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2012 6th International Workshop on Software Clones (IWSC), June 4, 2012, Zurich, Switzerland

IWSC 2012 – Proceedings

Contents - Abstracts - Authors

6th International Workshop on Software Clones (IWSC)

Preface

Title Page
Foreword

Technical Papers

An Accurate Estimation of the Levenshtein Distance Using Metric Trees and Manhattan Distance
Thierry Lavoie and Ettore Merlo
(École Polytechnique de Montréal, Canada)
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A Novel Approach Based on Formal Methods for Clone Detection
Antonio Cuomo, Antonella Santone, and Umberto Villano
(University of Sannio, Italy)
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Claims and Beliefs about Code Clones: Do We Agree as a Community? A Survey
Debarshi Chatterji, Jeffrey C. Carver, and Nicholas A. Kraft
(University of Alabama, USA)
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Clone Detection Using Rolling Hashing, Suffix Trees and Dagification: A Case Study
Mikkel Jønsson Thomsen and Fritz Henglein
(University of Copenhagen, Denmark)
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Dispersion of Changes in Cloned and Non-cloned Code
Manishankar Mondal, Chanchal K. Roy, and Kevin A. Schneider
(University of Saskatchewan, Canada)
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Java Bytecode Clone Detection via Relaxation on Code Fingerprint and Semantic Web Reasoning
Iman Keivanloo, Chanchal K. Roy, and Juergen Rilling
(Concordia University, Canada; University of Saskatchewan, Canada)
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Mining Object-Oriented Design Models for Detecting Identical Design Structures
Umut Tekin, Ural Erdemir, and Feza Buzluca
(BILGEM, Turkey; Istanbul Technical University, Turkey)
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Safe Clone-Based Refactoring through Stereotype Identification and Iso-Generation
Nic Volanschi
(Metaware Technologies, France)
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Industrial Experience Papers

A Case Study on Applying Clone Technology to an Industrial Application Framework
Eray Tüzün and Emre Er
(Havelsan A.Ş., Turkey)
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A Method for Proactive Moderation of Code Clones in IDEs
Radhika D. Venkatasubramanyam, Himanshu Kumar Singh, and K. Ravikanth
(Siemens, India)
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Industrial Application of Clone Change Management System
Yuki Yamanaka, Eunjong Choi, Norihiro Yoshida, Katsuro Inoue, and Tateki Sano
(Osaka University, Japan; Nara Institute of Science and Technology, Japan; NEC, Japan)
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Short Papers

A Common Conceptual Model for Clone Detection Results
Cory J. Kapser, Jan Harder, and Ira Baxter
(Techtonic Arts, Canada; University of Bremen, Germany; Semantic Designs, USA)
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Conte*t Clones or Re-thinking Clone on a Call Graph
Toshihiro Kamiya
(Future University Hakodate, Japan)
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Filtering Clones for Individual User Based on Machine Learning Analysis
Jiachen Yang, Keisuke Hotta, Yoshiki Higo, Hiroshi Igaki, and Shinji Kusumoto
(Osaka University, Japan)
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Near-Miss Model Clone Detection for Simulink Models
Manar H. Alalfi, James R. Cordy, Thomas R. Dean, Matthew Stephan, and Andrew Stevenson
(Queen's University, Canada)
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Semantic Clone Detection Using Method IOE-Behavior
Rochelle Elva and Gary T. Leavens
(University of Central Florida, USA)
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Shuffling and Randomization for Scalable Source Code Clone Detection
Iman Keivanloo, Chanchal K. Roy, Juergen Rilling, and Philippe Charland
(Concordia University, Canada; University of Saskatchewan, Canada; DRDC at Valcartier, Canada)
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Towards Qualitative Comparison of Simulink Model Clone Detection Approaches
Matthew Stephan, Manar H. Alalfi, Andrew Stevenson, and James R. Cordy
(Queen's University, Canada)
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Using Edge Bundle Views for Clone Visualization
Benedikt Hauptmann, Veronika Bauer, and Maximilian Junker
(TU Munich, Germany)
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We Have All of the Clones, Now What? Toward Integrating Clone Analysis into Software Quality Assessment
Wei Wang and Michael W. Godfrey
(University of Waterloo, Canada)
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What Clone Coverage Can Tell
Nils Göde, Benjamin Hummel, and Elmar Jürgens
(CQSE, Germany)
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Tool Demonstrations

Ctcompare: Code Clone Detection Using Hashed Token Sequences
Warren Toomey
(Bond University, Australia)
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Experience of Finding Inconsistently-Changed Bugs in Code Clones of Mobile Software
Katsuro Inoue, Yoshiki Higo, Norihiro Yoshida, Eunjong Choi, Shinji Kusumoto, Kyonghwan Kim, Wonjin Park, and Eunha Lee
(Osaka University, Japan; Samsung Electronics, South Korea)
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Visualizing Code Clone Outbreak: An Industrial Case Study
Kentaro Yoshimura and Ryota Mibe
(Hitachi, Japan)
Article Search

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