ISSTA 2021
30th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2021)
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30th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2021), July 11–17, 2021, Virtual, Denmark

ISSTA 2021 – Proceedings

Contents - Abstracts - Authors

Frontmatter

Title Page
Welcome from the Chairs
ISSTA 2021 Organization
ISSTA 2021 Sponsors and Supporters

Invited Presentation

Automated Debugging: Past, Present, and Future (ISSTA Impact Paper Award)
Chris Parnin and Alessandro Orso
(North Carolina State University, USA; Georgia Institute of Technology, USA)
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Technical Papers

Web Applications

Identifying Privacy Weaknesses from Multi-party Trigger-Action Integration Platforms
Kulani Mahadewa, Yanjun Zhang, Guangdong Bai, Lei Bu, Zhiqiang ZuoORCID logo, Dileepa Fernando, Zhenkai Liang, and Jin Song Dong
(National University of Singapore, Singapore; University of Queensland, Australia; Nanjing University, China; Sri Lanka Technological Campus, Sri Lanka)
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WebEvo: Taming Web Application Evolution via Detecting Semantic Structure Changes
Fei Shao, Rui Xu, Wasif Haque, Jingwei Xu, Ying Zhang, Wei YangORCID logo, Yanfang Ye, and Xusheng XiaoORCID logo
(Case Western Reserve University, USA; University of Texas at Dallas, USA; Peking University, China)
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Modular Call Graph Construction for Security Scanning of Node.js Applications
Benjamin Barslev Nielsen, Martin Toldam Torp, and Anders MøllerORCID logo
(Aarhus University, Denmark)
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Testing Deep Learning Systems

Attack as Defense: Characterizing Adversarial Examples using Robustness
Zhe Zhao, Guangke Chen, Jingyi Wang, Yiwei YangORCID logo, Fu Song, and Jun SunORCID logo
(ShanghaiTech University, China; Zhejiang University, China; Singapore Management University, Singapore)
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Exposing Previously Undetectable Faults in Deep Neural Networks
Isaac DunnORCID logo, Hadrien PougetORCID logo, Daniel KroeningORCID logo, and Tom MelhamORCID logo
(University of Oxford, UK; Amazon, UK)
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DeepCrime: Mutation Testing of Deep Learning Systems Based on Real Faults
Nargiz Humbatova ORCID logo, Gunel Jahangirova ORCID logo, and Paolo Tonella ORCID logo
(USI Lugano, Switzerland)
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DeepHyperion: Exploring the Feature Space of Deep Learning-Based Systems through Illumination Search
Tahereh Zohdinasab ORCID logo, Vincenzo Riccio ORCID logo, Alessio Gambi, and Paolo Tonella ORCID logo
(USI Lugano, Switzerland; University of Passau, Germany)
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Automatic Test Suite Generation for Key-Points Detection DNNs using Many-Objective Search (Experience Paper)
Fitash Ul HaqORCID logo, Donghwan ShinORCID logo, Lionel C. BriandORCID logo, Thomas Stifter, and Jun Wang ORCID logo
(University of Luxembourg, Luxembourg; University of Ottawa, Canada; IEE, Luxembourg; Post Luxembourg, Luxembourg)
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Efficient White-Box Fairness Testing through Gradient Search
Lingfeng Zhang ORCID logo, Yueling Zhang ORCID logo, and Min Zhang ORCID logo
(East China Normal University, China; Singapore Management University, Singapore)
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DialTest: Automated Testing for Recurrent-Neural-Network-Driven Dialogue Systems
Zixi Liu, Yang Feng, and Zhenyu Chen
(Nanjing University, China)
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AdvDoor: Adversarial Backdoor Attack of Deep Learning System
Quan Zhang ORCID logo, Yifeng Ding, Yongqiang TianORCID logo, Jianmin Guo, Min Yuan, and Yu JiangORCID logo
(Tsinghua University, China; University of Waterloo, Canada; WeBank, China)
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ModelDiff: Testing-Based DNN Similarity Comparison for Model Reuse Detection
Yuanchun Li, Ziqi Zhang, Bingyan Liu, Ziyue Yang, and Yunxin Liu
(Microsoft Research, China; Peking University, China; Tsinghua University, China)
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Android Application Analysis and Testing

