A B C D F H J K L S T W Y

	Acher, Mathieu	AIRE '15: "Using Fuzzy Modeling for Consistent ..." Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher (University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France) @InProceedings{AIRE15p17, author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher}, title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {17-16}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid2-p doi:
	Biswas, Kanad K.	AIRE '15: "From Natural Language Requirements ..." From Natural Language Requirements to UML Class Diagrams Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas (IIT Delhi, India; MNNIT Allahabad, India) @InProceedings{AIRE15p25, author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas}, title = {From Natural Language Requirements to UML Class Diagrams}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {25-24}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid5-p doi:
	Bouraga, Sarah	AIRE '15: "Representation of Rules for ..." Representation of Rules for Relevant Recommendations to Online Social Networks Users Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner (University of Namur, Belgium) @InProceedings{AIRE15p33, author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner}, title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {33-32}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid1-p doi:
	Cordy, Maxime	AIRE '15: "Using Fuzzy Modeling for Consistent ..." Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher (University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France) @InProceedings{AIRE15p17, author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher}, title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {17-16}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid2-p doi:
	Davril, Jean-Marc	AIRE '15: "Using Fuzzy Modeling for Consistent ..." Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher (University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France) @InProceedings{AIRE15p17, author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher}, title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {17-16}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid2-p doi:
	Faulkner, Stéphane	AIRE '15: "Representation of Rules for ..." Representation of Rules for Relevant Recommendations to Online Social Networks Users Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner (University of Namur, Belgium) @InProceedings{AIRE15p33, author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner}, title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {33-32}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid1-p doi:
	Han, Xue	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:
	Hays, Mark	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:
	Heymans, Patrick	AIRE '15: "Using Fuzzy Modeling for Consistent ..." Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher (University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France) @InProceedings{AIRE15p17, author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher}, title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {17-16}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid2-p doi:
	Huffman Hayes, Jane	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:
	Jureta, Ivan	AIRE '15: "Representation of Rules for ..." Representation of Rules for Relevant Recommendations to Online Social Networks Users Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner (University of Namur, Belgium) @InProceedings{AIRE15p33, author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner}, title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {33-32}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid1-p doi:
	Keim, Jan	AIRE '15: "DeNom: A Tool to Find Problematic ..." DeNom: A Tool to Find Problematic Nominalizations using NLP Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch (KIT, Germany; Daimler, Germany) @InProceedings{AIRE15p9, author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch}, title = {DeNom: A Tool to Find Problematic Nominalizations using NLP}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {9-8}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid3-p doi:
	Körner, Sven J.	AIRE '15: "DeNom: A Tool to Find Problematic ..." DeNom: A Tool to Find Problematic Nominalizations using NLP Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch (KIT, Germany; Daimler, Germany) @InProceedings{AIRE15p9, author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch}, title = {DeNom: A Tool to Find Problematic Nominalizations using NLP}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {9-8}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid3-p doi:
	Krisch, Jennifer	AIRE '15: "DeNom: A Tool to Find Problematic ..." DeNom: A Tool to Find Problematic Nominalizations using NLP Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch (KIT, Germany; Daimler, Germany) @InProceedings{AIRE15p9, author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch}, title = {DeNom: A Tool to Find Problematic Nominalizations using NLP}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {9-8}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid3-p doi:
	Landhäußer, Mathias	AIRE '15: "DeNom: A Tool to Find Problematic ..." DeNom: A Tool to Find Problematic Nominalizations using NLP Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch (KIT, Germany; Daimler, Germany) @InProceedings{AIRE15p9, author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch}, title = {DeNom: A Tool to Find Problematic Nominalizations using NLP}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {9-8}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid3-p doi:
	Li, Wenbin	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:
	Sharma, Richa	AIRE '15: "From Natural Language Requirements ..." From Natural Language Requirements to UML Class Diagrams Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas (IIT Delhi, India; MNNIT Allahabad, India) @InProceedings{AIRE15p25, author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas}, title = {From Natural Language Requirements to UML Class Diagrams}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {25-24}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid5-p doi:
	Srivastava, Pratyoush K.	AIRE '15: "From Natural Language Requirements ..." From Natural Language Requirements to UML Class Diagrams Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas (IIT Delhi, India; MNNIT Allahabad, India) @InProceedings{AIRE15p25, author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas}, title = {From Natural Language Requirements to UML Class Diagrams}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {25-24}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid5-p doi:
	Tichy, Walter F.	AIRE '15: "DeNom: A Tool to Find Problematic ..." DeNom: A Tool to Find Problematic Nominalizations using NLP Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch (KIT, Germany; Daimler, Germany) @InProceedings{AIRE15p9, author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch}, title = {DeNom: A Tool to Find Problematic Nominalizations using NLP}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {9-8}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid3-p doi:
	Woodson, Clinton	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:
	Yu, Tingting	AIRE '15: "Measuring Requirement Quality ..." Measuring Requirement Quality to Predict Testability Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson (University of Kentucky, USA) @InProceedings{AIRE15p1, author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson}, title = {Measuring Requirement Quality to Predict Testability}, booktitle = {Proc.\ AIRE}, publisher = {IEEE}, pages = {1-0}, doi = {}, year = {2015}, } Article: rews15airemain-airemainid4-p doi:

21 authors

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