sponsors

Accepted Papers

Unicorn: Detect Runtime Errors in Time-Series Databases with Hybrid Input Synthesis
Zhiyong Wu ORCID logo, Jie Liang ORCID logo, Mingzhe Wang ORCID logo, Chijin Zhou ORCID logo, and Yu JiangORCID logo
(Tsinghua University, China; ShuimuYulin, China)
Article Search
Understanding Device Integration Bugs in Smart Home System
Tao Wang, Kangkang Zhang, Wei Chen, Wensheng Dou, Jiaxin Zhu, Jun Wei, and Tao Huang
(Institute of Software at Chinese Academy of Sciences, China)
Article Search
A Large-Scale Empirical Analysis of the Vulnerabilities Introduced by Third-Party Components in IoT Firmware
Binbin Zhao ORCID logo, Shouling Ji ORCID logo, Jiacheng Xu ORCID logo, Yuan Tian ORCID logo, Qiuyang Wei ORCID logo, Qinying Wang ORCID logo, Chenyang LyuORCID logo, Xuhong ZhangORCID logo, Changting Lin ORCID logo, Jingzheng Wu ORCID logo, and Raheem Beyah ORCID logo
(Georgia Institute of Technology, USA; Zhejiang University, China; University of Virginia, USA; Institute of Software at Chinese Academy of Sciences, China)
Article Search
jTrans: Jump-Aware Transformer for Binary Code Similarity Detection
Hao WangORCID logo, Wenjie Qu, Gilad Katz, Wenyu Zhu, Zeyu Gao, Han Qiu ORCID logo, Jianwei Zhuge, and Chao Zhang ORCID logo
(Tsinghua University, China; Huazhong University of Science and Technology, China; Ben-Gurion University of the Negev, Israel; University of Science and Technology of China, China; Beijing National Research Center for Information Science and Technology, China)
Article Search
Patch Correctness Assessment in Automated Program Repair Based on the Impact of Patches on Production and Test Code
Ali GhanbariORCID logo and Andrian MarcusORCID logo
(Iowa State University, USA; University of Texas at Dallas, USA)
Preprint
ATR: Template-Based Repair for Alloy Specifications
Guolong Zheng, ThanhVu Nguyen, Simón Gutiérrez Brida, Germán Regis, Nazareno Aguirre, Marcelo F. Frias, and Hamid Bagheri ORCID logo
(University of Nebraska-Lincoln, USA; George Mason University, USA; University of Rio Cuarto, Argentina; CONICET, Argentina; Instituto Tecnológico de Buenos Aires, Argentina)
Article Search
FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases
Gabin AnORCID logo and Shin YooORCID logo
(KAIST, South Korea)
Article Search
Path-Sensitive Code Embedding via Contrastive Learning for Software Vulnerability Detection
Xiao Cheng ORCID logo, Guanqin Zhang, Haoyu Wang, and Yulei SuiORCID logo
(University of Technology Sydney, Australia; Huazhong University of Science and Technology, China)
Article Search
Finding Permission Bugs in Smart Contracts with Role Mining
Ye Liu, Yi LiORCID logo, Shang-Wei Lin, and Cyrille Artho
(Nanyang Technological University, Singapore; KTH, Sweden)
Article Search Info
$\varepsilon$-Weakened Robustness of Deep Neural Networks
Pei Huang, Yuting Yang, Minghao Liu, Fuqi Jia, Feifei Ma, and Jian Zhang
(Institute of Software at Chinese Academy of Sciences, China; Institute of Computing Technology at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China)
Article Search
A Large-Scale Study of Usability Criteria Addressed by Static Analysis Tools
Marcus Nachtigall, Michael SchlichtigORCID logo, and Eric BoddenORCID logo
(University of Paderborn, Germany; Fraunhofer IEM, Germany)
Article Search
Simple Techniques Work Surprisingly Well for Neural Network Test Prioritization and Active Learning (Replicability Study)
Michael WeissORCID logo and Paolo Tonella ORCID logo
(USI Lugano, Switzerland)
Article Search
SnapFuzz: High-Throughput Fuzzing of Network Applications
Anastasios Andronidis and Cristian Cadar
(Imperial College London, UK)
Article Search
Deadlock Prediction via Generalized Dependency
Jinpeng Zhou, Hanmei Yang, John Lange, and Tongping Liu
(University of Pittsburgh, USA; University of Massachusetts at Amherst, USA; Oak Ridge National Laboratory, USA)
Article Search
eTainter: Detecting Gas-Related Vulnerabilities in Smart Contracts
Asem Ghaleb ORCID logo, Julia RubinORCID logo, and Karthik Pattabiraman
(University of British Columbia, Canada)
Article Search
