ESEC/FSE 2023
31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2023)
Powered by
Conference Publishing Consulting

31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2023), December 3–9, 2023, San Francisco, CA, USA

ESEC/FSE 2023 – Proceedings

Contents - Abstracts - Authors
Twitter: https://twitter.com/esecfse

Frontmatter

Title Page
Welcome from the Chairs
ESEC/FSE 2023 Organization
Sponsors

Keynotes

Towards AI-Driven Software Development: Challenges and Lessons from the Field (Keynote)
Eran Yahav ORCID logo
(Technion, Israel)
Publisher's Version
Getting Outside the Bug Boxes (Keynote)
Margaret Burnett ORCID logo
(Oregon State University, USA)
Publisher's Version

Research Papers

Human Aspects I

A Four-Year Study of Student Contributions to OSS vs. OSS4SG with a Lightweight Intervention
Zihan Fang ORCID logo, Madeline EndresORCID logo, Thomas ZimmermannORCID logo, Denae FordORCID logo, Westley Weimer ORCID logo, Kevin Leach ORCID logo, and Yu Huang ORCID logo
(Vanderbilt University, USA; University of Michigan, USA; Microsoft Research, USA)
Publisher's Version
Do CONTRIBUTING Files Provide Information about OSS Newcomers’ Onboarding Barriers?
Felipe FronchettiORCID logo, David C. ShepherdORCID logo, Igor Wiese ORCID logo, Christoph Treude ORCID logo, Marco Aurélio GerosaORCID logo, and Igor Steinmacher ORCID logo
(Virginia Commonwealth University, USA; Lousiana State University, USA; Federal University of Technology Paraná, Brazil; University of Melbourne, Australia; Northern Arizona University, USA)
Publisher's Version Info
How Early Participation Determines Long-Term Sustained Activity in GitHub Projects?
Wenxin Xiao ORCID logo, Hao He ORCID logo, Weiwei Xu ORCID logo, Yuxia ZhangORCID logo, and Minghui Zhou ORCID logo
(Peking University, China; Beijing Institute of Technology, China)
Publisher's Version
Matching Skills, Past Collaboration, and Limited Competition: Modeling When Open-Source Projects Attract Contributors
Hongbo Fang ORCID logo, James Herbsleb ORCID logo, and Bogdan VasilescuORCID logo
(Carnegie Mellon University, USA)
Publisher's Version

Testing I

Accelerating Continuous Integration with Parallel Batch Testing
Emad Fallahzadeh ORCID logo, Amir Hossein Bavand ORCID logo, and Peter C. Rigby ORCID logo
(Concordia University, Canada)
Publisher's Version
DistXplore: Distribution-Guided Testing for Evaluating and Enhancing Deep Learning Systems
Longtian Wang ORCID logo, Xiaofei XieORCID logo, Xiaoning Du ORCID logo, Meng Tian ORCID logo, Qing Guo ORCID logo, Zheng Yang ORCID logo, and Chao Shen ORCID logo
(Xi’an Jiaotong University, China; Singapore Management University, Singapore; Monash University, Australia; A*STAR, Singapore; Huawei, China)
Publisher's Version
CAmpactor: A Novel and Effective Local Search Algorithm for Optimizing Pairwise Covering Arrays
Qiyuan Zhao ORCID logo, Chuan Luo ORCID logo, Shaowei Cai ORCID logo, Wei Wu ORCID logo, Jinkun Lin ORCID logo, Hongyu Zhang ORCID logo, and Chunming Hu ORCID logo
(Beihang University, China; Institute of Software at Chinese Academy of Sciences, China; Central South University, China; Xiangjiang Laboratory, China; SeedMath Technology, China; Chongqing University, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Machine Learning I

Design by Contract for Deep Learning APIs
Shibbir Ahmed ORCID logo, Sayem Mohammad Imtiaz ORCID logo, Samantha Syeda Khairunnesa ORCID logo, Breno Dantas Cruz ORCID logo, and Hridesh Rajan ORCID logo
(Iowa State University, USA; Bradley University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Testing Coreference Resolution Systems without Labeled Test Sets
Jialun Cao ORCID logo, Yaojie Lu ORCID logo, Ming WenORCID logo, and Shing-Chi CheungORCID logo
(Hong Kong University of Science and Technology, China; Guangzhou HKUST Fok Ying Tung Research Institute, China; Institute of Software at Chinese Academy of Sciences, China; Huazhong University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available
Neural-Based Test Oracle Generation: A Large-Scale Evaluation and Lessons Learned
Soneya Binta HossainORCID logo, Antonio Filieri ORCID logo, Matthew B. Dwyer ORCID logo, Sebastian Elbaum ORCID logo, and Willem Visser ORCID logo
(University of Virginia, USA; Amazon Web Services, USA)
Publisher's Version Published Artifact Artifacts Available
Revisiting Neural Program Smoothing for Fuzzing
Maria-Irina Nicolae ORCID logo, Max Eisele ORCID logo, and Andreas Zeller ORCID logo
(Bosch, Germany; Saarland University, Germany; CISPA Helmholtz Center for Information Security, Germany)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Automated Repair I

RAP-Gen: Retrieval-Augmented Patch Generation with CodeT5 for Automatic Program Repair
Weishi Wang ORCID logo, Yue WangORCID logo, Shafiq Joty ORCID logo, and Steven C.H. Hoi ORCID logo
(Nanyang Technological University, Singapore; Salesforce AI Research, Singapore; Salesforce AI Research, USA)
Publisher's Version
From Leaks to Fixes: Automated Repairs for Resource Leak Warnings
Akshay Utture ORCID logo and Jens PalsbergORCID logo
(University of California at Los Angeles, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Copiloting the Copilots: Fusing Large Language Models with Completion Engines for Automated Program Repair
Yuxiang WeiORCID logo, Chunqiu Steven Xia ORCID logo, and Lingming Zhang ORCID logo
(University of Illinois at Urbana-Champaign, USA)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
SmartFix: Fixing Vulnerable Smart Contracts by Accelerating Generate-and-Verify Repair using Statistical Models
Sunbeom So ORCID logo and Hakjoo Oh ORCID logo
(Korea University, South Korea)
Publisher's Version Published Artifact Archive submitted (500 kB) Artifacts Available Artifacts Reusable
Automatically Resolving Dependency-Conflict Building Failures via Behavior-Consistent Loosening of Library Version Constraints
Huiyan Wang ORCID logo, Shuguan Liu ORCID logo, Lingyu Zhang ORCID logo, and Chang XuORCID logo
(Nanjing University, China)
Publisher's Version

Empirical Studies I

On the Relationship between Code Verifiability and Understandability
Kobi Feldman ORCID logo, Martin Kellogg ORCID logo, and Oscar ChaparroORCID logo
(College of William and Mary, USA; New Jersey Institute of Technology, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Towards Greener Yet Powerful Code Generation via Quantization: An Empirical Study
Xiaokai Wei ORCID logo, Sujan Kumar Gonugondla ORCID logo, Shiqi Wang ORCID logo, Wasi Ahmad ORCID logo, Baishakhi Ray ORCID logo, Haifeng Qian ORCID logo, Xiaopeng Li ORCID logo, Varun Kumar ORCID logo, Zijian Wang ORCID logo, Yuchen Tian ORCID logo, Qing Sun ORCID logo, Ben Athiwaratkun ORCID logo, Mingyue Shang ORCID logo, Murali Krishna Ramanathan ORCID logo, Parminder Bhatia ORCID logo, and Bing Xiang ORCID logo
(AWS AI Labs, USA)
Publisher's Version

Testing II

Statfier: Automated Testing of Static Analyzers via Semantic-Preserving Program Transformations
Huaien Zhang ORCID logo, Yu Pei ORCID logo, Junjie Chen ORCID logo, and Shin Hwei Tan ORCID logo
(Southern University of Science and Technology, China; Hong Kong Polytechnic University, China; Tianjin University, China; Concordia University, Canada)
Publisher's Version
Contextual Predictive Mutation Testing
Kush Jain ORCID logo, Uri Alon ORCID logo, Alex GroceORCID logo, and Claire Le GouesORCID logo
(Carnegie Mellon University, USA; Northern Arizona University, USA)
Publisher's Version
𝜇Akka: Mutation Testing for Actor Concurrency in Akka using Real-World Bugs
Mohsen Moradi Moghadam ORCID logo, Mehdi BagherzadehORCID logo, Raffi KhatchadourianORCID logo, and Hamid Bagheri ORCID logo
(Oakland University, USA; City University of New York, USA; University of Nebraska-Lincoln, USA)
Publisher's Version

Software Evolution I

EvaCRC: Evaluating Code Review Comments
Lanxin Yang ORCID logo, Jinwei Xu ORCID logo, Yifan Zhang ORCID logo, He Zhang ORCID logo, and Alberto BacchelliORCID logo
(Nanjing University, China; University of Zurich, Switzerland)
Publisher's Version Info
HyperDiff: Computing Source Code Diffs at Scale
Quentin Le Dilavrec ORCID logo, Djamel Eddine Khelladi ORCID logo, Arnaud Blouin ORCID logo, and Jean-Marc Jézéquel ORCID logo
(University of Rennes, France; CNRS - University of Rennes, France; INSA Rennes, France)
Publisher's Version Published Artifact Info Artifacts Available
Understanding Solidity Event Logging Practices in the Wild
Lantian Li ORCID logo, Yejian Liang ORCID logo, Zhihao Liu ORCID logo, and Zhongxing Yu ORCID logo
(Shandong University, China)
Publisher's Version

