ISSTA 2021
30th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2021)
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30th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2021), July 11–17, 2021, Virtual, Denmark

ISSTA 2021 – Proceedings

Contents - Abstracts - Authors

Frontmatter

Title Page
Welcome from the Chairs
ISSTA 2021 Organization
ISSTA 2021 Sponsors and Supporters

Invited Presentation

Automated Debugging: Past, Present, and Future (ISSTA Impact Paper Award)
Chris ParninORCID logo and Alessandro OrsoORCID logo
(North Carolina State University, USA; Georgia Institute of Technology, USA)
Publisher's Version

Technical Papers

Web Applications

Identifying Privacy Weaknesses from Multi-party Trigger-Action Integration Platforms
Kulani Mahadewa, Yanjun Zhang, Guangdong Bai ORCID logo, Lei Bu ORCID logo, Zhiqiang ZuoORCID logo, Dileepa Fernando, Zhenkai Liang, and Jin Song Dong ORCID logo
(National University of Singapore, Singapore; University of Queensland, Australia; Nanjing University, China; Sri Lanka Technological Campus, Sri Lanka)
Publisher's Version
WebEvo: Taming Web Application Evolution via Detecting Semantic Structure Changes
Fei Shao, Rui Xu, Wasif Haque, Jingwei Xu, Ying Zhang, Wei YangORCID logo, Yanfang Ye, and Xusheng XiaoORCID logo
(Case Western Reserve University, USA; University of Texas at Dallas, USA; Peking University, China)
Publisher's Version Video Info
Modular Call Graph Construction for Security Scanning of Node.js Applications
Benjamin Barslev Nielsen, Martin Toldam Torp, and Anders MøllerORCID logo
(Aarhus University, Denmark)
Publisher's Version

Testing Deep Learning Systems

Attack as Defense: Characterizing Adversarial Examples using Robustness
Zhe Zhao, Guangke Chen, Jingyi Wang ORCID logo, Yiwei YangORCID logo, Fu Song ORCID logo, and Jun SunORCID logo
(ShanghaiTech University, China; Zhejiang University, China; Singapore Management University, Singapore)
Publisher's Version
Exposing Previously Undetectable Faults in Deep Neural Networks
Isaac DunnORCID logo, Hadrien PougetORCID logo, Daniel KroeningORCID logo, and Tom MelhamORCID logo
(University of Oxford, UK; Amazon, UK)
Publisher's Version Artifacts Functional
DeepCrime: Mutation Testing of Deep Learning Systems Based on Real Faults
Nargiz Humbatova ORCID logo, Gunel Jahangirova ORCID logo, and Paolo Tonella ORCID logo
(USI Lugano, Switzerland)
Publisher's Version Artifacts Reusable
DeepHyperion: Exploring the Feature Space of Deep Learning-Based Systems through Illumination Search
Tahereh Zohdinasab ORCID logo, Vincenzo Riccio ORCID logo, Alessio Gambi, and Paolo Tonella ORCID logo
(USI Lugano, Switzerland; University of Passau, Germany)
Publisher's Version Artifacts Reusable
Automatic Test Suite Generation for Key-Points Detection DNNs using Many-Objective Search (Experience Paper)
Fitash Ul HaqORCID logo, Donghwan ShinORCID logo, Lionel C. BriandORCID logo, Thomas Stifter, and Jun Wang ORCID logo
(University of Luxembourg, Luxembourg; University of Ottawa, Canada; IEE, Luxembourg; Post Luxembourg, Luxembourg)
Publisher's Version
Efficient White-Box Fairness Testing through Gradient Search
Lingfeng Zhang ORCID logo, Yueling Zhang ORCID logo, and Min Zhang ORCID logo
(East China Normal University, China; Singapore Management University, Singapore)
Publisher's Version
DialTest: Automated Testing for Recurrent-Neural-Network-Driven Dialogue Systems
Zixi Liu ORCID logo, Yang Feng ORCID logo, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version
AdvDoor: Adversarial Backdoor Attack of Deep Learning System
Quan Zhang ORCID logo, Yifeng Ding, Yongqiang TianORCID logo, Jianmin Guo, Min Yuan, and Yu JiangORCID logo
(Tsinghua University, China; University of Waterloo, Canada; WeBank, China)
Publisher's Version Info
ModelDiff: Testing-Based DNN Similarity Comparison for Model Reuse Detection
Yuanchun Li, Ziqi Zhang ORCID logo, Bingyan Liu, Ziyue Yang, and Yunxin Liu
(Microsoft Research, China; Peking University, China; Tsinghua University, China)
Publisher's Version