TELL: Log Level Suggestions via Modeling Multi-level Code Block Information
Jiahao Liu, Jun Zeng, Xiang Wang, Kaihang Ji, and Zhenkai Liang
(National University of Singapore, Singapore; University of Science and Technology of China, China)
Article Search
An Empirical Study on the Effectiveness of Static C Code Analyzers for Vulnerability Detection
Stephan Lipp, Sebastian Banescu, and Alexander Pretschner
(TU Munich, Germany)
Article Search
Almost Correct Invariants: Synthesizing Inductive Invariants by Fuzzing Proofs
Sumit LahiriORCID logo and Subhajit RoyORCID logo
(IIT Kanpur, India)
Article Search
Testing Dafny (Experience Paper)
Ahmed IrfanORCID logo, Sorawee Porncharoenwase ORCID logo, Zvonimir Rakamarić ORCID logo, Neha Rungta ORCID logo, and Emina Torlak ORCID logo
(Amazon Web Services, USA; University of Washington, USA)
Article Search
Improving Cross-Platform Binary Analysis using Representation Learning via Graph Alignment
Geunwoo Kim ORCID logo, Sanghyun Hong ORCID logo, Michael Franz, and Dokyung SongORCID logo
(University of California at Irvine, USA; Oregon State University, USA; Yonsei University, South Korea)
Article Search
Combining Static Analysis Error Traces with Dynamic Symbolic Execution (Experience Paper)
Frank Busse, Pritam Gharat, Cristian Cadar, and Alastair F. DonaldsonORCID logo
(Imperial College London, UK)
Article Search
SLIME: Program-Sensitive Energy Allocation for Fuzzing
Chenyang LyuORCID logo, Hong Liang ORCID logo, Shouling Ji ORCID logo, Xuhong ZhangORCID logo, Binbin Zhao ORCID logo, Meng Han ORCID logo, Yun Li ORCID logo, Zhe WangORCID logo, Wenhai Wang ORCID logo, and Raheem Beyah ORCID logo
(Zhejiang University, China; Georgia Institute of Technology, USA; Huawei Technologies, n.n.; Institute of Computing Technology at Chinese Academy of Sciences, China)
Article Search
BET: Black-Box Efficient Testing for Convolutional Neural Networks
Jialai Wang ORCID logo, Han Qiu ORCID logo, Yi Rong ORCID logo, Hengkai Ye ORCID logo, Qi Li ORCID logo, Zongpeng Li ORCID logo, and Chao Zhang ORCID logo
(Tsinghua University, China; Purdue University, USA; Beijing National Research Center for Information Science and Technology, China)
Article Search
Program Vulnerability Repair via Inductive Inference
Yuntong Zhang, Xiang Gao, Gregory J. Duck, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; Beihang University, China)
Article Search
MDPFuzz: Testing Models Solving Markov Decision Processes
Qi Pang ORCID logo, Yuanyuan Yuan ORCID logo, and Shuai Wang ORCID logo
(Hong Kong University of Science and Technology, China)
Article Search
Automated Testing of Image Captioning Systems
Boxi Yu ORCID logo, Zhiqing Zhong ORCID logo, Xinran Qin ORCID logo, Jiayi Yao ORCID logo, Yuancheng Wang ORCID logo, and Pinjia He ORCID logo
(Chinese University of Hong Kong, China; South China University of Technology, China)
Article Search Archive submitted (410 kB)
An Extensive Study on Pre-trained Models for Program Understanding and Generation
Zhengran Zeng, Hanzhuo Tan ORCID logo, Haotian Zhang, Jing Li, Yuqun Zhang, and Lingming Zhang ORCID logo
(Southern University of Science and Technology, China; Hong Kong Polytechnic University, China; Kwai, n.n.; University of Illinois at Urbana-Champaign, USA)
Article Search
ASRTest: Automated Testing for Deep-Neural-Network-Driven Speech Recognition Systems
Pin Ji, Yang Feng, Jia Liu, Zhihong Zhao, and Zhenyu Chen
(Nanjing University, China)
Article Search
Metamorphic Relations via Relaxations: An Approach to Obtain Oracles for Action-Policy Testing
Hasan Ferit Eniser, Timo P. Gros, Valentin Wüstholz, Jörg Hoffmann, and Maria Christakis
(MPI-SWS, Germany; Saarland University, Germany; ConsenSys, Germany; DFKI, Germany)
Article Search
Hunting Bugs with Accelerated Optimal Graph Vertex Matching
Xiaohui Zhang, Yuanjun Gong, Bin Liang, Jianjun Huang, Wei You, Wenchang Shi, and Jian Zhang
(Renmin University of China, China; Institute of Software at Chinese Academy of Sciences, China)
Article Search
AEON: A Method for Automatic Evaluation of NLP Test Cases