Program Analysis I

An Automated Approach to Extracting Local Variables
Xiaye Chi ORCID logo, Hui Liu ORCID logo, Guangjie Li ORCID logo, Weixiao Wang ORCID logo, Yunni Xia ORCID logo, Yanjie Jiang ORCID logo, Yuxia ZhangORCID logo, and Weixing Ji ORCID logo
(Beijing Institute of Technology, China; National Innovation Institute of Defense Technology, China; Chongqing University, China)
Publisher's Version Published Artifact Artifacts Available
Statistical Reachability Analysis
Seongmin Lee ORCID logo and Marcel BöhmeORCID logo
(MPI-SP, Germany)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
PPR: Pairwise Program Reduction
Mengxiao Zhang ORCID logo, Zhenyang Xu ORCID logo, Yongqiang Tian ORCID logo, Yu Jiang ORCID logo, and Chengnian Sun ORCID logo
(University of Waterloo, Canada; Tsinghua University, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
When Function Inlining Meets WebAssembly: Counterintuitive Impacts on Runtime Performance
Alan Romano ORCID logo and Weihang Wang ORCID logo
(University of Southern California, USA)
Publisher's Version Published Artifact Artifacts Available

Code Search and Text to Code

Self-Supervised Query Reformulation for Code Search
Yuetian Mao ORCID logo, Chengcheng WanORCID logo, Yuze Jiang ORCID logo, and Xiaodong GuORCID logo
(Shanghai Jiao Tong University, China; East China Normal University, China)
Publisher's Version
Natural Language to Code: How Far Are We?
Shangwen WangORCID logo, Mingyang Geng ORCID logo, Bo Lin ORCID logo, Zhensu Sun ORCID logo, Ming WenORCID logo, Yepang Liu ORCID logo, Li Li ORCID logo, Tegawendé F. Bissyandé ORCID logo, and Xiaoguang Mao ORCID logo
(National University of Defense Technology, China; Singapore Management University, Singapore; Huazhong University of Science and Technology, China; Southern University of Science and Technology, China; Beihang University, China; University of Luxembourg, Luxembourg)
Publisher's Version Published Artifact Artifacts Available
Efficient Text-to-Code Retrieval with Cascaded Fast and Slow Transformer Models
Akhilesh Deepak GotmareORCID logo, Junnan Li ORCID logo, Shafiq Joty ORCID logo, and Steven C.H. Hoi ORCID logo
(Salesforce AI Research, Singapore; Salesforce AI Research, USA)
Publisher's Version
PEM: Representing Binary Program Semantics for Similarity Analysis via a Probabilistic Execution Model
Xiangzhe Xu ORCID logo, Zhou Xuan ORCID logo, Shiwei Feng ORCID logo, Siyuan Cheng ORCID logo, Yapeng Ye ORCID logo, Qingkai Shi ORCID logo, Guanhong Tao ORCID logo, Le Yu ORCID logo, Zhuo Zhang ORCID logo, and Xiangyu ZhangORCID logo
(Purdue University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Log Analysis and Debugging

Hue: A User-Adaptive Parser for Hybrid Logs
Junjielong Xu ORCID logo, Qiuai Fu ORCID logo, Zhouruixing Zhu ORCID logo, Yutong Cheng ORCID logo, Zhijing Li ORCID logo, Yuchi Ma ORCID logo, and Pinjia He ORCID logo
(Chinese University of Hong Kong, Shenzhen, China; Huawei Cloud Computing Technologies, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Log Parsing with Generalization Ability under New Log Types
Siyu Yu ORCID logo, Yifan Wu ORCID logo, Zhijing Li ORCID logo, Pinjia He ORCID logo, Ningjiang Chen ORCID logo, and Changjian Liu ORCID logo
(Guangxi University, China; Peking University, China; Chinese University of Hong Kong, China)
Publisher's Version
Semantic Debugging
Martin EberleinORCID logo, Marius Smytzek ORCID logo, Dominic Steinhöfel ORCID logo, Lars GrunskeORCID logo, and Andreas Zeller ORCID logo
(Humboldt University of Berlin, Germany; CISPA Helmholtz Center for Information Security, Germany)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
Demystifying Dependency Bugs in Deep Learning Stack
Kaifeng Huang ORCID logo, Bihuan Chen ORCID logo, Susheng Wu ORCID logo, Junming Cao ORCID logo, Lei Ma ORCID logo, and Xin Peng ORCID logo
(Fudan University, China; University of Tokyo, Japan; University of Alberta, Canada)
Publisher's Version

Machine Learning II

Can Machine Learning Pipelines Be Better Configured?
Yibo Wang ORCID logo, Ying Wang ORCID logo, Tingwei Zhang ORCID logo, Yue Yu ORCID logo, Shing-Chi CheungORCID logo, Hai Yu ORCID logo, and Zhiliang Zhu ORCID logo
(Northeastern University, China; Hong Kong University of Science and Technology, China; National University of Defense Technology, China)
Publisher's Version Info
Compatibility Issues in Deep Learning Systems: Problems and Opportunities
Jun Wang ORCID logo, Guanping Xiao ORCID logo, Shuai Zhang ORCID logo, Huashan Lei ORCID logo, Yepang Liu ORCID logo, and Yulei Sui ORCID logo
(Nanjing University of Aeronautics and Astronautics, China; Southern University of Science and Technology, China; UNSW, Australia)
Publisher's Version Published Artifact Artifacts Available
An Extensive Study on Adversarial Attack against Pre-trained Models of Code
Xiaohu Du ORCID logo, Ming WenORCID logo, Zichao Wei ORCID logo, Shangwen WangORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; National University of Defense Technology, China)
Publisher's Version Published Artifact Artifacts Available
Fix Fairness, Don’t Ruin Accuracy: Performance Aware Fairness Repair using AutoML
Giang Nguyen ORCID logo, Sumon Biswas ORCID logo, and Hridesh Rajan ORCID logo
(Iowa State University, USA; Carnegie Mellon University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
BiasAsker: Measuring the Bias in Conversational AI System
Yuxuan Wan ORCID logo, Wenxuan Wang ORCID logo, Pinjia He ORCID logo, Jiazhen Gu ORCID logo, Haonan Bai ORCID logo, and Michael R. Lyu ORCID logo
(Chinese University of Hong Kong, China)
Publisher's Version
Pitfalls in Experiments with DNN4SE: An Analysis of the State of the Practice
Sira Vegas ORCID logo and Sebastian Elbaum ORCID logo
(Universidad Politécnica de Madrid, Spain; University of Virginia, USA)
Publisher's Version Published Artifact Info Artifacts Available
DecompoVision: Reliability Analysis of Machine Vision Components through Decomposition and Reuse
Boyue Caroline Hu ORCID logo, Lina Marsso ORCID logo, Nikita Dvornik ORCID logo, Huakun Shen ORCID logo, and Marsha Chechik ORCID logo
(University of Toronto, Canada; Waabi, Canada)
Publisher's Version

Fault Diagnosis and Root Cause Analysis I

Nezha: Interpretable Fine-Grained Root Causes Analysis for Microservices on Multi-modal Observability Data
Guangba Yu ORCID logo, Pengfei Chen ORCID logo, Yufeng Li ORCID logo, Hongyang Chen ORCID logo, Xiaoyun Li ORCID logo, and Zibin Zheng ORCID logo
(Sun Yat-sen University, China)
Publisher's Version Published Artifact Artifacts Available
DiagConfig: Configuration Diagnosis of Performance Violations in Configurable Software Systems
Zhiming Chen ORCID logo, Pengfei Chen ORCID logo, Peipei Wang ORCID logo, Guangba Yu ORCID logo, Zilong He ORCID logo, and Genting Mai ORCID logo
(Sun Yat-sen University, China; ByteDance Infrastructure System Lab, USA)
Publisher's Version Published Artifact Artifacts Available
Pre-training Code Representation with Semantic Flow Graph for Effective Bug Localization
Yali Du ORCID logo and Zhongxing Yu ORCID logo
(Shandong University, China)
Publisher's Version Published Artifact Artifacts Available
Automata-Based Trace Analysis for Aiding Diagnosing GUI Testing Tools for Android
Enze Ma ORCID logo, Shan Huang ORCID logo, Weigang He ORCID logo, Ting Su ORCID logo, Jue Wang ORCID logo, Huiyu Liu ORCID logo, Geguang Pu ORCID logo, and Zhendong Su ORCID logo
(East China Normal University, China; Nanjing University, China; ETH Zurich, Switzerland)
Publisher's Version
A Practical Human Labeling Method for Online Just-in-Time Software Defect Prediction
Liyan SongORCID logo, Leandro Lei Minku ORCID logo, Cong Teng ORCID logo, and Xin YaoORCID logo
(Southern University of Science and Technology, China; University of Birmingham, UK)
Publisher's Version Published Artifact Info Artifacts Available

