ISSTA 2012
2012 International Symposium on Software Testing and Analysis (ISSTA)
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2012 International Symposium on Software Testing and Analysis (ISSTA), July 15–20, 2012, Minneapolis, MN, USA

ISSTA 2012 – Proceedings

Contents - Abstracts - Authors
Online Calendar - iCal File

Preface

Title Page
Foreword
Committees
Sponsors

Dynamic Analysis
Tue, Jul 17, 11:00 - 12:30

RefaFlex: Safer Refactorings for Reflective Java Programs
Andreas Thies and Eric Bodden
(Fernunversität in Hagen, Germany; TU Darmstadt, Germany)
THeME: A System for Testing by Hardware Monitoring Events
Kristen Walcott-Justice, Jason Mars, and Mary Lou Soffa
(University of Virginia, USA)
Multi-slicing: A Compiler-Supported Parallel Approach to Data Dependence Profiling
Hongtao Yu and Zhiyuan Li
(Purdue University, USA)

Web Applications
Tue, Jul 17, 14:00 - 15:30

Remedying the Eval that Men Do
Simon Holm Jensen, Peter A. Jonsson, and Anders MøllerORCID logo
(Aarhus University, Denmark)
State Aware Test Case Regeneration for Improving Web Application Test Suite Coverage and Fault Detection
Nadia Alshahwan and Mark Harman
(University College London, UK)
ViewPoints: Differential String Analysis for Discovering Client- and Server-Side Input Validation Inconsistencies
Muath Alkhalaf, Shauvik Roy Choudhary, Mattia Fazzini, Tevfik BultanORCID logo, Alessandro OrsoORCID logo, and Christopher Kruegel
(UC Santa Barbara, USA; Georgia Tech, USA)

Test Generation
Tue, Jul 17, 16:00 - 18:00

Search-Based System Testing: High Coverage, No False Alarms
Florian Gross, Gordon Fraser, and Andreas Zeller
(Saarland University, Germany)
Swarm Testing
Alex GroceORCID logo, Chaoqiang Zhang, Eric Eide ORCID logo, Yang Chen, and John Regehr ORCID logo
(Oregon State University, USA; University of Utah, USA)
Compositional Load Test Generation for Software Pipelines
Pingyu Zhang, Sebastian Elbaum, and Matthew B. Dwyer
(University of Nebraska-Lincoln, USA)
Combining Model-Based and Combinatorial Testing for Effective Test Case Generation
Cu D. Nguyen, Alessandro Marchetto, and Paolo Tonella
(Fondazione Bruno Kessler, Italy)

Security
Wed, Jul 18, 09:00 - 10:30

A First Step Towards Algorithm Plagiarism Detection
Fangfang Zhang, Yoon-Chan Jhi, Dinghao Wu, Peng Liu, and Sencun Zhu
(Pennsylvania State University, USA; Samsung, South Korea)
A Quantitative Study of Accuracy in System Call-Based Malware Detection
Davide Canali, Andrea Lanzi, Davide Balzarotti, Christopher Kruegel, Mihai Christodorescu, and Engin Kirda
(EURECOM, France; UC Santa Barbara, USA; IBM Research, USA; Northeastern University, USA)
Undangle: Early Detection of Dangling Pointers in Use-After-Free and Double-Free Vulnerabilities
Juan Caballero ORCID logo, Gustavo Grieco, Mark Marron, and Antonio Nappa
(IMDEA Software Institute, Spain)

Symbolic Execution
Wed, Jul 18, 11:00 - 12:30

Memoized Symbolic Execution
Guowei Yang, Corina S. Păsăreanu, and Sarfraz Khurshid
(University of Texas at Austin, USA; CMU, USA; NASA Ames Research Center, USA)
Abstracting Path Conditions
Jan Strejček and Marek Trtík
(Masaryk University, Czech Republic)
Probabilistic Symbolic Execution
Jaco Geldenhuys, Matthew B. Dwyer, and Willem Visser ORCID logo
(Stellenbosch University, South Africa; University of Nebraska-Lincoln, USA)