Android Application Analysis and Testing

Parema: An Unpacking Framework for Demystifying VM-Based Android Packers
Lei Xue, Yuxiao Yan, Luyi Yan, Muhui Jiang, Xiapu LuoORCID logo, Dinghao Wu, and Yajin Zhou ORCID logo
(Hong Kong Polytechnic University, China; Xi'an Jiaotong University, China; Pennsylvania State University, USA; Zhejiang University, China)
Publisher's Version
An Infrastructure Approach to Improving Effectiveness of Android UI Testing Tools
Wenyu Wang ORCID logo, Wing Lam, and Tao Xie ORCID logo
(University of Illinois at Urbana-Champaign, USA; Peking University, China)
Publisher's Version
Semantic Matching of GUI Events for Test Reuse: Are We There Yet?
Leonardo Mariani ORCID logo, Ali Mohebbi, Mauro PezzèORCID logo, and Valerio Terragni
(University of Milano-Bicocca, Italy; USI Lugano, Switzerland; Schaffhausen Institute of Technology, Switzerland; University of Auckland, New Zealand)
Publisher's Version
GUIDER: GUI Structure and Vision Co-guided Test Script Repair for Android Apps
Tongtong Xu, Minxue PanORCID logo, Yu Pei ORCID logo, Guiyin Li, Xia Zeng, Tian Zhang ORCID logo, Yuetang Deng ORCID logo, and Xuandong Li ORCID logo
(Nanjing University, China; Hong Kong Polytechnic University, China; Tencent, China)
Publisher's Version
Understanding and Finding System Setting-Related Defects in Android Apps
Jingling Sun ORCID logo, Ting Su ORCID logo, Junxin Li ORCID logo, Zhen Dong, Geguang Pu ORCID logo, Tao Xie ORCID logo, and Zhendong Su ORCID logo
(East China Normal University, China; National University of Singapore, Singapore; Peking University, China; ETH Zurich, Switzerland)
Publisher's Version Artifacts Reusable
HomDroid: Detecting Android Covert Malware by Social-Network Homophily Analysis
Yueming Wu, Deqing Zou ORCID logo, Wei YangORCID logo, Xiang Li, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; University of Texas at Dallas, USA)
Publisher's Version

Fuzzing

Seed Selection for Successful Fuzzing
Adrian Herrera ORCID logo, Hendra Gunadi, Shane Magrath, Michael Norrish ORCID logo, Mathias Payer ORCID logo, and Antony L. Hosking ORCID logo
(Australian National University, Australia; DST, Australia; CSIRO’s Data61, Australia; EPFL, Switzerland)
Publisher's Version
Gramatron: Effective Grammar-Aware Fuzzing
Prashast Srivastava ORCID logo and Mathias Payer ORCID logo
(Purdue University, USA; EPFL, Switzerland)
Publisher's Version Artifacts Reusable
QFuzz: Quantitative Fuzzing for Side Channels
Yannic NollerORCID logo and Saeid Tizpaz-NiariORCID logo
(National University of Singapore, Singapore; University of Texas at El Paso, USA)
Publisher's Version Artifacts Reusable

Data Processing Application Analysis

SAND: A Static Analysis Approach for Detecting SQL Antipatterns
Yingjun Lyu ORCID logo, Sasha Volokh ORCID logo, William G. J. HalfondORCID logo, and Omer Tripp ORCID logo
(Amazon, USA; University of Southern California, USA)
Publisher's Version
Semantic Table Structure Identification in Spreadsheets
Yakun Zhang, Xiao Lv, Haoyu Dong, Wensheng Dou, Shi Han ORCID logo, Dongmei Zhang ORCID logo, Jun Wei ORCID logo, and Dan Ye ORCID logo
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Microsoft Research, China)
Publisher's Version

Dynamic Analysis

Runtime Detection of Memory Errors with Smart Status
Zhe Chen ORCID logo, Chong Wang, Junqi Yan, Yulei Sui, and Jingling Xue ORCID logo
(Nanjing University of Aeronautics and Astronautics, China; University of Technology Sydney, Australia; UNSW, Australia)
Publisher's Version Artifacts Functional
UAFSan: An Object-Identifier-Based Dynamic Approach for Detecting Use-After-Free Vulnerabilities
Binfa Gui ORCID logo, Wei Song ORCID logo, and Jeff Huang ORCID logo
(Nanjing University of Science and Technology, China; Texas A&M University, USA)
Publisher's Version