Human Aspects II

Flow Experience in Software Engineering
Saima Ritonummi ORCID logo, Valtteri Siitonen ORCID logo, Markus Salo ORCID logo, Henri Pirkkalainen ORCID logo, and Anu Sivunen ORCID logo
(University of Jyväskylä, Finland; Tampere University, Finland)
Publisher's Version
Building and Sustaining Ethnically, Racially, and Gender Diverse Software Engineering Teams: A Study at Google
Ella Dagan ORCID logo, Anita SarmaORCID logo, Alison Chang ORCID logo, Sarah D’Angelo ORCID logo, Jill Dicker ORCID logo, and Emerson Murphy-Hill ORCID logo
(Google, USA; Oregon State University, USA)
Publisher's Version
Towards Automated Detection of Unethical Behavior in Open-Source Software Projects
Hsu Myat Win ORCID logo, Haibo Wang ORCID logo, and Shin Hwei Tan ORCID logo
(Southern University of Science and Technology, China; Concordia University, Canada)
Publisher's Version

Testing III

NeuRI: Diversifying DNN Generation via Inductive Rule Inference
Jiawei LiuORCID logo, Jinjun Peng ORCID logo, Yuyao Wang ORCID logo, and Lingming Zhang ORCID logo
(University of Illinois at Urbana-Champaign, USA; Columbia University, USA; Nanjing University, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Heterogeneous Testing for Coverage Profilers Empowered with Debugging Support
Yibiao Yang ORCID logo, Maolin Sun ORCID logo, Yang Wang ORCID logo, Qingyang Li ORCID logo, Ming WenORCID logo, and Yuming ZhouORCID logo
(Nanjing University, China; Huazhong University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available
Outage-Watch: Early Prediction of Outages using Extreme Event Regularizer
Shubham Agarwal ORCID logo, Sarthak Chakraborty ORCID logo, Shaddy Garg ORCID logo, Sumit Bisht ORCID logo, Chahat Jain ORCID logo, Ashritha Gonuguntla ORCID logo, and Shiv Saini ORCID logo
(Adobe Research, India; University of Illinois at Urbana-Champaign, USA; Adobe, India; Amazon, India; Traceable.ai, India; Cisco, India)
Publisher's Version

Software Evolution II

Multilingual Code Co-evolution using Large Language Models
Jiyang Zhang ORCID logo, Pengyu Nie ORCID logo, Junyi Jessy Li ORCID logo, and Milos GligoricORCID logo
(University of Texas at Austin, USA)
Publisher's Version
Knowledge-Based Version Incompatibility Detection for Deep Learning
Zhongkai Zhao ORCID logo, Bonan Kou ORCID logo, Mohamed Yilmaz Ibrahim ORCID logo, Muhao Chen ORCID logo, and Tianyi Zhang ORCID logo
(Tongji University, China; Purdue University, USA; University of California at Davis, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Program Analysis II

Statistical Type Inference for Incomplete Programs
Yaohui Peng ORCID logo, Jing Xie ORCID logo, Qiongling Yang ORCID logo, Hanwen Guo ORCID logo, Qingan Li ORCID logo, Jingling Xue ORCID logo, and Mengting Yuan ORCID logo
(Wuhan University, China; UNSW, Australia)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
OOM-Guard: Towards Improving the Ergonomics of Rust OOM Handling via a Reservation-Based Approach
Chengjun Chen ORCID logo, Zhicong Zhang ORCID logo, Hongliang Tian ORCID logo, Shoumeng Yan ORCID logo, and Hui Xu ORCID logo
(Fudan University, China; Ant Group, China)
Publisher's Version
DeepInfer: Deep Type Inference from Smart Contract Bytecode
Kunsong Zhao ORCID logo, Zihao Li ORCID logo, Jianfeng Li ORCID logo, He Ye ORCID logo, Xiapu LuoORCID logo, and Ting Chen ORCID logo
(Hong Kong Polytechnic University, China; Xi’an Jiaotong University, China; KTH Royal Institute of Technology, Sweden; University of Electronic Science and Technology of China, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
DeMinify: Neural Variable Name Recovery and Type Inference
Yi Li ORCID logo, Aashish Yadavally ORCID logo, Jiaxing Zhang ORCID logo, Shaohua Wang ORCID logo, and Tien N. Nguyen ORCID logo
(New Jersey Institute of Technology, USA; University of Texas at Dallas, USA)
Publisher's Version

Clone and Similarity Detection

Tritor: Detecting Semantic Code Clones by Building Social Network-Based Triads Model
Deqing Zou ORCID logo, Siyue Feng ORCID logo, Yueming Wu ORCID logo, Wenqi Suo ORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Nanyang Technological University, Singapore)
Publisher's Version Info
Gitor: Scalable Code Clone Detection by Building Global Sample Graph
Junjie Shan ORCID logo, Shihan Dou ORCID logo, Yueming Wu ORCID logo, Hairu Wu ORCID logo, and Yang Liu ORCID logo
(Westlake University, China; Fudan University, China; Nanyang Technological University, Singapore)
Publisher's Version
Demystifying the Composition and Code Reuse in Solidity Smart Contracts
Kairan Sun ORCID logo, Zhengzi Xu ORCID logo, Chengwei Liu ORCID logo, Kaixuan Li ORCID logo, and Yang Liu ORCID logo
(Nanyang Technological University, Singapore; East China Normal University, China)
Publisher's Version
Scalable Program Clone Search through Spectral Analysis
Tristan Benoit ORCID logo, Jean-Yves Marion ORCID logo, and Sébastien BardinORCID logo
(LORIA, France; CNRS, France; Université de Lorraine, France; CEA, France; Université Paris-Saclay, France)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Performance

A Highly Scalable, Hybrid, Cross-Platform Timing Analysis Framework Providing Accurate Differential Throughput Estimation via Instruction-Level Tracing
Min-Yih Hsu ORCID logo, Felicitas Hetzelt ORCID logo, David Gens ORCID logo, Michael Maitland ORCID logo, and Michael Franz ORCID logo
(University of California at Irvine, USA; SiFive, USA)
Publisher's Version
Discovering Parallelisms in Python Programs
Siwei Wei ORCID logo, Guyang Song ORCID logo, Senlin Zhu ORCID logo, Ruoyi Ruan ORCID logo, Shihao Zhu ORCID logo, and Yan Cai ORCID logo
(Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Ant Group, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
IoPV: On Inconsistent Option Performance Variations
Jinfu Chen ORCID logo, Zishuo Ding ORCID logo, Yiming Tang ORCID logo, Mohammed Sayagh ORCID logo, Heng Li ORCID logo, Bram Adams ORCID logo, and Weiyi Shang ORCID logo
(Wuhan University, China; University of Waterloo, Canada; Rochester Institute of Technology, USA; ÉTS, Canada; Polytechnique Montréal, Canada; Queen’s University, Canada)
Publisher's Version
Predicting Software Performance with Divide-and-Learn
Jingzhi Gong ORCID logo and Tao Chen ORCID logo
(University of Electronic Science and Technology of China, China; Loughborough University, UK; University of Birmingham, UK)
Publisher's Version Info

Machine Learning III

Benchmarking Robustness of AI-Enabled Multi-sensor Fusion Systems: Challenges and Opportunities
Xinyu Gao ORCID logo, Zhijie Wang ORCID logo, Yang Feng ORCID logo, Lei Ma ORCID logo, Zhenyu ChenORCID logo, and Baowen Xu ORCID logo
(Nanjing University, China; University of Alberta, Canada; University of Tokyo, Japan)
Publisher's Version Published Artifact Info Artifacts Available
Automated Testing and Improvement of Named Entity Recognition Systems
Boxi Yu ORCID logo, Yiyan Hu ORCID logo, Qiuyang Mang ORCID logo, Wenhan Hu ORCID logo, and Pinjia He ORCID logo
(Chinese University of Hong Kong, China)
Publisher's Version
The EarlyBIRD Catches the Bug: On Exploiting Early Layers of Encoder Models for More Efficient Code Classification
Anastasiia Grishina ORCID logo, Max Hort ORCID logo, and Leon MoonenORCID logo
(Simula Research Laboratory, Norway; BI Norwegian Business School, Norway)
Publisher's Version Published Artifact Artifacts Available
Deep Learning Based Feature Envy Detection Boosted by Real-World Examples
Bo Liu ORCID logo, Hui Liu ORCID logo, Guangjie Li ORCID logo, Nan NiuORCID logo, Zimao Xu ORCID logo, Yifan Wang ORCID logo, Yunni Xia ORCID logo, Yuxia ZhangORCID logo, and Yanjie Jiang ORCID logo
(Beijing Institute of Technology, China; National Innovation Institute of Defense Technology, China; University of Cincinnati, USA; Huawei Cloud, China; Chongqing University, China; Peking University, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional

