ICSE 2013 Workshops
2013 35th International Conference on Software Engineering (ICSE)
Powered by
Conference Publishing Consulting

2013 1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE), May 21, 2013, San Francisco, CA, USA

DAPSE 2013 – Proceedings

Contents - Abstracts - Authors

1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE)

Title Page
Foreword
Building Statistical Language Models of Code
Peter Schulam, Roni Rosenfeld, and Premkumar Devanbu
(CMU, USA; UC Davis, USA)
Commit Graphs
Maximilian Steff and Barbara Russo
(Free University of Bolzano, Italy)
Concept to Commit: A Pattern Designed to Trace Code Changes from User Requests to Change Implementation by Analyzing Mailing Lists and Code Repositories
Scott McGrath, Kiran Bastola, and Harvey Siy
(University of Nebraska at Omaha, USA)
Data Analysis Anti-patterns in Empirical Software Engineering
Sandro Morasca
(University of Insubria, Italy)
Effect Size Analysis
Emanuel Giger and Harald C. Gall ORCID logo
(University of Zurich, Switzerland)
Exploring Software Engineering Data with Formal Concept Analysis
Xiaobing Sun, Ying Chen, Bin Li ORCID logo, and Bixin Li
(Yangzhou University, China; Southeast University, China)
Extracting Artifact Lifecycle Models from Metadata History
Olga Baysal, Oleksii Kononenko, Reid Holmes, and Michael W. Godfrey ORCID logo
(University of Waterloo, Canada)
Measure What Counts: An Evaluation Pattern for Software Data Analysis
Emmanuel Letier and Camilo Fitzgerald
(University College London, UK)
Parametric Classification over Multiple Samples
Barbara Russo
(Free University of Bolzano, Italy)
Patterns for Cleaning Up Bug Data
Rodrigo Souza, Christina Chavez, and Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)
Patterns for Extracting High Level Information from Bug Reports
Rodrigo Souza, Christina Chavez, and Roberto Bittencourt
(UFBA, Brazil; UEFS, Brazil)
Structural and Temporal Patterns-Based Features
Venkatesh-Prasad Ranganath and Jithin Thomas
(Microsoft Research, India)
The Chunking Pattern
David M. Weiss and Audris Mockus
(Iowa State University, USA; Avaya Labs Research, USA)

proc time: 0.02