Symbolic Execution

Fuzzing SMT Solvers via Two-Dimensional Input Space Exploration
Peisen YaoORCID logo, Heqing Huang, Wensheng Tang ORCID logo, Qingkai Shi, Rongxin Wu ORCID logo, and Charles ZhangORCID logo
(Hong Kong University of Science and Technology, China; Xiamen University, China)
Publisher's Version
Boosting Symbolic Execution via Constraint Solving Time Prediction (Experience Paper)
Sicheng Luo, Hui Xu ORCID logo, Yanxiang Bi, Xin Wang, and Yangfan Zhou ORCID logo
(Fudan University, China)
Publisher's Version Artifacts Reusable
Synthesize Solving Strategy for Symbolic Execution
Zhenbang ChenORCID logo, Zehua Chen, Ziqi Shuai, Guofeng Zhang, Weiyu Pan, Yufeng Zhang, and Ji Wang ORCID logo
(National University of Defense Technology, China; Hunan University, China)
Publisher's Version
Type and Interval Aware Array Constraint Solving for Symbolic Execution
Ziqi Shuai, Zhenbang ChenORCID logo, Yufeng Zhang, Jun SunORCID logo, and Ji Wang ORCID logo
(National University of Defense Technology, China; Hunan University, China; Singapore Management University, Singapore)
Publisher's Version Artifacts Reusable
Grammar-Agnostic Symbolic Execution by Token Symbolization
Weiyu Pan, Zhenbang ChenORCID logo, Guofeng Zhang, Yunlai Luo, Yufeng Zhang, and Ji Wang ORCID logo
(National University of Defense Technology, China; Hunan University, China)
Publisher's Version Artifacts Functional

Machine Learning and Testing

Interval Constraint-Based Mutation Testing of Numerical Specifications
Clothilde Jeangoudoux, Eva Darulova ORCID logo, and Christoph Lauter
(MPI-SWS, Germany; University of Alaska at Anchorage, USA)
Publisher's Version
Predoo: Precision Testing of Deep Learning Operators
Xufan Zhang, Ning Sun, Chunrong Fang ORCID logo, Jiawei Liu, Jia Liu, Dong Chai, Jiang Wang, and Zhenyu ChenORCID logo
(Nanjing University, China; Huawei, China)
Publisher's Version
TERA: Optimizing Stochastic Regression Tests in Machine Learning Projects
Saikat Dutta, Jeeva Selvam, Aryaman Jain, and Sasa MisailovicORCID logo
(University of Illinois at Urbana-Champaign, USA)
Publisher's Version Artifacts Reusable
Deep Just-in-Time Defect Prediction: How Far Are We?
Zhengran Zeng, Yuqun Zhang ORCID logo, Haotian Zhang, and Lingming Zhang ORCID logo
(Southern University of Science and Technology, China; Kwai, China; University of Illinois at Urbana-Champaign, USA)
Publisher's Version Artifacts Reusable

Configuration and Dependency

Fixing Dependency Errors for Python Build Reproducibility
Suchita Mukherjee, Abigail Almanza, and Cindy Rubio-González
(University of California at Davis, USA)
Publisher's Version
Test-Case Prioritization for Configuration Testing
Runxiang Cheng ORCID logo, Lingming Zhang ORCID logo, Darko MarinovORCID logo, and Tianyin Xu ORCID logo
(University of Illinois at Urbana-Champaign, USA)
Publisher's Version Artifacts Reusable
The Impact of Tool Configuration Spaces on the Evaluation of Configurable Taint Analysis for Android
Austin MordahlORCID logo and Shiyi Wei ORCID logo
(University of Texas at Dallas, USA)
Publisher's Version Artifacts Functional
Challenges and Opportunities: An In-Depth Empirical Study on Configuration Error Injection Testing
Wang Li, Zhouyang Jia, Shanshan Li ORCID logo, Yuanliang Zhang, Teng Wang, Erci Xu, Ji Wang ORCID logo, and Xiangke Liao
(National University of Defense Technology, China)
Publisher's Version

Testing

Empirically Evaluating Readily Available Information for Regression Test Optimization in Continuous Integration
Daniel Elsner ORCID logo, Florian Hauer, Alexander Pretschner ORCID logo, and Silke Reimer
(TU Munich, Germany; IVU Traffic Technologies, Germany)
Publisher's Version
Toward Optimal MC/DC Test Case Generation
Sangharatna GodboleyORCID logo, Joxan JaffarORCID logo, Rasool MagharehORCID logo, and Arpita DuttaORCID logo
(National Institute of Technology Warangal, India; National University of Singapore, Singapore; Huawei, Canada)
Publisher's Version Artifacts Reusable
Log-Based Slicing for System-Level Test Cases
Salma Messaoudi ORCID logo, Donghwan ShinORCID logo, Annibale Panichella ORCID logo, Domenico BianculliORCID logo, and Lionel C. BriandORCID logo
(University of Luxembourg, Luxembourg; Delft University of Technology, Netherlands; University of Ottawa, Canada)
Publisher's Version
Model-Based Testing of Networked Applications
Yishuai LiORCID logo, Benjamin C. PierceORCID logo, and Steve ZdancewicORCID logo
(University of Pennsylvania, USA)
Publisher's Version Artifacts Reusable
Validating Static Warnings via Testing Code Fragments
Ashwin Kallingal Joshy ORCID logo, Xueyuan Chen, Benjamin Steenhoek, and Wei Le ORCID logo
(Iowa State University, USA)
Publisher's Version Info
Continuous Test Suite Failure Prediction
Cong Pan ORCID logo and Michael Pradel ORCID logo
(Beihang University, China; University of Stuttgart, Germany)
Publisher's Version
Empirical Evaluation of Smart Contract Testing: What Is the Best Choice?
Meng Ren, Zijing Yin ORCID logo, Fuchen Ma, Zhenyang Xu ORCID logo, Yu JiangORCID logo, Chengnian Sun ORCID logo, Huizhong Li ORCID logo, and Yan CaiORCID logo
(Tsinghua University, China; University of Waterloo, Canada; WeBank, China; Institute of Software at Chinese Academy of Sciences, China)
Publisher's Version Artifacts Reusable