Jen-tse HuangORCID logo, Jianping Zhang ORCID logo, Wenxuan Wang ORCID logo, Pinjia He ORCID logo, Yuxin Su ORCID logo, and Michael R. Lyu ORCID logo
(Chinese University of Hong Kong, China; Sun Yat-sen University, China)
Article Search
Park: Accelerating Smart Contract Vulnerability Detection via Parallel-Fork Symbolic Execution
Peilin Zheng, Zibin Zheng, and Xiapu LuoORCID logo
(Sun Yat-sen University, China; Hong Kong Polytechnic University, China)
Article Search
Using Pre-trained Language Models to Resolve Textual and Semantic Merge Conflicts (Experience Paper)
Jialu Zhang, Todd Mytkowicz, Mike Kaufman, Ruzica Piskac ORCID logo, and Shuvendu K. Lahiri
(Yale University, USA; Microsoft Research, USA; Microsoft, USA)
Article Search
LiRTest: Augmenting LiDAR Point Clouds for Automated Testing of Autonomous Driving Systems
An Guo, Yang Feng, and Zhenyu Chen
(Nanjing University, China)
Article Search
Test Mimicry to Assess the Exploitability of Library Vulnerabilities
Hong Jin Kang, Truong Giang Nguyen, Bach Le, Corina S. Păsăreanu, and David LoORCID logo
(Singapore Management University, Singapore; University of Melbourne, Australia; Carnegie Mellon University, USA; NASA Ames Research Center, USA)
Article Search
Combining Solution Reuse and Bound Tightening for Efficient Analysis of Evolving Systems
Clay StevensORCID logo and Hamid Bagheri ORCID logo
(University of Nebraska-Lincoln, USA)
Article Search
The Raise of Machine Learning Hyperparameter Constraints in Python Code
Ingkarat Rak-amnouykit, Ana Milanova, Guillaume BaudartORCID logo, Martin Hirzel, and Julian Dolby
(Rensselaer Polytechnic Institute, USA; Inria, France; ENS-PSL University, France; IBM Research, USA)
Article Search
Automated Test Generation for REST APIs: No Time to Rest Yet
Myeongsoo Kim, Qi Xin, Saurabh Sinha, and Alessandro Orso
(Georgia Institute of Technology, USA; Wuhan University, China; IBM Research, USA)
Article Search
Detecting and Fixing Data Loss Issues in Android Apps
Wunan Guo, Zhen Dong, Liwei Shen, Wei Tian, Ting Su ORCID logo, and Xin Peng
(Fudan University, China; East China Normal University, China)
Article Search
TensileFuzz: Facilitating Seed Input Generation in Fuzzing via String Constraint Solving
Xuwei Liu, Wei You, Zhuo Zhang, and Xiangyu Zhang
(Purdue University, USA; Renmin University of China, China)
Article Search
Evolution-Aware Detection of Order-Dependent Flaky Tests
Chengpeng Li and August Shi
(University of Texas at Austin, USA)
Article Search
On the Use of Evaluation Measures for Defect Prediction Studies
Rebecca Moussa and Federica SarroORCID logo
(University College London, UK)
Article Search
Learning to Identify Semantic Bugs for String Processing Programs
Charaka Geethal Kapugama, Van-Thuan PhamORCID logo, Aldeida Aleti, and Marcel BöhmeORCID logo
(Monash University, Australia; University of Melbourne, Australia; MPI-SP, Germany)
Article Search
Automatically Detecting API-induced Compatibility Issues in Android Apps: A Comparative Analysis (Replicability Study)
Pei Liu, Yanjie Zhao, Haipeng CaiORCID logo, Mattia Fazzini, John Grundy ORCID logo, and Li Li
(Monash University, Australia; Washington State University at Pullman, USA; University of Minnesota, USA)
Article Search
HybridRepair: Towards Annotation-Efficient Repair for Deep Learning Models
Yu Li ORCID logo, Muxi Chen ORCID logo, and Qiang Xu ORCID logo
(Chinese University of Hong Kong, China)
Article Search
Finding Bugs in Gremlin-Based Graph Database Systems via Randomized Differential Testing
Yingying Zheng, Wensheng Dou, Yicheng Wang, Zheng Qin, Lei Tang, Yu Gao, Dong Wang, Wei Wang, and Jun Wei
(Institute of Software at Chinese Academy of Sciences, China)
Article Search
NCScope: Hardware-Assisted Analyzer for Native Code in Android Apps
Hao Zhou, Shuohan Wu, Xiapu LuoORCID logo, Ting Wang, Yajin Zhou, Chao Zhang ORCID logo, and Haipeng CaiORCID logo
(Hong Kong Polytechnic University, China; Pennsylvania State University, USA; Zhejiang University, China; Tsinghua University, China; Beijing National Research Center for Information Science and Technology, China; Washington State University, USA)
Article Search