Parema: An Unpacking Framework for Demystifying VM-Based Android Packers
Lei Xue, Yuxiao Yan, Luyi Yan, Muhui Jiang, Xiapu Luo, Dinghao Wu, and Yajin Zhou
(Hong Kong Polytechnic University, China; Xi'an Jiaotong University, China; Pennsylvania State University, USA; Zhejiang University, China)
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An Infrastructure Approach to Improving Effectiveness of Android UI Testing Tools
Wenyu Wang ORCID logo, Wing Lam, and Tao Xie ORCID logo
(University of Illinois at Urbana-Champaign, USA; Peking University, China)
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Semantic Matching of GUI Events for Test Reuse: Are We There Yet?
Leonardo Mariani ORCID logo, Ali Mohebbi, Mauro PezzèORCID logo, and Valerio Terragni
(University of Milano-Bicocca, Italy; USI Lugano, Switzerland; Schaffhausen Institute of Technology, Switzerland; University of Auckland, New Zealand)
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GUIDER: GUI Structure and Vision Co-guided Test Script Repair for Android Apps
Tongtong Xu, Minxue PanORCID logo, Yu Pei, Guiyin Li, Xia Zeng, Tian Zhang, Yuetang Deng, and Xuandong Li
(Nanjing University, China; Hong Kong Polytechnic University, China; Tencent, China)
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Understanding and Finding System Setting-Related Defects in Android Apps
Jingling Sun ORCID logo, Ting Su ORCID logo, Junxin Li ORCID logo, Zhen Dong, Geguang Pu, Tao Xie ORCID logo, and Zhendong Su
(East China Normal University, China; National University of Singapore, Singapore; Peking University, China; ETH Zurich, Switzerland)
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HomDroid: Detecting Android Covert Malware by Social-Network Homophily Analysis
Yueming Wu, Deqing Zou, Wei YangORCID logo, Xiang Li, and Hai Jin
(Huazhong University of Science and Technology, China; University of Texas at Dallas, USA)
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Fuzzing

Seed Selection for Successful Fuzzing
Adrian Herrera ORCID logo, Hendra Gunadi, Shane Magrath, Michael Norrish ORCID logo, Mathias Payer ORCID logo, and Antony L. Hosking ORCID logo
(Australian National University, Australia; DST, Australia; CSIRO’s Data61, Australia; EPFL, Switzerland)
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Gramatron: Effective Grammar-Aware Fuzzing
Prashast Srivastava and Mathias Payer ORCID logo
(Purdue University, USA; EPFL, Switzerland)
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QFuzz: Quantitative Fuzzing for Side Channels
Yannic NollerORCID logo and Saeid Tizpaz-NiariORCID logo
(National University of Singapore, Singapore; University of Texas at El Paso, USA)
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Data Processing Application Analysis

SAND: A Static Analysis Approach for Detecting SQL Antipatterns
Yingjun Lyu ORCID logo, Sasha Volokh ORCID logo, William G. J. HalfondORCID logo, and Omer Tripp ORCID logo
(Amazon, USA; University of Southern California, USA)
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Semantic Table Structure Identification in Spreadsheets
Yakun Zhang, Xiao Lv, Haoyu Dong, Wensheng Dou, Shi Han, Dongmei Zhang ORCID logo, Jun Wei, and Dan Ye
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Microsoft Research, China)
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Dynamic Analysis

Runtime Detection of Memory Errors with Smart Status
Zhe Chen, Chong Wang, Junqi Yan, Yulei Sui, and Jingling Xue
(Nanjing University of Aeronautics and Astronautics, China; University of Technology Sydney, Australia; UNSW, Australia)
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UAFSan: An Object-Identifier-Based Dynamic Approach for Detecting Use-After-Free Vulnerabilities
Binfa Gui ORCID logo, Wei Song ORCID logo, and Jeff Huang ORCID logo
(Nanjing University of Science and Technology, China; Texas A&M University, USA)
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Symbolic Execution