Binary Analysis

iDEV: Exploring and Exploiting Semantic Deviations in ARM Instruction Processing
Shisong Qin, Chao Zhang ORCID logo, Kaixiang Chen ORCID logo, and Zheming Li ORCID logo
(Tsinghua University, China)
Publisher's Version
RAProducer: Efficiently Diagnose and Reproduce Data Race Bugs for Binaries via Trace Analysis
Ming Yuan, Yeseop Lee, Chao Zhang ORCID logo, Yun Li, Yan CaiORCID logo, and Bodong Zhao ORCID logo
(Tsinghua University, China; Institute of Software at Chinese Academy of Sciences, China)
Publisher's Version
A Lightweight Framework for Function Name Reassignment Based on Large-Scale Stripped Binaries
Han Gao ORCID logo, Shaoyin Cheng, Yinxing Xue, and Weiming Zhang ORCID logo
(University of Science and Technology of China, China)
Publisher's Version

Bugs and Analysis

Finding Data Compatibility Bugs with JSON Subschema Checking
Andrew Habib ORCID logo, Avraham Shinnar ORCID logo, Martin Hirzel, and Michael Pradel ORCID logo
(University of Luxembourg, Luxembourg; IBM Research, USA; University of Stuttgart, Germany)
Publisher's Version Info Artifacts Reusable
Automated Patch Backporting in Linux (Experience Paper)
Ridwan ShariffdeenORCID logo, Xiang Gao, Gregory J. Duck, Shin Hwei TanORCID logo, Julia Lawall ORCID logo, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; Southern University of Science and Technology, China; Inria, France)
Publisher's Version Artifacts Reusable
Faster, Deeper, Easier: Crowdsourcing Diagnosis of Microservice Kernel Failure from User Space
Yicheng Pan, Meng Ma, Xinrui Jiang, and Ping Wang
(Peking University, China)
Publisher's Version

Demo Papers

echidna-parade: A Tool for Diverse Multicore Smart Contract Fuzzing
Alex Groce and Gustavo Grieco
(Northern Arizona University, USA; Trail of Bits, USA)
Publisher's Version Info
ProFuzzBench: A Benchmark for Stateful Protocol Fuzzing
Roberto NatellaORCID logo and Van-Thuan PhamORCID logo
(Federico II University of Naples, Italy; University of Melbourne, Australia)
Publisher's Version Info
SCStudio: A Secure and Efficient Integrated Development Environment for Smart Contracts
Meng Ren, Fuchen Ma, Zijing Yin ORCID logo, Huizhong Li ORCID logo, Ying Fu ORCID logo, Ting Chen ORCID logo, and Yu JiangORCID logo
(Tsinghua University, China; WeBank, China; Ant Financial, China; University of Electronic Science and Technology of China, China)
Publisher's Version
C4: The C Compiler Concurrency Checker
Matt Windsor ORCID logo, Alastair F. DonaldsonORCID logo, and John Wickerson ORCID logo
(University of York, UK; Imperial College London, UK)
Publisher's Version Info
TauMed: Test Augmentation of Deep Learning in Medical Diagnosis
Yunhan Hou, Jiawei Liu, Daiwei Wang, Jiawei He, Chunrong Fang ORCID logo, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version
MoScan: A Model-Based Vulnerability Scanner for Web Single Sign-On Services
Hanlin Wei, Behnaz Hassanshahi, Guangdong Bai ORCID logo, Padmanabhan Krishnan ORCID logo, and Kostyantyn Vorobyov ORCID logo
(University of Queensland, Australia; Oracle, Australia)
Publisher's Version Video
RESTest: Automated Black-Box Testing of RESTful Web APIs
Alberto Martin-Lopez ORCID logo, Sergio Segura ORCID logo, and Antonio Ruiz-Cortés ORCID logo
(University of Seville, Spain)
Publisher's Version Video

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