Security I

Comparison and Evaluation on Static Application Security Testing (SAST) Tools for Java
Kaixuan Li ORCID logo, Sen Chen ORCID logo, Lingling Fan ORCID logo, Ruitao Feng ORCID logo, Han Liu ORCID logo, Chengwei Liu ORCID logo, Yang Liu ORCID logo, and Yixiang Chen ORCID logo
(East China Normal University, China; Tianjin University, China; Nankai University, China; UNSW, Australia; Nanyang Technological University, Singapore)
Publisher's Version
Input-Driven Dynamic Program Debloating for Code-Reuse Attack Mitigation
Xiaoke Wang ORCID logo, Tao Hui ORCID logo, Lei Zhao ORCID logo, and Yueqiang Cheng ORCID logo
(Wuhan University, China; NIO, USA)
Publisher's Version
TransRacer: Function Dependence-Guided Transaction Race Detection for Smart Contracts
Chenyang Ma ORCID logo, Wei Song ORCID logo, and Jeff Huang ORCID logo
(Nanjing University of Science and Technology, China; Texas A&M University, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Software Composition Analysis for Vulnerability Detection: An Empirical Study on Java Projects
Lida Zhao ORCID logo, Sen Chen ORCID logo, Zhengzi Xu ORCID logo, Chengwei Liu ORCID logo, Lyuye Zhang ORCID logo, Jiahui Wu ORCID logo, Jun SunORCID logo, and Yang Liu ORCID logo
(Singapore Management University, Singapore; Tianjin University, China; Nanyang Technological University, Singapore)
Publisher's Version

Fault Diagnosis and Root Cause Analysis II

DeepDebugger: An Interactive Time-Travelling Debugging Approach for Deep Classifiers
Xianglin Yang ORCID logo, Yun Lin ORCID logo, Yifan Zhang ORCID logo, Linpeng Huang ORCID logo, Jin Song Dong ORCID logo, and Hong Mei ORCID logo
(Shanghai Jiao Tong University, China; National University of Singapore, Singapore)
Publisher's Version
Mining Resource-Operation Knowledge to Support Resource Leak Detection
Chong Wang ORCID logo, Yiling LouORCID logo, Xin Peng ORCID logo, Jianan Liu ORCID logo, and Baihan Zou ORCID logo
(Fudan University, China)
Publisher's Version
TransMap: Pinpointing Mistakes in Neural Code Translation
Bo Wang ORCID logo, Ruishi Li ORCID logo, Mingkai Li ORCID logo, and Prateek SaxenaORCID logo
(National University of Singapore, Singapore)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Reusable
Dynamic Prediction of Delays in Software Projects using Delay Patterns and Bayesian Modeling
Elvan Kula ORCID logo, Eric Greuter ORCID logo, Arie van Deursen ORCID logo, and Georgios GousiosORCID logo
(Delft University of Technology, Netherlands; ING, Netherlands)
Publisher's Version
Commit-Level, Neural Vulnerability Detection and Assessment
Yi Li ORCID logo, Aashish Yadavally ORCID logo, Jiaxing Zhang ORCID logo, Shaohua Wang ORCID logo, and Tien N. Nguyen ORCID logo
(New Jersey Institute of Technology, USA; University of Texas at Dallas, USA)
Publisher's Version

Fuzzing

Enhancing Coverage-Guided Fuzzing via Phantom Program
Mingyuan Wu ORCID logo, Kunqiu Chen ORCID logo, Qi Luo ORCID logo, Jiahong Xiang ORCID logo, Ji Qi ORCID logo, Junjie Chen ORCID logo, Heming Cui ORCID logo, and Yuqun Zhang ORCID logo
(Southern University of Science and Technology, China; University of Hong Kong, China; Tianjin University, China)
Publisher's Version
Co-dependence Aware Fuzzing for Dataflow-Based Big Data Analytics
Ahmad Humayun ORCID logo, Miryung Kim ORCID logo, and Muhammad Ali Gulzar ORCID logo
(Virginia Tech, USA; University of California at Los Angeles, USA)
Publisher's Version Published Artifact Artifacts Available
SJFuzz: Seed and Mutator Scheduling for JVM Fuzzing
Mingyuan Wu ORCID logo, Yicheng Ouyang ORCID logo, Minghai Lu ORCID logo, Junjie Chen ORCID logo, Yingquan Zhao ORCID logo, Heming Cui ORCID logo, Guowei Yang ORCID logo, and Yuqun Zhang ORCID logo
(Southern University of Science and Technology, China; University of Hong Kong, China; Tianjin University, China; University of Queensland, Australia)
Publisher's Version
Metamong: Detecting Render-Update Bugs in Web Browsers through Fuzzing
Suhwan Song ORCID logo and Byoungyoung Lee ORCID logo
(Seoul National University, South Korea)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Property-Based Fuzzing for Finding Data Manipulation Errors in Android Apps
Jingling Sun ORCID logo, Ting Su ORCID logo, Jiayi Jiang ORCID logo, Jue Wang ORCID logo, Geguang Pu ORCID logo, and Zhendong Su ORCID logo
(East China Normal University, China; Nanjing University, China; ETH Zurich, Switzerland)
Publisher's Version
Leveraging Hardware Probes and Optimizations for Accelerating Fuzz Testing of Heterogeneous Applications
Jiyuan Wang ORCID logo, Qian Zhang ORCID logo, Hongbo Rong ORCID logo, Guoqing Harry Xu ORCID logo, and Miryung Kim ORCID logo
(University of California at Los Angeles, USA; University of California at Riverside, USA; Intel Labs, USA)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Functional
NaNofuzz: A Usable Tool for Automatic Test Generation
Matthew C. DavisORCID logo, Sangheon Choi ORCID logo, Sam Estep ORCID logo, Brad A. MyersORCID logo, and Joshua SunshineORCID logo
(Carnegie Mellon University, USA; Rose-Hulman Institute of Technology, USA)
Publisher's Version Published Artifact Artifacts Available
A Generative and Mutational Approach for Synthesizing Bug-Exposing Test Cases to Guide Compiler Fuzzing
Guixin Ye ORCID logo, Tianmin Hu ORCID logo, Zhanyong Tang ORCID logo, Zhenye Fan ORCID logo, Shin Hwei Tan ORCID logo, Bo Zhang ORCID logo, Wenxiang Qian ORCID logo, and Zheng WangORCID logo
(Northwest University, China; Concordia University, Canada; Tencent, China; University of Leeds, UK)
Publisher's Version Published Artifact Artifacts Available

Formal Verification

State Merging with Quantifiers in Symbolic Execution
David Trabish ORCID logo, Noam Rinetzky ORCID logo, Sharon Shoham ORCID logo, and Vaibhav SharmaORCID logo
(Tel Aviv University, Israel; University of Minnesota, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Detecting Atomicity Violations in Interrupt-Driven Programs via Interruption Points Selecting and Delayed ISR-Triggering
Bin Yu ORCID logo, Cong Tian ORCID logo, Hengrui Xing ORCID logo, Zuchao Yang ORCID logo, Jie Su ORCID logo, Xu Lu ORCID logo, Jiyu Yang ORCID logo, Liang Zhao ORCID logo, Xiaofeng Li ORCID logo, and Zhenhua Duan ORCID logo
(Xidian University, China; Beijing Institute of Control Engineering, China)
Publisher's Version Info
Engineering a Formally Verified Automated Bug Finder
Arthur Correnson ORCID logo and Dominic Steinhöfel ORCID logo
(CISPA Helmholtz Center for Information Security, Germany)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Speeding up SMT Solving via Compiler Optimization
Benjamin Mikek ORCID logo and Qirun Zhang ORCID logo
(Georgia Institute of Technology, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable

Automated Repair II

Semantic Test Repair for Web Applications
Xiaofang Qi ORCID logo, Xiang Qian ORCID logo, and Yanhui LiORCID logo
(Southeast University, China; Nanjing University, China)
Publisher's Version
A Large-Scale Empirical Review of Patch Correctness Checking Approaches
Jun Yang ORCID logo, Yuehan Wang ORCID logo, Yiling LouORCID logo, Ming WenORCID logo, and Lingming Zhang ORCID logo
(University of Illinois at Urbana-Champaign, USA; Fudan University, China; Huazhong University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
Program Repair Guided by Datalog-Defined Static Analysis
Yu Liu ORCID logo, Sergey Mechtaev ORCID logo, Pavle Subotić ORCID logo, and Abhik RoychoudhuryORCID logo
(National University of Singapore, Singapore; University College London, UK; Microsoft, Serbia)
Publisher's Version
Baldur: Whole-Proof Generation and Repair with Large Language Models
Emily First ORCID logo, Markus N. Rabe ORCID logo, Talia Ringer ORCID logo, and Yuriy BrunORCID logo
(University of Massachusetts, USA; Augment Computing, USA; University of Illinois at Urbana-Champaign, USA)
Publisher's Version
KG4CraSolver: Recommending Crash Solutions via Knowledge Graph
Xueying Du ORCID logo, Yiling LouORCID logo, Mingwei LiuORCID logo, Xin Peng ORCID logo, and Tianyong Yang ORCID logo
(Fudan University, China)
Publisher's Version Info
Automated and Context-Aware Repair of Color-Related Accessibility Issues for Android Apps
Yuxin Zhang ORCID logo, Sen Chen ORCID logo, Lingling Fan ORCID logo, Chunyang Chen ORCID logo, and Xiaohong Li ORCID logo
(Tianjin University, China; Nankai University, China; Monash University, Australia)
Publisher's Version Info