Fuzzing SMT Solvers via Two-Dimensional Input Space Exploration
Peisen Yao ORCID logo, Heqing Huang, Wensheng Tang, Qingkai Shi, Rongxin Wu, and Charles Zhang
(Hong Kong University of Science and Technology, China; Xiamen University, China)
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Boosting Symbolic Execution via Constraint Solving Time Prediction (Experience Paper)
Sicheng Luo, Hui Xu, Yanxiang Bi, Xin Wang, and Yangfan Zhou
(Fudan University, China)
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Synthesize Solving Strategy for Symbolic Execution
Zhenbang Chen, Zehua Chen, Ziqi Shuai, Guofeng Zhang, Weiyu Pan, Yufeng Zhang, and Ji Wang
(National University of Defense Technology, China; Hunan University, China)
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Type and Interval Aware Array Constraint Solving for Symbolic Execution
Ziqi Shuai, Zhenbang Chen, Yufeng Zhang, Jun SunORCID logo, and Ji Wang
(National University of Defense Technology, China; Hunan University, China; Singapore Management University, Singapore)
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Grammar-Agnostic Symbolic Execution by Token Symbolization
Weiyu Pan, Zhenbang Chen, Guofeng Zhang, Yunlai Luo, Yufeng Zhang, and Ji Wang
(National University of Defense Technology, China; Hunan University, China)
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Machine Learning and Testing

Interval Constraint-Based Mutation Testing of Numerical Specifications
Clothilde Jeangoudoux, Eva Darulova ORCID logo, and Christoph Lauter
(MPI-SWS, Germany; University of Alaska at Anchorage, USA)
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Predoo: Precision Testing of Deep Learning Operators
Xufan Zhang, Ning Sun, Chunrong Fang, Jiawei Liu, Jia Liu, Dong Chai, Jiang Wang, and Zhenyu Chen
(Nanjing University, China; Huawei, China)
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TERA: Optimizing Stochastic Regression Tests in Machine Learning Projects
Saikat Dutta, Jeeva Selvam, Aryaman Jain, and Sasa Misailovic
(University of Illinois at Urbana-Champaign, USA)
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Deep Just-in-Time Defect Prediction: How Far Are We?
Zhengran Zeng, Yuqun Zhang, Haotian Zhang, and Lingming Zhang ORCID logo
(Southern University of Science and Technology, China; Kwai, China; University of Illinois at Urbana-Champaign, USA)
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Configuration and Dependency

Fixing Dependency Errors for Python Build Reproducibility
Suchita Mukherjee, Abigail Almanza, and Cindy Rubio-González
(University of California at Davis, USA)
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Test-Case Prioritization for Configuration Testing
Runxiang Cheng ORCID logo, Lingming Zhang ORCID logo, Darko MarinovORCID logo, and Tianyin Xu ORCID logo
(University of Illinois at Urbana-Champaign, USA)
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The Impact of Tool Configuration Spaces on the Evaluation of Configurable Taint Analysis for Android
Austin MordahlORCID logo and Shiyi Wei
(University of Texas at Dallas, USA)
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Challenges and Opportunities: An In-Depth Empirical Study on Configuration Error Injection Testing
Wang Li, Zhouyang Jia, Shanshan Li, Yuanliang Zhang, Teng Wang, Erci Xu, Ji Wang, and Xiangke Liao
(National University of Defense Technology, China)
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Testing

Empirically Evaluating Readily Available Information for Regression Test Optimization in Continuous Integration
Daniel Elsner, Florian Hauer, Alexander Pretschner, and Silke Reimer
(TU Munich, Germany; IVU Traffic Technologies, Germany)
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Toward Optimal MC/DC Test Case Generation
Sangharatna GodboleyORCID logo, Joxan JaffarORCID logo, Rasool MagharehORCID logo, and Arpita DuttaORCID logo
(National Institute of Technology Warangal, India; National University of Singapore, Singapore; Huawei, Canada)
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Log-Based Slicing for System-Level Test Cases
Salma Messaoudi ORCID logo, Donghwan ShinORCID logo, Annibale Panichella ORCID logo, Domenico BianculliORCID logo, and Lionel C. BriandORCID logo
(University of Luxembourg, Luxembourg; Delft University of Technology, Netherlands; University of Ottawa, Canada)
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Model-Based Testing of Networked Applications
Yishuai LiORCID logo, Benjamin C. PierceORCID logo, and Steve ZdancewicORCID logo
(University of Pennsylvania, USA)
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Validating Static Warnings via Testing Code Fragments
Ashwin Kallingal Joshy ORCID logo, Xueyuan Chen, Benjamin Steenhoek, and Wei Le ORCID logo
(Iowa State University, USA)
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Continuous Test Suite Failure Prediction
Cong Pan ORCID logo and Michael PradelORCID logo
(Beihang University, China; University of Stuttgart, Germany)
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Empirical Evaluation of Smart Contract Testing: What Is the Best Choice?
Meng Ren, Zijing Yin, Fuchen Ma, Zhenyang Xu, Yu JiangORCID logo, Chengnian Sun, Huizhong Li, and Yan Cai
(Tsinghua University, China; University of Waterloo, Canada; WeBank, China; Institute of Software at Chinese Academy of Sciences, China)
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Binary Analysis