Cross-Lingual Transfer Learning for Statistical Type Inference
Zhiming Li, Xiaofei Xie, Haoliang Li, Zhengzi Xu, Yi LiORCID logo, and Yang Liu
(Nanyang Technological University, Singapore; Singapore Management University, Singapore; City University of Hong Kong, China)
Article Search
Precise and Efficient Atomicity Violation Detection for Interrupt-Driven Programs via Staged Path Pruning
Chao Li ORCID logo, Rui Chen ORCID logo, Boxiang Wang ORCID logo, Tingting Yu ORCID logo, Dongdong Gao ORCID logo, and Mengfei Yang
(Beijing Institute of Control Engineering, China; Beijing Sunwise Information Technology, China; Xidian University, China; China Academy of Space Technology, China)
Article Search
Detecting Resource Utilization Bugs Induced by Variant Lifecycles in Android
Yifei Lu, Minxue PanORCID logo, Yu Pei, and Xuandong Li
(Nanjing University, China; Hong Kong Polytechnic University, China)
Article Search
Efficient Greybox Fuzzing of Applications in Linux-Based IoT Devices via Enhanced User-Mode Emulation
Yaowen Zheng, Yuekang Li, Cen Zhang, Hongsong Zhu, Yang Liu, and Limin Sun
(Nanyang Technological University, Singapore; Institute of Information Engineering at Chinese Academy of Sciences, China)
Article Search

Conditionally Accepted Papers

On the Use of Mutation Analysis for Evaluating Student Test Suite Quality
James Perretta, Andrew DeOrio, Arjun Guha, and Jonathan Bell
(Northeastern University, USA; University of Michigan, USA)
Article Search
WASAI: Uncovering Vulnerabilities in Wasm Smart Contracts
Weimin Chen, Zihan Sun, Haoyu Wang, Xiapu LuoORCID logo, Haipeng CaiORCID logo, and Lei Wu
(Hong Kong Polytechnic University, China; Beijing University of Posts and Telecommunications, China; Huazhong University of Science and Technology, China; Washington State University at Pullman, USA; Zhejiang University, China)
Article Search
CIRCLE: Continual Repair across Programming Languages
Wei Yuan, Quanjun Zhang, Tieke He, Chunrong Fang, Nguyen Quoc Viet Hung, Xiaodong Hao, and Hongzhi Yin
(University of Queensland, Australia; Nanjing University, China; Griffith University, Australia)
Article Search
DocTer: Extracting Constraints from Documentation to Test Deep Learning API Functions
Danning Xie, Yitong Li, Mijung Kim, Hung Viet Pham, Lin Tan, Xiangyu Zhang, and Michael W. Godfrey
(Purdue University, USA; University of Waterloo, Canada; Ulsan National Institute of Science and Technology, South Korea)
Article Search
PermDroid: Automatically Testing Permission-Related Behaviour of Android Applications
Shuaihao Yang, Zigang Zeng, and Wei Song ORCID logo
(Nanjing University of Science and Technology, China)
Article Search
SmartDagger: A Bytecode-Based Static Analysis Approach for Detecting Cross-Contract Vulnerability
Zeqin Liao ORCID logo, Zibin Zheng, Xiao Chen, and Yuhong Nan ORCID logo
(Sun Yat-sen University, China)
Article Search
Detecting Multi-sensor Fusion Errors in Advanced Driver-Assistance Systems
Ziyuan ZhongORCID logo, Zhisheng Hu ORCID logo, Shengjian Guo ORCID logo, Xinyang Zhang ORCID logo, Zhenyu Zhong ORCID logo, and Baishakhi RayORCID logo
(Columbia University, USA; Baidu Security, USA)
Preprint
RegMiner: Towards Constructing a Large Regression Dataset from Code Evolution History
Xuezhi Song, Yun Lin, Siang Hwee Ng, Yijian Wu, Xin Peng, Jin Song Dong, and Hong Mei
(Fudan University, China; National University of Singapore, Singapore; Peking University, China)
Article Search
One Step Further: Evaluating Interpreters using Metamorphic Testing
Ming Fan ORCID logo, JiaLi Wei, WuXia Jin, Zhou Xu, Wenying Wei, and Ting Liu
(Xi'an Jiaotong University, China; Chongqing University, China)
Article Search
PrIntFuzz: Fuzzing Linux Drivers via Automated Virtual Device Simulation
Zheyu Ma ORCID logo, Bodong Zhao ORCID logo, Letu Ren ORCID logo, Zheming Li ORCID logo, Siqi Ma ORCID logo, Xiapu LuoORCID logo, and Chao Zhang ORCID logo
(Tsinghua University, China; UNSW, Australia; Hong Kong Polytechnic University, China; Beijing National Research Center for Information Science and Technology, China)
Article Search

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