Human Aspects III

A Case Study of Developer Bots: Motivations, Perceptions, and Challenges
Sumit Asthana ORCID logo, Hitesh Sajnani ORCID logo, Elena Voyloshnikova ORCID logo, Birendra Acharya ORCID logo, and Kim Herzig ORCID logo
(University of Michigan, USA; Trade Desk, USA; Microsoft, USA)
Publisher's Version Published Artifact Artifacts Available
“We Feel Like We’re Winging It:” A Study on Navigating Open-Source Dependency Abandonment
Courtney MillerORCID logo, Christian KästnerORCID logo, and Bogdan VasilescuORCID logo
(Carnegie Mellon University, USA)
Publisher's Version
How Practitioners Expect Code Completion?
Chaozheng Wang ORCID logo, Junhao Hu ORCID logo, Cuiyun Gao ORCID logo, Yu Jin ORCID logo, Tao Xie ORCID logo, Hailiang Huang ORCID logo, Zhenyu Lei ORCID logo, and Yuetang Deng ORCID logo
(Chinese University of Hong Kong, China; Peking University, China; Tencent, USA; Tencent, China)
Publisher's Version

Testing IV

Code Coverage Criteria for Asynchronous Programs
Mohammad Ganji ORCID logo, Saba Alimadadi ORCID logo, and Frank Tip ORCID logo
(Simon Fraser University, Canada; Northeastern University, USA)
Publisher's Version Published Artifact Artifacts Available
API-Knowledge Aware Search-Based Software Testing: Where, What, and How
Xiaoxue Ren ORCID logo, Xinyuan Ye ORCID logo, Yun Lin ORCID logo, Zhenchang Xing ORCID logo, Shuqing Li ORCID logo, and Michael R. Lyu ORCID logo
(Zhejiang University, China; Australian National University, Australia; Shanghai Jiao Tong University, China; CSIRO’s Data61, Australia; Chinese University of Hong Kong, China)
Publisher's Version
EtherDiffer: Differential Testing on RPC Services of Ethereum Nodes
Shinhae Kim ORCID logo and Sungjae Hwang ORCID logo
(Affiliated Institute of ETRI, South Korea; Sungkyunkwan University, South Korea)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional

Machine Learning IV

Dynamic Data Fault Localization for Deep Neural Networks
Yining Yin ORCID logo, Yang Feng ORCID logo, Shihao Weng ORCID logo, Zixi Liu ORCID logo, Yuan Yao ORCID logo, Yichi Zhang ORCID logo, Zhihong Zhao ORCID logo, and Zhenyu ChenORCID logo
(Nanjing University, China)
Publisher's Version Published Artifact Info Artifacts Available Artifacts Functional
Understanding the Bug Characteristics and Fix Strategies of Federated Learning Systems
Xiaohu Du ORCID logo, Xiao Chen ORCID logo, Jialun Cao ORCID logo, Ming WenORCID logo, Shing-Chi CheungORCID logo, and Hai Jin ORCID logo
(Huazhong University of Science and Technology, China; Hong Kong University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Learning Program Semantics for Vulnerability Detection via Vulnerability-Specific Inter-procedural Slicing
Bozhi Wu ORCID logo, Shangqing Liu ORCID logo, Yang Xiao ORCID logo, Zhiming Li ORCID logo, Jun SunORCID logo, and Shang-Wei Lin ORCID logo
(Singapore Management University, Singapore; Nanyang Technological University, Singapore; Chinese Academy of Sciences, China)
Publisher's Version
DeepRover: A Query-Efficient Blackbox Attack for Deep Neural Networks
Fuyuan Zhang ORCID logo, Xinwen Hu ORCID logo, Lei Ma ORCID logo, and Jianjun Zhao ORCID logo
(Kyushu University, Japan; Hunan Normal University, China; University of Tokyo, Japan; University of Alberta, Canada)
Publisher's Version

Program Analysis III

Practical Inference of Nullability Types
Nima Karimipour ORCID logo, Justin Pham ORCID logo, Lazaro Clapp ORCID logo, and Manu Sridharan ORCID logo
(University of California, Riverside, USA; Uber Technologies, USA)
Publisher's Version Published Artifact Artifacts Available Artifacts Functional
LibKit: Detecting Third-Party Libraries in iOS Apps
Daniel Domínguez-Álvarez ORCID logo, Alejandro de la Cruz ORCID logo, Alessandra GorlaORCID logo, and Juan Caballero ORCID logo
(IMDEA Software Institute, Spain; University of Verona, Italy)
Publisher's Version Published Artifact Info Artifacts Available
FunProbe: Probing Functions from Binary Code through Probabilistic Analysis
Soomin Kim ORCID logo, Hyungseok Kim ORCID logo, and Sang Kil Cha ORCID logo
(KAIST, South Korea)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
BigDataflow: A Distributed Interprocedural Dataflow Analysis Framework
Zewen Sun ORCID logo, Duanchen Xu ORCID logo, Yiyu Zhang ORCID logo, Yun Qi ORCID logo, Yueyang Wang ORCID logo, Zhiqiang ZuoORCID logo, Zhaokang Wang ORCID logo, Yue Li ORCID logo, Xuandong Li ORCID logo, Qingda Lu ORCID logo, Wenwen Peng ORCID logo, and Shengjian Guo ORCID logo
(Nanjing University, China; Alibaba Group, USA; Alibaba Group, China; Baidu Research, USA)
Publisher's Version Published Artifact Artifacts Available

Empirical Studies II

Understanding the Topics and Challenges of GPU Programming by Classifying and Analyzing Stack Overflow Posts
Wenhua Yang ORCID logo, Chong Zhang ORCID logo, and Minxue PanORCID logo
(Nanjing University of Aeronautics and Astronautics, China; Nanjing University, China)
Publisher's Version
Software Architecture in Practice: Challenges and Opportunities
Zhiyuan WanORCID logo, Yun Zhang ORCID logo, Xin Xia ORCID logo, Yi Jiang ORCID logo, and David LoORCID logo
(Zhejiang University, China; Hangzhou City University, China; Huawei, China; Singapore Management University, Singapore)
Publisher's Version

Models of Code and Documentation

On the Usage of Continual Learning for Out-of-Distribution Generalization in Pre-trained Language Models of Code
Martin Weyssow ORCID logo, Xin Zhou ORCID logo, Kisub Kim ORCID logo, David LoORCID logo, and Houari Sahraoui ORCID logo
(Université de Montréal, Canada; Singapore Management University, Singapore)
Publisher's Version Published Artifact Artifacts Available
Grace: Language Models Meet Code Edits
Priyanshu GuptaORCID logo, Avishree Khare ORCID logo, Yasharth Bajpai ORCID logo, Saikat Chakraborty ORCID logo, Sumit GulwaniORCID logo, Aditya Kanade ORCID logo, Arjun Radhakrishna ORCID logo, Gustavo Soares ORCID logo, and Ashish Tiwari ORCID logo
(Microsoft, India; University of Pennsylvania, USA; Microsoft Research, USA; Microsoft, USA; Microsoft Research, India)
Publisher's Version Published Artifact Archive submitted (770 kB) Artifacts Available
Recommending Analogical APIs via Knowledge Graph Embedding
Mingwei LiuORCID logo, Yanjun Yang ORCID logo, Yiling LouORCID logo, Xin Peng ORCID logo, Zhong Zhou ORCID logo, Xueying Du ORCID logo, and Tianyong Yang ORCID logo
(Fudan University, China)
Publisher's Version Info
CCT5: A Code-Change-Oriented Pre-trained Model
Bo Lin ORCID logo, Shangwen WangORCID logo, Zhongxin LiuORCID logo, Yepang Liu ORCID logo, Xin Xia ORCID logo, and Xiaoguang Mao ORCID logo
(National University of Defense Technology, China; Zhejiang University, China; Southern University of Science and Technology, China)
Publisher's Version Published Artifact Artifacts Available

Machine Learning V

LExecutor: Learning-Guided Execution
Beatriz Souza ORCID logo and Michael Pradel ORCID logo
(University of Stuttgart, Germany)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
Software Architecture Recovery with Information Fusion
Yiran Zhang ORCID logo, Zhengzi Xu ORCID logo, Chengwei Liu ORCID logo, Hongxu Chen ORCID logo, Jianwen Sun ORCID logo, Dong Qiu ORCID logo, and Yang Liu ORCID logo
(Nanyang Technological University, Singapore; Huawei Technologies, China)
Publisher's Version
Evaluating Transfer Learning for Simplifying GitHub READMEs
Haoyu Gao ORCID logo, Christoph TreudeORCID logo, and Mansooreh Zahedi ORCID logo
(University of Melbourne, Australia)
Publisher's Version
CodeMark: Imperceptible Watermarking for Code Datasets against Neural Code Completion Models
Zhensu Sun ORCID logo, Xiaoning Du ORCID logo, Fu Song ORCID logo, and Li Li ORCID logo
(Beihang University, China; Monash University, Australia; Institute of Software at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Automotive Software Innovation Center, China)
Publisher's Version