iDEV: Exploring and Exploiting Semantic Deviations in ARM Instruction Processing
Shisong Qin, Chao Zhang, Kaixiang Chen, and Zheming Li
(Tsinghua University, China)
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RAProducer: Efficiently Diagnose and Reproduce Data Race Bugs for Binaries via Trace Analysis
Ming Yuan, Yeseop Lee, Chao Zhang, Yun Li, Yan Cai, and Bodong Zhao
(Tsinghua University, China; Institute of Software at Chinese Academy of Sciences, China)
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A Lightweight Framework for Function Name Reassignment Based on Large-Scale Stripped Binaries
Han Gao ORCID logo, Shaoyin Cheng, Yinxing Xue, and Weiming Zhang ORCID logo
(University of Science and Technology of China, China)
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Bugs and Analysis

Finding Data Compatibility Bugs with JSON Subschema Checking
Andrew Habib ORCID logo, Avraham Shinnar, Martin Hirzel, and Michael PradelORCID logo
(University of Luxembourg, Luxembourg; IBM Research, USA; University of Stuttgart, Germany)
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Automated Patch Backporting in Linux (Experience Paper)
Ridwan ShariffdeenORCID logo, Xiang Gao, Gregory J. Duck, Shin Hwei TanORCID logo, Julia Lawall, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; Southern University of Science and Technology, China; Inria, France)
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Faster, Deeper, Easier: Crowdsourcing Diagnosis of Microservice Kernel Failure from User Space
Yicheng Pan, Meng Ma, Xinrui Jiang, and Ping Wang
(Peking University, China)
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Demo Papers

echidna-parade: A Tool for Diverse Multicore Smart Contract Fuzzing
Alex Groce and Gustavo Grieco
(Northern Arizona University, USA; Trail of Bits, USA)
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ProFuzzBench: A Benchmark for Stateful Protocol Fuzzing
Roberto NatellaORCID logo and Van-Thuan PhamORCID logo
(Federico II University of Naples, Italy; University of Melbourne, Australia)
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SCStudio: A Secure and Efficient Integrated Development Environment for Smart Contracts
Meng Ren, Fuchen Ma, Zijing Yin, Huizhong Li, Ying Fu, Ting Chen, and Yu JiangORCID logo
(Tsinghua University, China; WeBank, China; Ant Financial, China; University of Electronic Science and Technology of China, China)
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C4: The C Compiler Concurrency Checker
Matt Windsor ORCID logo, Alastair F. DonaldsonORCID logo, and John Wickerson ORCID logo
(University of York, UK; Imperial College London, UK)
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TauMed: Test Augmentation of Deep Learning in Medical Diagnosis
Yunhan Hou, Jiawei Liu, Daiwei Wang, Jiawei He, Chunrong Fang, and Zhenyu Chen
(Nanjing University, China)
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MoScan: A Model-Based Vulnerability Scanner for Web Single Sign-On Services
Hanlin Wei, Behnaz Hassanshahi, Guangdong Bai, Padmanabhan Krishnan ORCID logo, and Kostyantyn Vorobyov ORCID logo
(University of Queensland, Australia; Oracle, Australia)
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RESTest: Automated Black-Box Testing of RESTful Web APIs
Alberto Martin-Lopez ORCID logo, Sergio Segura ORCID logo, and Antonio Ruiz-Cortés ORCID logo
(University of Seville, Spain)
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