Empirical Studies
Wed, Jul 18, 14:00 - 15:30

A Human Study of Patch Maintainability
Zachary P. Fry, Bryan Landau, and Westley Weimer
(University of Virginia, USA)
Understanding User Understanding: Determining Correctness of Generated Program Invariants
Matt Staats, Shin Hong, Moonzoo Kim, and Gregg Rothermel
(KAIST, South Korea; University of Nebraska-Lincoln, USA)
Empirical Investigation of Search Algorithms for Environment Model-Based Testing of Real-Time Embedded Software
Muhammad Zohaib Iqbal, Andrea Arcuri, and Lionel BriandORCID logo
(Simula Research Laboratory, Norway; University of Oslo, Norway; University of Luxembourg, Luxembourg)

Concurrency
Wed, Jul 18, 16:00 - 18:00

Testing Concurrent Programs to Achieve High Synchronization Coverage
Shin Hong, Jaemin Ahn, Sangmin Park, Moonzoo Kim, and Mary Jean Harrold
(KAIST, South Korea; Georgia Tech, USA)
CARISMA: a Context-sensitive Approach to Race-condition sample-Instance Selection for Multithreaded Applications
Ke Zhai, Boni Xu, W. K. Chan, and T. H. TseORCID logo
(University of Hong Kong, Hong Kong; City University of Hong Kong, Hong Kong)
Cooperative Types for Controlling Thread Interference in Java
Jaeheon Yi, Tim Disney, Stephen N. Freund, and Cormac Flanagan
(UC Santa Cruz, USA; Williams College, USA)
Finding Errors in Multithreaded GUI Applications
Sai Zhang, Hao Lü, and Michael D. ErnstORCID logo
(University of Washington, USA)

Static Analysis
Thu, Jul 19, 11:00 - 12:30

Static Memory Leak Detection Using Full-Sparse Value-Flow Analysis
Yulei Sui, Ding Ye, and Jingling Xue ORCID logo
(UNSW, Australia)
Static Detection of Brittle Parameter Typing
Michael Pradel ORCID logo, Severin Heiniger, and Thomas R. Gross
(ETH Zurich, Switzerland)
Measuring Enforcement Windows with Symbolic Trace Interpretation: What Well-Behaved Programs Say
Devin Coughlin, Bor-Yuh Evan ChangORCID logo, Amer Diwan, and Jeremy G. Siek
(University of Colorado at Boulder, USA; Google, USA)

Bug Detection and Diagnosis
Thu, Jul 19, 14:00 - 15:30

Detecting Inconsistencies via Universal Reachability Analysis
Aaron Tomb and Cormac Flanagan
(Galois, USA; UC Santa Cruz, USA)
Residual Investigation: Predictive and Precise Bug Detection
Kaituo Li, Christoph Reichenbach, Christoph Csallner ORCID logo, and Yannis Smaragdakis ORCID logo
(University of Massachusetts at Amherst, USA; University of Texas at Arlington, USA; University of Athens, Greece)
Isolating Failure Causes through Test Case Generation
Jeremias Rößler, Gordon Fraser, Andreas Zeller, and Alessandro OrsoORCID logo
(Saarland University, Germany; Georgia Tech, USA)

Regression Testing
Thu, Jul 19, 16:00 - 17:00

Efficient Regression Testing of Ontology-Driven Systems
Mijung Kim, Jake Cobb, Mary Jean Harrold, Tahsin Kurc, Alessandro OrsoORCID logo, Joel Saltz, Andrew Post, Kunal Malhotra, and Shamkant B. Navathe
(Georgia Tech, USA; Emory University, USA)
Regression Mutation Testing
Lingming Zhang, Darko MarinovORCID logo, Lu Zhang, and Sarfraz Khurshid
(University of Texas at Austin, USA; University of Illinois at Urbana-Champaign, USA; Peking University, China)

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