Security II

Mate! Are You Really Aware? An Explainability-Guided Testing Framework for Robustness of Malware Detectors
Ruoxi Sun ORCID logo, Minhui Xue ORCID logo, Gareth Tyson ORCID logo, Tian Dong ORCID logo, Shaofeng Li ORCID logo, Shuo Wang ORCID logo, Haojin Zhu ORCID logo, Seyit Camtepe ORCID logo, and Surya Nepal ORCID logo
(CSIRO’s Data61, Australia; Cybersecurity CRC, Australia; Hong Kong University of Science and Technology, China; Shanghai Jiao Tong University, China; Peng Cheng Laboratory, China)
Publisher's Version Published Artifact Artifacts Available
Crystallizer: A Hybrid Path Analysis Framework to Aid in Uncovering Deserialization Vulnerabilities
Prashast Srivastava ORCID logo, Flavio Toffalini ORCID logo, Kostyantyn Vorobyov ORCID logo, François Gauthier ORCID logo, Antonio Bianchi ORCID logo, and Mathias Payer ORCID logo
(Purdue University, USA; EPFL, Switzerland; Oracle Labs, Australia)
Publisher's Version Published Artifact Artifacts Available Artifacts Reusable
ViaLin: Path-Aware Dynamic Taint Analysis for Android
Khaled Ahmed ORCID logo, Yingying Wang ORCID logo, Mieszko Lis ORCID logo, and Julia RubinORCID logo
(University of British Columbia, Canada)
Publisher's Version
Distinguishing Look-Alike Innocent and Vulnerable Code by Subtle Semantic Representation Learning and Explanation
Chao NiORCID logo, Xin Yin ORCID logo, Kaiwen Yang ORCID logo, Dehai Zhao ORCID logo, Zhenchang Xing ORCID logo, and Xin Xia ORCID logo
(Zhejiang University, China; Australian National University, Australia; CSIRO’s Data61, Australia; Huawei, China)
Publisher's Version

Industry

Industry Papers

A Unified Framework for Mini-game Testing: Experience on WeChat
Chaozheng Wang ORCID logo, Haochuan Lu ORCID logo, Cuiyun Gao ORCID logo, Zongjie Li ORCID logo, Ting Xiong ORCID logo, and Yuetang Deng ORCID logo
(Chinese University of Hong Kong, China; Tencent, China; Hong Kong University of Science and Technology, China)
Publisher's Version
Beyond Sharing: Conflict-Aware Multivariate Time Series Anomaly Detection
Haotian Si ORCID logo, Changhua Pei ORCID logo, Zhihan Li ORCID logo, Yadong Zhao ORCID logo, Jingjing Li ORCID logo, Haiming Zhang ORCID logo, Zulong Diao ORCID logo, Jianhui Li ORCID logo, Gaogang Xie ORCID logo, and Dan Pei ORCID logo
(Computer Network Information Center at Chinese Academy of Sciences, China; University of Chinese Academy of Sciences, China; Kuaishou Technology, China; Institute of Computing Technology at Chinese Academy of Sciences, China; Purple Mountain Laboratories, China; Tsinghua University, China)
Publisher's Version Info
InferFix: End-to-End Program Repair with LLMs
Matthew Jin ORCID logo, Syed Shahriar ORCID logo, Michele Tufano ORCID logo, Xin Shi ORCID logo, Shuai Lu ORCID logo, Neel Sundaresan ORCID logo, and Alexey Svyatkovskiy ORCID logo
(Microsoft, USA; University of California at Los Angeles, USA; Microsoft Research, China)
Publisher's Version
Assess and Summarize: Improve Outage Understanding with Large Language Models
Pengxiang Jin ORCID logo, Shenglin Zhang ORCID logo, Minghua MaORCID logo, Haozhe Li ORCID logo, Yu Kang ORCID logo, Liqun Li ORCID logo, Yudong Liu ORCID logo, Bo Qiao ORCID logo, Chaoyun Zhang ORCID logo, Pu Zhao ORCID logo, Shilin HeORCID logo, Federica SarroORCID logo, Yingnong Dang ORCID logo, Saravan Rajmohan ORCID logo, Qingwei Lin ORCID logo, and Dongmei Zhang ORCID logo
(Nankai University, China; Microsoft, China; Peking University, China; University College London, UK)
Publisher's Version
Understanding Hackers’ Work: An Empirical Study of Offensive Security Practitioners
Andreas Happe ORCID logo and Jürgen Cito ORCID logo
(TU Wien, Austria)
Publisher's Version Published Artifact Artifacts Available
Towards Efficient Record and Replay: A Case Study in WeChat
Sidong Feng ORCID logo, Haochuan Lu ORCID logo, Ting Xiong ORCID logo, Yuetang Deng ORCID logo, and Chunyang Chen ORCID logo
(Monash University, Australia; Tencent, China)
Publisher's Version
Last Diff Analyzer: Multi-language Automated Approver for Behavior-Preserving Code Revisions
Yuxin Wang ORCID logo, Adam Welc ORCID logo, Lazaro Clapp ORCID logo, and Lingchao Chen ORCID logo
(Uber Technologies, USA; Mysten Labs, USA)
Publisher's Version Published Artifact Artifacts Available
Dead Code Removal at Meta: Automatically Deleting Millions of Lines of Code and Petabytes of Deprecated Data
Will Shackleton ORCID logo, Katriel Cohn-Gordon ORCID logo, Peter C. Rigby ORCID logo, Rui Abreu ORCID logo, James Gill ORCID logo, Nachiappan Nagappan ORCID logo, Karim Nakad ORCID logo, Ioannis Papagiannis ORCID logo, Luke Petre ORCID logo, Giorgi Megreli ORCID logo, Patrick Riggs ORCID logo, and James Saindon ORCID logo
(Meta, USA; Concordia University, Canada)
Publisher's Version
Incrementalizing Production CodeQL Analyses
Tamás Szabó ORCID logo
(GitHub, Germany)
Publisher's Version
xASTNN: Improved Code Representations for Industrial Practice
Zhiwei Xu ORCID logo, Min Zhou ORCID logo, Xibin Zhao ORCID logo, Yang Chen ORCID logo, Xi Cheng ORCID logo, and Hongyu Zhang ORCID logo
(Tsinghua University, China; Fudan University, China; VMware, China; Chongqing University, China)
Publisher's Version
From Point-wise to Group-wise: A Fast and Accurate Microservice Trace Anomaly Detection Approach
Zhe Xie ORCID logo, Changhua Pei ORCID logo, Wanxue Li ORCID logo, Huai Jiang ORCID logo, Liangfei Su ORCID logo, Jianhui Li ORCID logo, Gaogang Xie ORCID logo, and Dan Pei ORCID logo
(Tsinghua University, China; Computer Network Information Center at Chinese Academy of Sciences, China; eBay, China)
Publisher's Version
STEAM: Observability-Preserving Trace Sampling
Shilin HeORCID logo, Botao Feng ORCID logo, Liqun Li ORCID logo, Xu Zhang ORCID logo, Yu Kang ORCID logo, Qingwei Lin ORCID logo, Saravan Rajmohan ORCID logo, and Dongmei Zhang ORCID logo
(Microsoft Research, Beijing, China; Microsoft, Beijing, China; Microsoft, USA)
Publisher's Version
TraceDiag: Adaptive, Interpretable, and Efficient Root Cause Analysis on Large-Scale Microservice Systems
Ruomeng Ding ORCID logo, Chaoyun Zhang ORCID logo, Lu Wang ORCID logo, Yong Xu ORCID logo, Minghua MaORCID logo, Xiaomin Wu ORCID logo, Meng Zhang ORCID logo, Qingjun Chen ORCID logo, Xin Gao ORCID logo, Xuedong Gao ORCID logo, Hao Fan ORCID logo, Saravan Rajmohan ORCID logo, Qingwei Lin ORCID logo, and Dongmei Zhang ORCID logo
(Microsoft, China; Microsoft 365, China; Microsoft 365, USA)
Publisher's Version
Triggering Modes in Spectrum-Based Multi-location Fault Localization
Tung Dao ORCID logo, Na Meng ORCID logo, and ThanhVu Nguyen ORCID logo
(Cvent, USA; Virginia Tech, USA; George Mason University, USA)
Publisher's Version Info
Appaction: Automatic GUI Interaction for Mobile Apps via Holistic Widget Perception
Yongxiang Hu ORCID logo, Jiazhen Gu ORCID logo, Shuqing Hu ORCID logo, Yu Zhang ORCID logo, Wenjie Tian ORCID logo, Shiyu Guo ORCID logo, Chaoyi Chen ORCID logo, and Yangfan Zhou ORCID logo
(Fudan University, China; Meituan, China; Shanghai Key Laboratory of Intelligent Information Processing, China)
Publisher's Version
MuRS: Mutant Ranking and Suppression using Identifier Templates
Zimin Chen ORCID logo, Małgorzata Salawa ORCID logo, Manushree Vijayvergiya ORCID logo, Goran Petrović ORCID logo, Marko Ivanković ORCID logo, and René Just ORCID logo
(KTH Royal Institute of Technology, Sweden; Google, Switzerland; University of Washington, USA)
Publisher's Version
Modeling the Centrality of Developer Output with Software Supply Chains
Audris Mockus ORCID logo, Peter C. Rigby ORCID logo, Rui Abreu ORCID logo, Parth Suresh ORCID logo, Yifen Chen ORCID logo, and Nachiappan Nagappan ORCID logo
(Meta, USA; University of Tennessee, USA; Concordia University, Canada)
Publisher's Version
On-Premise AIOps Infrastructure for a Software Editor SME: An Experience Report
Anes Bendimerad ORCID logo, Youcef Remil ORCID logo, Romain Mathonat ORCID logo, and Mehdi Kaytoue ORCID logo
(Infologic, France; INSA Lyon, France; CNRS, France; LIRIS UMR5205, France)
Publisher's Version
C³: Code Clone-Based Identification of Duplicated Components
Yanming Yang ORCID logo, Ying Zou ORCID logo, Xing Hu ORCID logo, David LoORCID logo, Chao NiORCID logo, John Grundy ORCID logo, and Xin Xia ORCID logo
(Zhejiang University, China; Queen’s University, Canada; Singapore Management University, Singapore; Monash University, Australia; Huawei, China)
Publisher's Version
AdaptivePaste: Intelligent Copy-Paste in IDE
Xiaoyu Liu ORCID logo, Jinu Jang ORCID logo, Neel Sundaresan ORCID logo, Miltiadis Allamanis ORCID logo, and Alexey Svyatkovskiy ORCID logo
(Microsoft, USA; Google, UK)
Publisher's Version
Adapting Performance Analytic Techniques in a Real-World Database-Centric System: An Industrial Experience Report
Lizhi Liao ORCID logo, Heng Li ORCID logo, Weiyi Shang ORCID logo, Catalin Sporea ORCID logo, Andrei Toma ORCID logo, and Sarah Sajedi ORCID logo
(University of Waterloo, Canada; Polytechnique Montréal, Canada; ERA Environmental, Canada)
Publisher's Version
KDDT: Knowledge Distillation-Empowered Digital Twin for Anomaly Detection
Qinghua Xu ORCID logo, Shaukat AliORCID logo, Tao Yue ORCID logo, Zaimovic Nedim ORCID logo, and Inderjeet Singh ORCID logo
(Simula Research Laboratory, Norway; University of Oslo, Norway; Oslo Metropolitan University, Norway; Alstom Rail, Sweden)
Publisher's Version
AG3: Automated Game GUI Text Glitch Detection Based on Computer Vision
Xiaoyun Liang ORCID logo, Jiayi Qi ORCID logo, Yongqiang Gao ORCID logo, Chao PengORCID logo, and Ping Yang ORCID logo
(ByteDance, China)
Publisher's Version
Detection Is Better Than Cure: A Cloud Incidents Perspective
Vaibhav Ganatra ORCID logo, Anjaly Parayil ORCID logo, Supriyo Ghosh ORCID logo, Yu Kang ORCID logo, Minghua MaORCID logo, Chetan Bansal ORCID logo, Suman NathORCID logo, and Jonathan Mace ORCID logo
(Microsoft, India; Microsoft, China; Microsoft, USA)
Publisher's Version
PropProof: Free Model-Checking Harnesses from PBT
Yoshiki TakashimaORCID logo
(Carnegie Mellon University, USA)
Publisher's Version
LightF3: A Lightweight Fully-Process Formal Framework for Automated Verifying Railway Interlocking Systems
Yibo Dong ORCID logo, Xiaoyu Zhang ORCID logo, Yicong Xu ORCID logo, Chang Cai ORCID logo, Yu Chen ORCID logo, Weikai Miao ORCID logo, Jianwen Li ORCID logo, and Geguang Pu ORCID logo
(East China Normal University, China; Shanghai Trusted Industrial Control Platform, China)
Publisher's Version Published Artifact Artifacts Available
BFSig: Leveraging File Significance in Bus Factor Estimation
Vahid Haratian ORCID logo, Mikhail Evtikhiev ORCID logo, Pouria Derakhshanfar ORCID logo, Eray TüzünORCID logo, and Vladimir KovalenkoORCID logo
(Bilkent University, Turkiye; JetBrains Research, Cyprus; JetBrains Research, Netherlands)
Publisher's Version
Automated Test Generation for Medical Rules Web Services: A Case Study at the Cancer Registry of Norway
Christoph Laaber ORCID logo, Tao Yue ORCID logo, Shaukat AliORCID logo, Thomas Schwitalla ORCID logo, and Jan F. Nygård ORCID logo
(Simula Research Laboratory, Norway; Oslo Metropolitan University, Norway; Cancer Registry of Norway, Norway; UiT The Arctic University of Norway, Norway)
Publisher's Version
Test Case Generation for Drivability Requirements of an Automotive Cruise Controller: An Experience with an Industrial Simulator
Federico Formica ORCID logo, Nicholas Petrunti ORCID logo, Lucas Bruck ORCID logo, Vera Pantelic ORCID logo, Mark Lawford ORCID logo, and Claudio Menghi ORCID logo
(McMaster University, Canada; University of Bergamo, Italy)
Publisher's Version
Prioritizing Natural Language Test Cases Based on Highly-Used Game Features
Markos Viggiato ORCID logo, Dale Paas ORCID logo, and Cor-Paul Bezemer ORCID logo
(University of Alberta, Canada; Prodigy Education, Canada)
Publisher's Version
EvoCLINICAL: Evolving Cyber-Cyber Digital Twin with Active Transfer Learning for Automated Cancer Registry System
Chengjie Lu ORCID logo, Qinghua Xu ORCID logo, Tao Yue ORCID logo, Shaukat AliORCID logo, Thomas Schwitalla ORCID logo, and Jan F. Nygård ORCID logo
(Simula Research Laboratory, Norway; University of Oslo, Norway; Oslo Metropolitan University, Norway; Cancer Registry of Norway, Norway; Arctic University of Norway, Norway)
Publisher's Version
Compositional Taint Analysis for Enforcing Security Policies at Scale
Subarno Banerjee ORCID logo, Siwei Cui ORCID logo, Michael Emmi ORCID logo, Antonio Filieri ORCID logo, Liana Hadarean ORCID logo, Peixuan Li ORCID logo, Linghui Luo ORCID logo, Goran Piskachev ORCID logo, Nicolás Rosner ORCID logo, Aritra Sengupta ORCID logo, Omer Tripp ORCID logo, and Jingbo Wang ORCID logo
(Amazon Web Services, USA; Texas A&M University, USA; Amazon Web Services, Germany; University of Southern California, USA)
Publisher's Version
A Multidimensional Analysis of Bug Density in SAP HANA
Julian Reck ORCID logo, Thomas Bach ORCID logo, and Jan Stoess ORCID logo
(SAP, Germany; University of Applied Sciences Karlsruhe, Germany)
Publisher's Version Archive submitted (420 kB)
Ownership in the Hands of Accountability at Brightsquid: A Case Study and a Developer Survey
Umme Ayman Koana ORCID logo, Francis Chew ORCID logo, Chris Carlson ORCID logo, and Maleknaz Nayebi ORCID logo
(York University, Canada; Brightsquid, Canada)
Publisher's Version

