| |
Acher, Mathieu
|
AIRE '15: "Using Fuzzy Modeling for Consistent ..."
Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements
Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher
(University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France)
@InProceedings{AIRE15p17,
author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher},
title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {17-16},
doi = {},
year = {2015},
}
|
| |
Biswas, Kanad K.
|
AIRE '15: "From Natural Language Requirements ..."
From Natural Language Requirements to UML Class Diagrams
Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas
(IIT Delhi, India; MNNIT Allahabad, India)
@InProceedings{AIRE15p25,
author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas},
title = {From Natural Language Requirements to UML Class Diagrams},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {25-24},
doi = {},
year = {2015},
}
|
| |
Bouraga, Sarah |
AIRE '15: "Representation of Rules for ..."
Representation of Rules for Relevant Recommendations to Online Social Networks Users
Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner
(University of Namur, Belgium)
@InProceedings{AIRE15p33,
author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner},
title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {33-32},
doi = {},
year = {2015},
}
|
| |
Cordy, Maxime
|
AIRE '15: "Using Fuzzy Modeling for Consistent ..."
Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements
Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher
(University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France)
@InProceedings{AIRE15p17,
author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher},
title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {17-16},
doi = {},
year = {2015},
}
|
| |
Davril, Jean-Marc
|
AIRE '15: "Using Fuzzy Modeling for Consistent ..."
Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements
Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher
(University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France)
@InProceedings{AIRE15p17,
author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher},
title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {17-16},
doi = {},
year = {2015},
}
|
| |
Faulkner, Stéphane
|
AIRE '15: "Representation of Rules for ..."
Representation of Rules for Relevant Recommendations to Online Social Networks Users
Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner
(University of Namur, Belgium)
@InProceedings{AIRE15p33,
author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner},
title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {33-32},
doi = {},
year = {2015},
}
|
| |
Han, Xue
|
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
| |
Hays, Mark |
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
| |
Heymans, Patrick |
AIRE '15: "Using Fuzzy Modeling for Consistent ..."
Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements
Jean-Marc Davril, Maxime Cordy, Patrick Heymans, and Mathieu Acher
(University of Namur, Belgium; INRIA, France; IRISA, France; University of Rennes 1, France)
@InProceedings{AIRE15p17,
author = {Jean-Marc Davril and Maxime Cordy and Patrick Heymans and Mathieu Acher},
title = {Using Fuzzy Modeling for Consistent Definitions of Product Qualities in Requirements},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {17-16},
doi = {},
year = {2015},
}
|
| |
Huffman Hayes, Jane |
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
| |
Jureta, Ivan
|
AIRE '15: "Representation of Rules for ..."
Representation of Rules for Relevant Recommendations to Online Social Networks Users
Sarah Bouraga, Ivan Jureta, and Stéphane Faulkner
(University of Namur, Belgium)
@InProceedings{AIRE15p33,
author = {Sarah Bouraga and Ivan Jureta and Stéphane Faulkner},
title = {Representation of Rules for Relevant Recommendations to Online Social Networks Users},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {33-32},
doi = {},
year = {2015},
}
|
| |
Keim, Jan
|
AIRE '15: "DeNom: A Tool to Find Problematic ..."
DeNom: A Tool to Find Problematic Nominalizations using NLP
Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch
(KIT, Germany; Daimler, Germany)
@InProceedings{AIRE15p9,
author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch},
title = {DeNom: A Tool to Find Problematic Nominalizations using NLP},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2015},
}
|
| |
Körner, Sven J. |
AIRE '15: "DeNom: A Tool to Find Problematic ..."
DeNom: A Tool to Find Problematic Nominalizations using NLP
Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch
(KIT, Germany; Daimler, Germany)
@InProceedings{AIRE15p9,
author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch},
title = {DeNom: A Tool to Find Problematic Nominalizations using NLP},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2015},
}
|
| |
Krisch, Jennifer |
AIRE '15: "DeNom: A Tool to Find Problematic ..."
DeNom: A Tool to Find Problematic Nominalizations using NLP
Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch
(KIT, Germany; Daimler, Germany)
@InProceedings{AIRE15p9,
author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch},
title = {DeNom: A Tool to Find Problematic Nominalizations using NLP},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2015},
}
|
| |
Landhäußer, Mathias
|
AIRE '15: "DeNom: A Tool to Find Problematic ..."
DeNom: A Tool to Find Problematic Nominalizations using NLP
Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch
(KIT, Germany; Daimler, Germany)
@InProceedings{AIRE15p9,
author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch},
title = {DeNom: A Tool to Find Problematic Nominalizations using NLP},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2015},
}
|
| |
Li, Wenbin |
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
| |
Sharma, Richa
|
AIRE '15: "From Natural Language Requirements ..."
From Natural Language Requirements to UML Class Diagrams
Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas
(IIT Delhi, India; MNNIT Allahabad, India)
@InProceedings{AIRE15p25,
author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas},
title = {From Natural Language Requirements to UML Class Diagrams},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {25-24},
doi = {},
year = {2015},
}
|
| |
Srivastava, Pratyoush K. |
AIRE '15: "From Natural Language Requirements ..."
From Natural Language Requirements to UML Class Diagrams
Richa Sharma, Pratyoush K. Srivastava, and Kanad K. Biswas
(IIT Delhi, India; MNNIT Allahabad, India)
@InProceedings{AIRE15p25,
author = {Richa Sharma and Pratyoush K. Srivastava and Kanad K. Biswas},
title = {From Natural Language Requirements to UML Class Diagrams},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {25-24},
doi = {},
year = {2015},
}
|
| |
Tichy, Walter F.
|
AIRE '15: "DeNom: A Tool to Find Problematic ..."
DeNom: A Tool to Find Problematic Nominalizations using NLP
Mathias Landhäußer, Sven J. Körner, Walter F. Tichy, Jan Keim, and Jennifer Krisch
(KIT, Germany; Daimler, Germany)
@InProceedings{AIRE15p9,
author = {Mathias Landhäußer and Sven J. Körner and Walter F. Tichy and Jan Keim and Jennifer Krisch},
title = {DeNom: A Tool to Find Problematic Nominalizations using NLP},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {9-8},
doi = {},
year = {2015},
}
|
| |
Woodson, Clinton
|
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
| |
Yu, Tingting
|
AIRE '15: "Measuring Requirement Quality ..."
Measuring Requirement Quality to Predict Testability
Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, and Clinton Woodson
(University of Kentucky, USA)
@InProceedings{AIRE15p1,
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
title = {Measuring Requirement Quality to Predict Testability},
booktitle = {Proc.\ AIRE},
publisher = {IEEE},
pages = {1-0},
doi = {},
year = {2015},
}
|