Industry Short Papers

Rotten Green Tests in Google Test
Paul T. Robinson ORCID logo
(Sony Interactive Entertainment, USA)
Publisher's Version
Issue Report Validation in an Industrial Context
Ethem Utku Aktas ORCID logo, Ebru Cakmak ORCID logo, Mete Cihad Inan ORCID logo, and Cemal Yilmaz ORCID logo
(Softtech Research and Development, Turkiye; Microsoft EMEA, Turkiye; Sabanci University, Turkiye)
Publisher's Version
On the Dual Nature of Necessity in Use of Rust Unsafe Code
Yuchen Zhang ORCID logo, Ashish Kundu ORCID logo, Georgios Portokalidis ORCID logo, and Jun Xu ORCID logo
(Stevens Institute of Technology, USA; Cisco Research, USA; University of Utah, USA)
Publisher's Version
Analyzing Microservice Connectivity with Kubesonde
Jacopo Bufalino ORCID logo, Mario Di Francesco ORCID logo, and Tuomas Aura ORCID logo
(Aalto University, Finland; Eficode, Finland)
Publisher's Version
Testing Real-World Healthcare IoT Application: Experiences and Lessons Learned
Hassan Sartaj ORCID logo, Shaukat AliORCID logo, Tao Yue ORCID logo, and Kjetil Moberg ORCID logo
(Simula Research Laboratory, Norway; Oslo Metropolitan University, Norway; Norwegian Health Authority, Norway)
Publisher's Version
Diffusion-Based Time Series Data Imputation for Cloud Failure Prediction at Microsoft 365
Fangkai Yang ORCID logo, Wenjie Yin ORCID logo, Lu Wang ORCID logo, Tianci Li ORCID logo, Pu Zhao ORCID logo, Bo Liu ORCID logo, Paul Wang ORCID logo, Bo Qiao ORCID logo, Yudong Liu ORCID logo, Mårten Björkman ORCID logo, Saravan Rajmohan ORCID logo, Qingwei Lin ORCID logo, and Dongmei Zhang ORCID logo
(Microsoft, China; KTH Royal Institute of Technology, Sweden; Microsoft, USA)
Publisher's Version
The Most Agile Teams Are the Most Disciplined: On Scaling out Agile Development
Zheng Li ORCID logo and Austen Rainer ORCID logo
(Queen's University Belfast, UK)
Publisher's Version

Ideas, Visions, and Reflections

Contribution-Based Firing of Developers?
Vincenzo Orrei ORCID logo, Marco Raglianti ORCID logo, Csaba Nagy ORCID logo, and Michele Lanza ORCID logo
(USI Lugano, Switzerland)
Publisher's Version
Keeping Mutation Test Suites Consistent and Relevant with Long-Standing Mutants
Milos Ojdanic ORCID logo, Mike Papadakis ORCID logo, and Mark HarmanORCID logo
(University of Luxembourg, Luxembourg; Meta Platforms, UK; University College London, UK)
Publisher's Version
Towards Top-Down Automated Development in Limited Scopes: A Neuro-Symbolic Framework from Expressibles to Executables
Jian Gu ORCID logo and Harald C. GallORCID logo
(Monash University, Australia; University of Zurich, Switzerland)
Publisher's Version
Lessons from the Long Tail: Analysing Unsafe Dependency Updates across Software Ecosystems
Supatsara Wattanakriengkrai ORCID logo, Raula Gaikovina KulaORCID logo, Christoph TreudeORCID logo, and Kenichi Matsumoto ORCID logo
(NAIST, Japan; University of Melbourne, Australia)
Publisher's Version
Getting pwn’d by AI: Penetration Testing with Large Language Models
Andreas Happe ORCID logo and Jürgen Cito ORCID logo
(TU Wien, Austria)
Publisher's Version Info
Towards Feature-Based Analysis of the Machine Learning Development Lifecycle
Boyue Caroline Hu ORCID logo and Marsha Chechik ORCID logo
(University of Toronto, Canada)
Publisher's Version
Exploring Moral Principles Exhibited in OSS: A Case Study on GitHub Heated Issues
Ramtin Ehsani ORCID logo, Rezvaneh Rezapour ORCID logo, and Preetha Chatterjee ORCID logo
(Drexel University, USA)
Publisher's Version
Towards Understanding Emotions in Informal Developer Interactions: A Gitter Chat Study
Amirali Sajadi ORCID logo, Kostadin Damevski ORCID logo, and Preetha Chatterjee ORCID logo
(Drexel University, USA; Virginia Commonwealth University, USA)
Publisher's Version
Towards Strengthening Formal Specifications with Mutation Model Checking
Maxime Cordy ORCID logo, Sami Lazreg ORCID logo, Axel Legay ORCID logo, and Pierre Yves Schobbens ORCID logo
(University of Luxembourg, Luxembourg; Université Catholique de Louvain, Belgium; University of Namur, Belgium)
Publisher's Version
Assisting Static Analysis with Large Language Models: A ChatGPT Experiment
Haonan Li ORCID logo, Yu Hao ORCID logo, Yizhuo Zhai ORCID logo, and Zhiyun Qian ORCID logo
(University of California at Riverside, USA)
Publisher's Version
Reflecting on the Use of the Policy-Process-Product Theory in Empirical Software Engineering
Kelechi G. Kalu ORCID logo, Taylor R. Schorlemmer ORCID logo, Sophie Chen ORCID logo, Kyle A. Robinson ORCID logo, Erik Kocinare ORCID logo, and James C. DavisORCID logo
(Purdue University, USA; University of Michigan, USA)
Publisher's Version
A Vision on Intentions in Software Engineering
Jacob Krüger ORCID logo, Yi LiORCID logo, Chenguang Zhu ORCID logo, Marsha Chechik ORCID logo, Thorsten Berger ORCID logo, and Julia RubinORCID logo
(Eindhoven University of Technology, Netherlands; Nanyang Technological University, Singapore; University of Texas at Austin, USA; University of Toronto, Canada; Ruhr University Bochum, Germany; Chalmers - University of Gothenburg, Sweden; University of British Columbia, Canada)
Publisher's Version
Deeper Notions of Correctness in Image-Based DNNs: Lifting Properties from Pixel to Entities
Felipe Toledo ORCID logo, David Shriver ORCID logo, Sebastian Elbaum ORCID logo, and Matthew B. Dwyer ORCID logo
(University of Virginia, USA)
Publisher's Version

Demonstrations

LazyCow: A Lightweight Crowdsourced Testing Tool for Taming Android Fragmentation
Xiaoyu Sun ORCID logo, Xiao Chen ORCID logo, Yonghui Liu ORCID logo, John Grundy ORCID logo, and Li Li ORCID logo
(Australian National University, Australia; Monash University, Australia; Beihang University, China)
Publisher's Version
npm-follower: A Complete Dataset Tracking the NPM Ecosystem
Donald Pinckney ORCID logo, Federico Cassano ORCID logo, Arjun Guha ORCID logo, and Jonathan Bell ORCID logo
(Northeastern University, USA)
Publisher's Version
Ad Hoc Syntax-Guided Program Reduction
Jia Le Tian ORCID logo, Mengxiao Zhang ORCID logo, Zhenyang Xu ORCID logo, Yongqiang Tian ORCID logo, Yiwen Dong ORCID logo, and Chengnian Sun ORCID logo
(University of Waterloo, Canada)
Publisher's Version Video
On Using Information Retrieval to Recommend Machine Learning Good Practices for Software Engineers
Laura Cabra-Acela ORCID logo, Anamaria Mojica-Hanke ORCID logo, Mario Linares-VásquezORCID logo, and Steffen Herbold ORCID logo
(University of Los Andes, Colombia; University of Passau, Germany)
Publisher's Version Published Artifact Video Info Artifacts Available
Helion: Enabling Natural Testing of Smart Homes
Prianka Mandal ORCID logo, Sunil Manandhar ORCID logo, Kaushal Kafle ORCID logo, Kevin Moran ORCID logo, Denys PoshyvanykORCID logo, and Adwait Nadkarni ORCID logo
(College of William and Mary, USA; IBM Research, USA; University of Central Florida, USA)
Publisher's Version
A Language Model of Java Methods with Train/Test Deduplication
Chia-Yi Su ORCID logo, Aakash Bansal ORCID logo, Vijayanta Jain ORCID logo, Sepideh Ghanavati ORCID logo, and Collin McMillan ORCID logo
(University of Notre Dame, USA; University of Maine, USA)
Publisher's Version Info
DENT: A Tool for Tagging Stack Overflow Posts with Deep Learning Energy Patterns
Shriram Shanbhag ORCID logo, Sridhar Chimalakonda ORCID logo, Vibhu Saujanya Sharma ORCID logo, and Vikrant Kaulgud ORCID logo
(IIT Tirupati, India; Accenture Labs, India)
Publisher's Version
MASC: A Tool for Mutation-Based Evaluation of Static Crypto-API Misuse Detectors
Amit Seal AmiORCID logo, Syed Yusuf Ahmed ORCID logo, Radowan Mahmud Redoy ORCID logo, Nathan Cooper ORCID logo, Kaushal Kafle ORCID logo, Kevin Moran ORCID logo, Denys Poshyvanyk ORCID logo, and Adwait Nadkarni ORCID logo
(College of William and Mary, USA; University of Dhaka, Bangladesh; University of Central Florida, USA)
Publisher's Version
llvm2CryptoLine: Verifying Arithmetic in Cryptographic C Programs
Ruiling Chen ORCID logo, Jiaxiang Liu ORCID logo, Xiaomu Shi ORCID logo, Ming-Hsien Tsai ORCID logo, Bow-Yaw Wang ORCID logo, and Bo-Yin Yang ORCID logo
(Shenzhen University, China; Institute of Software at Chinese Academy of Sciences, China; National Institute of Cyber Security, Taiwan; Academia Sinica, Taiwan)
Publisher's Version Video Info
P4b: A Translator from P4 Programs to Boogie
Chong Ye ORCID logo and Fei HeORCID logo
(Tsinghua University, China)
Publisher's Version Video Info
D2S2: Drag ’n’ Drop Mobile App Screen Search
Soumik Mohian ORCID logo, Tony Tang ORCID logo, Tuan Trinh ORCID logo, Don Dang ORCID logo, and Christoph Csallner ORCID logo
(University of Texas at Arlington, USA)
Publisher's Version Video
CONAN: Statically Detecting Connectivity Issues in Android Applications
Alejandro Mazuera-Rozo ORCID logo, Camilo Escobar-VelásquezORCID logo, Juan Espitia-Acero ORCID logo, Mario Linares-VásquezORCID logo, and Gabriele BavotaORCID logo
(USI Lugano, Switzerland; University of Los Andes, Colombia)
Publisher's Version Video Info

Student Research Competition

A Data Set of Extracted Rationale from Linux Kernel Commit Messages
Mouna Dhaouadi ORCID logo
(Université de Montréal, Canada)
Publisher's Version
Detecting Overfitting of Machine Learning Techniques for Automatic Vulnerability Detection
Niklas Risse ORCID logo
(MPI-SP, Germany)
Publisher's Version
Detection of Optimizations Missed by the Compiler
Yi Zhang ORCID logo
(Nanjing University, China)
Publisher's Version
Do All Software Projects Die When Not Maintained? Analyzing Developer Maintenance to Predict OSS Usage
Emily Nguyen ORCID logo
(University of California at Los Angeles, USA)
Publisher's Version
Inferring Complexity Bounds from Recurrence Relations
Didier Ishimwe ORCID logo
(George Mason University, USA)
Publisher's Version
LLM-Based Code Generation Method for Golang Compiler Testing
Qiuhan GuORCID logo
(Nanjing University, China)
Publisher's Version
Privacy-Centric Log Parsing for Timely, Proactive Personal Data Protection
Issam Sedki ORCID logo
(Concordia University, Canada)
Publisher's Version
STraceBERT: Source Code Retrieval using Semantic Application Traces
Claudio Spiess ORCID logo
(University of California at Davis, USA)
Publisher's Version
The Call Graph Chronicles: Unleashing the Power Within
Masudul Hasan Masud Bhuiyan ORCID logo
(CISPA Helmholtz Center for Information Security, Germany)
Publisher's Version
The State of Survival in OSS: The Impact of Diversity
Zixuan Feng ORCID logo
(Oregon State University, USA)
Publisher's Version

proc time: 45.33